Knowledge

List of materials analysis methods

Source πŸ“

1348: 883: 1649: 827: 1506: 839: 833: 527: 772: 1452: 1728: 941: 635: 401: 889: 1033: 666: 1548: 716: 1775: 1765: 1586: 906: 734: 285: 1752: 1580: 1500: 965: 641: 505: 273: 1805: 1563: 984: 864: 741: 310: 1697: 1569: 1542: 1397: 1165: 821: 722: 474: 1902: 1458: 660: 1715: 1252: 1861: 1643: 1258: 1093: 1008: 784: 754: 515: 499: 316: 304: 1691: 1512: 1488: 1403: 1385: 1366: 1069: 1063: 778: 766: 1476: 1205: 487: 352: 1883: 1276: 1270: 566: 543: 521: 493: 442: 418: 370: 235: 1494: 1289: 1811: 1672: 1667: 1628: 1536: 978: 959: 912: 845: 604: 560: 481: 430: 218: 1598: 1530: 1342: 990: 924: 851: 629: 582: 570: 539: 509: 1936: 1931: 1440: 1379: 1323: 1141: 996: 223: 194: 395: 1926: 1781: 1592: 1470: 1057: 796: 705: 467: 448: 1014: 1823: 1787: 1604: 1482: 1446: 1409: 1178: 935: 616: 328: 322: 253: 1746: 1434: 1117: 424: 389: 206: 1223: 930: 436: 1921: 1634: 1283: 1210: 1075: 809: 200: 1045: 1661: 1655: 1560: 1554: 1428: 1422: 1372: 1329: 1295: 1234: 1229: 1159: 1098: 1051: 1002: 953: 790: 672: 533: 334: 1799: 1621: 1617: 1264: 1240: 1216: 1087: 728: 593: 589: 554: 412: 364: 358: 340: 876: 1524: 1129: 900: 710: 699: 622: 454: 406: 212: 181: 647: 1842: 1039: 815: 175: 1793: 1187: 1104: 947: 918: 1848: 1518: 1246: 685: 1123: 576: 549: 346: 1836: 1829: 1709: 1678: 1360: 1317: 894: 694: 376: 1898: 1879: 1817: 1307: 1081: 870: 17: 1147: 1020: 678: 760: 1915: 1574: 1464: 1733: 1312: 689: 610: 266: 229: 1192: 1453:
Surface composition by analysis of neutral species and ion-impact radiation
1135: 1771: 1391: 1153: 247: 241: 1294:
PIGE – Particle (or proton) induced gamma-ray spectroscopy, see
1301: 600: 473:
EBS – Elastic (non-Rutherford) backscattering spectrometry (see
291: 279: 20:. Analysis methods are listed by their acronym, if one exists. 1183:
ODNMR – Optically detected magnetic resonance, see ESR or EPR
23: 1349:
Quartz crystal microbalance with dissipation monitoring
884:
Inductively coupled plasma atomic emission spectroscopy
1253:
Potentiodynamic electrochemical impedance spectroscopy
248:
Angle resolved ultraviolet photoemission spectroscopy
305:
Coaxial impact collision ion scattering spectroscopy
1876:
Materials Science and Engineering – An Introduction
625:
mass spectrometry or electrospray mass spectrometry
1776:NEXAFS (near edge X-ray absorption fine structure) 1895:Focused Ion Beam Systems: Basics and Applications 1650:Total internal reflection fluorescence microscopy 1477:Surface enhanced infrared absorption spectroscopy 828:High resolution electron energy loss spectroscopy 727:FRS – Forward Recoil Spectrometry, a synonym of 1654:TLS – Photothermal lens spectroscopy, a type of 1620:or thermoacoustic computed tomography (see also 1507:Surface extended X-ray absorption fine structure 840:High-resolution transmission electron microscopy 528:Energy filtered transmission electron microscopy 290:BSED – Back scattered electron diffraction, see 1302:Particle (or proton) induced X-ray spectroscopy 773:Grazing incidence small angle X-ray scattering 1897:. Cambridge, UK: Cambridge University Press. 