220:, taking over the laboratory and research group of retiring professor Nick Bashara, where he has researched the optical, electrical, and microstructural properties of solids and thin films as well as interfacial and environmental effects on materials. Trained as a solid-state experimental physicist, Woollam’s initial interest was in low-temperature physics, superconductors, and related materials; however, in the 1980s he began to study
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176:. His interest in physics, engineering, and business was stimulated by his father, Arthur E. Woollam, who ran a water pump company in Kalamazoo. As a teenager John was not interested very much in school classes, but he spent hours at his father's company studying and building pumps. This attitude changed in when he attended
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Among
Woollam’s other successes are his former students. He has mentored many of them from their early undergraduate days through post-graduate education. Many of his former students have remained in the Midwest to form the talent base at the core of the J.A. Woollam
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to a wide range of materials, industrial, and biological problems. Woollam and his group have contributed all over the world to the design, manufacture, and application of ellipsometric instruments at academic and corporate research/production facilities.
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276:’s 2013 Industrial Applications of Physics prize for his sustained contributions in ellipsometry especially in extending the applications and in developing modern designs for these instruments.
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Castro, Leon G.; Thompson, Daniel W.; Tiwald, Thomas; Berberov, Emil M.; Woollam, John A. (2007). "Repeatability of ellipsometric data in cholera toxin GM1–ELISA structures".
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and the optical characterization of surfaces and films of technological importance. More recently, he has focused primarily on studying the development and application of
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Dillon, R.; Woollam, John; Katkanant, V. (1984). "Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon films".
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Winner of the 2017 R.F. Bunshah Award, where he presented the honorary lecture at the 2017 International
Conference on Metallurgical Coatings and Thin Films (ICMCTF).
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148:(born 10 August 1939) is an American educator, research physicist, electrical engineer, and George Holmes Distinguished Professor at the
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company based in
Lincoln, Nebraska, and a world leader in the research, development, and commercialization of
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Electron transport properties of metallic tin in high magnetic fields and at liquid helium temperatures
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Electron transport properties of metallic tin in high magnetic fields and at liquid helium temperatures
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Thompson, Daniel W.; Snyder, Paul G.; Castro, Leon; Yan, Li; Kaipa, Prasuna; Woollam, John A. (2005).
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464:"Optical-absorption edge and disorder effects in hydrogenated amorphous diamondlike carbon films"
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CW Chu, JA Woollam (Eds.), High
Pressure and Low Temperature Physics, Plenum, New York (1978)
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511:"Optical characterization of porous alumina from vacuum ultraviolet to midinfrared"
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400:"John Woollam | College of Engineering | University of Nebraska–Lincoln"
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Donors Making a
Difference: John Woollam | The Nature Conservancy
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585:"Lincoln company plans $ 20 million expansion in Haymarket"
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In 1987, John
Woollam founded the J.A. Woollam Company, an
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Datta, T.; Woollam, John; Notohamiprodjo, W. (1989).
638:"Woollam named National Academy of Inventors Fellow"
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653:. Aps.org (2012-09-21). Retrieved on 2013-05-26.
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331:Creating Waves of Conservation: John Woollam
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375:(PhD). Michigan State University.
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690:Michigan State University alumni
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651:APS Physics | FIAP | Recipient
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369:Woollam, John Arthur (1967).
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570:10.1016/j.susc.2007.02.005
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172:John Woollam was born in
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79:Michigan State University
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488:10.1103/PhysRevB.40.5956
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168:Early life and education
162:ellipsometry instruments
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589:Lincoln Journal Star
292:Linkoping University
233:J.A. Woollam Company
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146:John Arthur Woollam
355:2014-08-12 at the
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222:Raman spectroscopy
535:10.1063/1.1921336
468:Physical Review B
424:Physical Review B
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Text is available under the Creative Commons Attribution-ShareAlike License. Additional terms may apply.
