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After developing aberration correctors as modifications for microscopes, Nion developed their first microscope, called UltraSTEM 1, a new aberration corrected microscope with resolution capability below one
Angstrom.
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calling for a microscope built from the ground up with aberration correction in mind, which could have potential at reaching resolutions below 0.5
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at the time, and decided to approach the project with a new company. Krivanek and Dellby used a $ 120,000 grant from the
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In 2015, Nion delivered a Hermes
Scanning Transmission Electron Microscope priced at ÂŁ3.7 million to
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to build their first aberration corrector. Soon, Nion had constructed correctors for both
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558:"Kirkland master of the electron microscope wins one of science's biggest prizes"
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into existing STEMs. The publicity gained from this achievement led to the
529:"Electron microscope pinpoints position of single atoms | Laboratory Talk"
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In 2008, Nion unveiled the SuperSTEM 2, which provided 20 million times
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427:"Sub-ĂĄngstrom resolution using aberration corrected electron optics"
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aberration-corrected scanning transmission electron microscope
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394:"Kirkland microscopes can examine matter one atom at a time"
481:"IBM, Nion Create Highest-Resolution Electron Microscope"
425:
Batson, P. E.; Dellby, N.; Krivanek, O. L. (2002-08-08).
236:
In 2020, co-founder of Nion, Ondrej
Krivanek, shared the
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and Niklas Dellby were approached by Philip Batson from
201:. The SuperSTEM 2 was developed in collaboration with
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to build a STEM aberration corrector. Krivanek was a
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315:"Nion: The company that transformed microscopy"
1074:Serial block-face scanning electron microscopy
777:Detectors for transmission electron microscopy
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348:"The correction of electron lens aberrations"
260:, which moved Bruker into the manufacture of
8:
240:for Nanoscience for work creating the first
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587:"Meet the Winners of the 2020 Kavli Prize"
129:scanning transmission electron microscopes
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18:
16:American electron microscope manufacturer
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256:In January 2024, Nion was acquired by
248:below one ĂĄngstrom (0.1 nanometers).
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47:Scientific and Technical Instruments
14:
710:Timeline of microscope technology
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1301:
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517:from the original on 2024-05-25.
493:from the original on 2024-05-25.
1069:Precession electron diffraction
630:from the original on 2024-05-23
597:from the original on 2023-09-22
568:from the original on 2023-06-03
539:from the original on 2024-05-25
404:from the original on 2016-03-25
328:from the original on 2024-05-24
295:from the original on 2024-05-19
112:Footnotes / references
617:"Bruker with Nion: The future"
364:10.1016/j.ultramic.2015.03.007
1:
615:Pool, Rebecca (2024-02-01).
346:Hawkes, P. W. (2015-09-01).
313:Pool, Rebecca (2022-11-21).
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1054:Immune electron microscopy
972:Annular dark-field imaging
787:Everhart–Thornley detector
1296:
1208:Hitachi High-Technologies
156:TJ Watson Research Center
110:
24:
1233:Thermo Fisher Scientific
1059:Geometric phase analysis
947:Aberration-Corrected TEM
164:University of Washington
982:Charge contrast imaging
792:Field electron emission
285:"Nion Co. - About Nion"
203:University of Liverpool
1172:Thomas Eugene Everhart
505:"SuperSTEM 2 Unveiled"
1177:Vernon Ellis Cosslett
997:Dark-field microscopy
207:University of Glasgow
1182:Vladimir K. Zworykin
832:Correlative light EM
741:Electron diffraction
262:electron microscopes
215:Daresbury Laboratory
184:scientific community
176:chromatic aberration
172:spherical aberration
1346:Electron microscopy
1147:Manfred von Ardenne
1132:Gerasimos Danilatos
1039:Electron tomography
1034:Electron holography
977:Cathodoluminescence
756:Secondary electrons
746:Electron scattering
690:Electron microscopy
676:Electron microscopy
591:Scientific American
451:10.1038/nature00972
443:2002Natur.418..617B
211:University of Leeds
21:
1269:Digital Micrograph
875:Environmental SEM
797:Field emission gun
761:X-ray fluorescence
624:Analytical Science
533:laboratorytalk.com
322:Analytical Science
160:research professor
1356:Materials science
1328:
1327:
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1162:Nestor J. Zaluzec
1157:Maximilian Haider
955:
954:
562:The Seattle Times
510:Photonics Spectra
486:Photonics Spectra
437:(6898): 617–620.