1729:differential interference contrast microscopy 1495:Surface enhanced resonance Raman spectroscopy 1290:photon-induced near-field electron microscopy 942:Infrared non-destructive testing of materials 636:Electrochemical scanning tunneling microscopy 402:Differential interference contrast microscopy 8: 1702:USANS – Ultra small-angle neutron scattering 890:Inductively coupled plasma mass spectrometry 1537:Sputtered neutral species mass spectrometry 1392:Reflection high energy electron diffraction 1034:Matrix-assisted laser desorption/ionization 846:Heavy-ion elastic recoil detection analysis 667:Fluorescence cross-correlation spectroscopy 601:Electron spectroscopy for chemical analysis 278:BKD – Backscatter Kikuchi diffraction, see 16:This is a list of analysis methods used in 1705:USAXS – Ultra small-angle X-ray scattering 1549:Single-photon emission computed tomography 717:Feature-oriented scanning probe microscopy 617:Environmental scanning electron microscopy 1766:X-ray induced Auger electron spectroscopy 1587:Scanning transmission electron microscopy 1559:SRM-CE/MS – Selected-reaction-monitoring 1136:Near edge X-ray absorption fine structure 907:Inelastic electron tunneling spectroscopy 852:High-energy proton induced X-ray emission 735:Fourier-transform ion cyclotron resonance 286:Bioluminescence resonance energy transfer 242:Angle resolved photoemission spectroscopy 1753:Wavelength dispersive X-ray spectroscopy 1639:TIKA – Transmitting ion kinetic analysis 1581:Stimulated emission depletion microscopy 1501:Spin Echo Small Angle Neutron Scattering 966:Intermediate voltage electron microscopy 642:Extended X-ray absorption fine structure 506:Electrically detected magnetic resonance 274:Bimolecular fluorescence complementation 1806:X-ray photoelectron emission microscopy 1148:Nuclear magnetic resonance spectroscopy 1142:Nuclear inelastic scattering/absorption 985:Liquid chromatography-mass spectrometry 865:Ion induced Auger electron spectroscopy 742:Fourier-transform infrared spectroscopy 311:Coherent anti-Stokes Raman spectroscopy 1570:Solid-state nuclear magnetic resonance 1543:Scanning near-field optical microscopy 1398:Resonance ionization mass spectrometry 1279:(or photoelectron emission microscopy) 1154:Nuclear Overhauser effect spectroscopy 923:IIX – Ion induced X-ray analysis, see 822:High performance liquid chromatography 737:or Fourier-transform mass spectrometry 723:Fluorescence resonance energy transfer 1459:Scanning confocal electron microscopy 661:Fluorescence correlation spectroscopy 7: 1862:Characterization (materials science) 1644:Thermal ionization mass spectrometry 1259:Photothermal deflection spectroscopy 1219:or photoacoustic computed tomography 1094:Mechanically stimulated gas emission 1009:Laser induced breakdown spectroscopy 785:Grazing incidence X-ray reflectivity 755:Gas chromatography-mass spectrometry 630:Electron spin resonance spectroscopy 516:Energy dispersive X-ray spectroscopy 500:Energy-dispersive analysis of x-rays 470:(see IBIC: ion beam induced charge) 317:Convergent beam electron diffraction 1692:Ultrasound attenuation spectroscopy 1513:Scanning ion-conductance microscopy 1489:Surface enhanced Raman spectroscopy 1404:Resonant inelastic X-ray scattering 1386:Reflectance difference spectroscopy 1367:Resonant anomalous X-ray scattering 1070:Magnetic resonance force microscopy 1064:Multiphoton