398:The Seattle Times
131:(STEMs) based in
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1112:Bodo von Borries
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857:Photoemission EM
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1167:Ondrej Krivanek
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847:Liquid-Phase EM
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770:Instrumentation
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178:which could be
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66:, Niklas Dellby
64:Ondrej Krivanek
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564:. 2020-05-27.
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513:. 2008-01-25.
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895:Ultrafast SEM
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852:Low-energy EM
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751:Kikuchi lines
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1259:EM Data Bank
1223:Nion Company
1117:Dennis Gabor
1107:Albert Crewe
885:Confocal SEM
782:Electron gun
731:Auger effect
632:. Retrieved
620:
610:
599:. Retrieved
590:
581:
570:. Retrieved
561:
552:
541:. Retrieved
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406:. Retrieved
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330:. Retrieved
318:
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297:. Retrieved
289:www.nion.com
288:
255:
235:
219:
196:
192:
146:
125:manufacturer
120:
119:
111:
71:Headquarters
34:Company type
20:Nion Company
1203:FEI Company
1137:Harald Rose
1127:Ernst Ruska
816:Microscopes
724:with matter
722:interaction
252:Acquisition
238:Kavli Prize
180:retrofitted
1335:Categories
1284:Multislice
1100:Developers
960:Techniques
705:Microscope
700:Micrograph
634:2024-05-23
601:2024-05-23
572:2024-05-23
543:2024-05-24
408:2024-05-25
358:: A9–A12.
332:2024-05-24
299:2024-05-23
268:References
246:resolution
137:Washington
79:Washington
38:Subsidiary
1152:Max Knoll
807:Stigmator
459:1476-4687
372:0304-3991
188:Angstroms
147:In 1997,
1307:Category
1254:CrysTBox
1242:Software
913:Cryo-TEM
720:Electron
628:Archived
595:Archived
566:Archived
537:Archived
515:Archived
491:Archived
467:12167855
402:Archived
380:26025209
326:Archived
293:Archived
133:Kirkland
75:Kirkland
60:Founders
44:Industry
1319:Commons
967:4D STEM
940:4D STEM
918:Cryo-ET
890:SEM-XRF
880:CryoSEM
837:Cryo-EM
695:History
439:Bibcode
224:in the
143:History
97:Website
52:Founded
1264:EMsoft
1249:CASINO
1228:TESCAN
1093:Others
992:cryoEM
683:Basics
465:
457:
431:Nature
378:
370:
258:Bruker
232:Awards
213:, and
91:Bruker
86:Parent
1218:Leica
1064:PINEM
930:HRTEM
925:EFTEM
622:Wiley
320:Wiley
244:with
222:EPSRC
123:is a
1279:IUCr
1213:JEOL
1084:WBDF
1079:WDXS
1029:EBIC
1024:EELS
1019:ECCI
1007:EBSD
987:CBED
935:STEM
463:PMID
455:ISSN
376:PMID
368:ISSN
174:and
121:Nion
104:.com
102:nion
55:1997
1049:FEM
1044:FIB
1012:TKD
1002:EDS
905:TEM
867:SEM
842:EMP
447:doi
435:418
360:doi
356:156
162:at
153:IBM
127:of
1337::
824:EM
626:.
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417:^
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276:^
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226:UK
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668:e
661:t
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302:.
Text is available under the Creative Commons Attribution-ShareAlike License. Additional terms may apply.