fluorescence microscopy 1015:Laser optical emission spectroscopy 834:High-resolution electron microscopy 779:Grazing incidence X-ray diffraction 767:Glow discharge optical spectroscopy 269:(BET from Brunauer, Emmett, Teller) 1824:X-ray resonant exchange scattering 1429:Selected area electron diffraction 1206:Positron annihilation spectroscopy 488:Exclusive correlation spectroscopy 353:Confocal laser scanning microscopy 14: 1277:Photoemission electron microscopy 1271:electron energy loss spectroscopy 567:Electron nuclear double resonance 544:electrical resistivity tomography 522:Electron energy loss spectroscopy 494:Electrical capacitance tomography 443:Differential scanning calorimetry 419:Deep-level transient spectroscopy 371:Cryo-scanning electron microscopy 236:Appearance potential spectroscopy 1812:X-ray photoelectron spectroscopy 1716:Ultraviolet–visible spectroscopy 1673:Two-photon excitation microscopy 1668:Time-of-flight mass spectrometry 1629:Transmission electron microscopy 979:Low-angle laser light scattering 960:Isothermal titration calorimetry 913:Intelligent gravimetric analysis 761:Glow discharge mass spectrometry 561:Electrophoretic light scattering 482:Electron backscatter diffraction 431:Dual polarisation interferometry 219:Atomic fluorescence spectroscopy 1878:. London: John Wiley and Sons. 1599:Scanning tunneling spectroscopy 1531:Secondary ion mass spectrometry 1343:Quasielastic neutron scattering 1224:Photoemission of adsorbed xenon 991:Low-energy electron diffraction 931:Ion neutralization spectroscopy 925:particle induced X-ray emission 583:Electron paramagnetic resonance 540:Electrical impedance tomography 437:Diffuse reflection spectroscopy 230:Atom probe field ion microscopy 158: 1441:Small angle neutron scattering 1380:Reflection electron microscopy 1324:Photothermal microspectroscopy 997:Low-energy electron microscopy 611:Electron stimulated desorption 224:Analytical ultracentrifugation 195:Atomic absorption spectroscopy 1: 1782:X-ray absorption spectroscopy 1698:UV-photoelectron spectroscopy 1593:Scanning tunneling microscopy 1471:Size exclusion chromatography 1188:Optical emission spectroscopy 1166:Near-field optical microscopy 1058:Magnetic induction tomography 797:Gel permeation chromatography 706:Fluorescence lifetime imaging 468:Electron beam induced current 449:Differential thermal analysis 153: 1788:X-ray crystal truncation rod 1483:Scanning electron microscopy 1447:Small angle X-ray scattering 1410:Resonance Raman spectroscopy 1179:Optical beam induced current 1046:Medium energy ion scattering 936:Inelastic neutron scattering 577:Electron probe microanalysis 329:Coherent diffraction imaging 323:Charge collection microscopy 267:BET surface area measurement 254:Attenuated total reflectance 1747:Wide angle X-ray scattering 1118:Neutron activation analysis 954:Ion scattering spectroscopy 534:Electron induced desorption 425:Dynamic mechanical analysis 390:Dielectric thermal analysis 207:Auger electron spectroscopy 1953: 1635:Thermogravimetric analysis 1465:Spectroscopic ellipsometry 1284:Photoelectron spectroscopy 1211:Photoacoustic spectroscopy 1076:Magnetic resonance imaging 810:annular dark-field imaging 201:Auger electron diffraction 1662:Thermomechanical analysis 1656:photothermal spectroscopy 1618:Thermoacoustic tomography 1605:Surface X-ray diffraction 1561:capillary-electrophoresis 1555:Scanning probe microscopy 1435:Scanning Auger microscopy 1423:Selected area diffraction 1373:Rutherford backscattering 1330:Photothermal spectroscopy 1296:nuclear reaction analysis 1265:Photoelectron diffraction 1241:Photoelectron diffraction 1235:Phase contrast microscopy 1230:Photocurrent spectroscopy 1160:Nuclear reaction analysis 1052:Magnetic force microscopy 1003:Low-energy ion scattering 791:Gas-liquid chromatography 673:Field emission microscopy 396:De Haas–van Alphen effect 335:Capillary electrophoresis 33: 1800:X-ray diffuse scattering 1677:TXRF – Total reflection 1622:photoacoustic tomography 1217:Photoacoustic tomography 1088:Tandem mass spectrometry 1021:Light (Raman) scattering 594:elastic recoil detection 590:Elastic recoil detection 555:Electron crystallography 413:Dynamic light scattering 365:Cryo-electron microscopy 359:Correlation spectroscopy 341:Cryo-electron tomography 1727:VEDIC – Video-enhanced 1130:Neutron depth profiling 901:Ion cyclotron resonance 877:Ion beam induced charge 711:Fluorescence microscopy 700:Fluorescence anisotropy 623:Electrospray ionization 455:Dynamic vapour sorption 407:Dielectric spectroscopy 213:Atomic force microscopy 182:magnetic susceptibility 1874:Callister, WD (2000). 1843:X-ray Raman scattering 1525:Solid immersion mirror 1099:MΓΆssbauer spectroscopy 1040:Molecular beam epitaxy 816:Helium atom scattering 176:muon spin spectroscopy 148: 143: 138: 133: 128: 123: 118: 113: 108: 103: 98: 93: 88: 83: 78: 73: 68: 63: 58: 53: 48: 43: 38: 1937:Scientific techniques 1932:Science-related lists 1794:X-ray crystallography 1105:Microthermal analysis 948:Infrared spectroscopy 648:Exchange spectroscopy 1927:Analytical chemistry 1893:Yao, N, ed. (2007). 1519:Solid immersion lens 686:Field ion microscopy 1849:X-ray standing wave 1124:Neutron diffraction 808:HAADF – High angle 550:Electroluminescence 347:Cathodoluminescence 27:Contents:  1837:X-ray reflectivity 1830:X-ray fluorescence 1774:, synonymous with 1710:Ultrasonic testing 1679:X-ray fluorescence 1575:Stark spectroscopy 1408:RR spectroscopy – 1361:Raman spectroscopy 1318:Powder diffraction 895:Immunofluorescence 695:Flow birefringence 621:ESI-MS or ES-MS – 377:Cyclic voltammetry 1922:Materials science 1904:978-0-521-83199-4 1818:X-ray diffraction 1564:mass-spectrometry 1308:Photoluminescence 1269:PEELS – parallel 1082:Mass spectrometry 871:Ion beam analysis 733:FTICR or FT-MS – 18:materials science 1944: 1908: 1889: 919:Inert gas fusion 679:Focused ion beam 28: 1952: 1951: 1947: 1946: 1945: 1943: 1942: 1941: 1912: 1911: 1905: 1892: 1886: 1873: 1870: 1858: 1761: 1742: 1724: 1688: 1613: 1418: 1357: 1338: 1247:Photodesorption 1201: 1174: 1113: 1029: 974: 860: 805: 750: 656: 463: 385: 300: 262: 190: 171: 166: 165: 164: 163: 29: 26: 12: 11: 5: 1950: 1948: 1940: 1939: 1934: 1929: 1924: 1914: 1913: 1910: 1909: 1903: 1890: 1884: 1869: 1866: 1865: 1864: 1857: 1854: 1853: 1852: 1845: 1839: 1833: 1826: 1820: 1814: 1808: 1802: 1796: 1791: 1784: 1778: 1768: 1760: 1757: 1756: 1755: 1749: 1741: 1738: 1737: 1736: 1731: 1723: 1720: 1719: 1718: 1712: 1706: 1703: 1700: 1694: 1687: 1684: 1683: 1682: 1675: 1670: 1664: 1658: 1652: 1646: 1640: 1637: 1631: 1625: 1616:TAT or TACT – 1612: 1609: 1608: 1607: 1601: 1595: 1589: 1583: 1577: 1572: 1566: 1557: 1551: 1545: 1539: 1533: 1527: 1521: 1515: 1509: 1503: 1497: 1491: 1485: 1479: 1473: 1467: 1461: 1455: 1449: 1443: 1437: 1431: 1425: 1417: 1414: 1413: 1412: 1406: 1400: 1394: 1388: 1382: 1376: 1369: 1363: 1356: 1353: 1352: 1351: 1345: 1337: 1334: 1333: 1332: 1326: 1320: 1315: 1310: 1304: 1298: 1292: 1286: 1280: 1273: 1267: 1261: 1255: 1249: 1243: 1237: 1232: 1226: 1220: 1215:PAT or PACT – 1213: 1208: 1200: 1197: 1196: 1195: 1190: 1184: 1181: 1173: 1170: 1169: 1168: 1162: 1156: 1150: 1144: 1138: 1132: 1126: 1120: 1112: 1109: 1108: 1107: 1101: 1096: 1090: 1084: 1078: 1072: 1066: 1060: 1054: 1048: 1042: 1036: 1028: 1025: 1024: 1023: 1017: 1011: 1005: 999: 993: 987: 981: 973: 970: 969: 968: 962: 956: 950: 944: 938: 933: 927: 921: 915: 909: 903: 897: 892: 886: 880: 873: 867: 859: 856: 855: 854: 848: 842: 836: 830: 824: 818: 812: 804: 801: 800: 799: 793: 787: 781: 775: 769: 763: 757: 749: 746: 745: 744: 738: 731: 725: 719: 713: 708: 702: 697: 692: 682: 675: 669: 663: 655: 652: 651: 650: 644: 638: 632: 626: 619: 613: 607: 597: 588:ERD or ERDA – 586: 579: 573: 563: 557: 552: 546: 538:EIT and ERT – 536: 530: 524: 518: 512: 502: 496: 490: 484: 478: 471: 462: 459: 458: 457: 451: 445: 439: 433: 427: 421: 415: 409: 404: 398: 392: 384: 381: 380: 379: 373: 367: 361: 355: 349: 343: 337: 331: 325: 319: 313: 307: 299: 296: 295: 294: 288: 282: 276: 270: 261: 258: 257: 256: 250: 244: 238: 232: 226: 221: 215: 209: 203: 197: 189: 186: 185: 184: 178: 170: 167: 162: 161: 156: 151: 146: 141: 136: 131: 126: 121: 116: 111: 106: 101: 96: 91: 86: 81: 76: 71: 66: 61: 56: 51: 46: 41: 36: 30: 25: 24: 22: 13: 10: 9: 6: 4: 3: 2: 1949: 1938: 1935: 1933: 1930: 1928: 1925: 1923: 1920: 1919: 1917: 1906: 1900: 1896: 1891: 1887: 1885:0-471-32013-7 1881: 1877: 1872: 1871: 1867: 1863: 1860: 1859: 1855: 1850: 1846: 1844: 1840: 1838: 1834: 1831: 1827: 1825: 1821: 1819: 1815: 1813: 1809: 1807: 1803: 1801: 1797: 1795: 1792: 1789: 1785: 1783: 1779: 1777: 1773: 1769: 1767: 1763: 1762: 1758: 1754: 1751:WDX or WDS – 1750: 1748: 1744: 1743: 1739: 1735: 1732: 1730: 1726: 1725: 1721: 1717: 1713: 1711: 1707: 1704: 1701: 1699: 1695: 1693: 1690: 1689: 1685: 1680: 1676: 1674: 1671: 1669: 1665: 1663: 1659: 1657: 1653: 1651: 1647: 1645: 1641: 1638: 1636: 1632: 1630: 1626: 1623: 1619: 1615: 1614: 1610: 1606: 1602: 1600: 1596: 1594: 1590: 1588: 1584: 1582: 1578: 1576: 1573: 1571: 1567: 1565: 1562: 1558: 1556: 1552: 1550: 1546: 1544: 1540: 1538: 1534: 1532: 1528: 1526: 1522: 1520: 1516: 1514: 1510: 1508: 1504: 1502: 1498: 1496: 1492: 1490: 1486: 1484: 1480: 1478: 1474: 1472: 1468: 1466: 1462: 1460: 1456: 1454: 1450: 1448: 1444: 1442: 1438: 1436: 1432: 1430: 1426: 1424: 1420: 1419: 1415: 1411: 1407: 1405: 1401: 1399: 1395: 1393: 1389: 1387: 1383: 1381: 1377: 1374: 1370: 1368: 1364: 1362: 1359: 1358: 1354: 1350: 1346: 1344: 1340: 1339: 1335: 1331: 1327: 1325: 1321: 1319: 1316: 1314: 1311: 1309: 1305: 1303: 1299: 1297: 1293: 1291: 1287: 1285: 1281: 1278: 1274: 1272: 1268: 1266: 1262: 1260: 1256: 1254: 1250: 1248: 1244: 1242: 1238: 1236: 1233: 1231: 1227: 1225: 1221: 1218: 1214: 1212: 1209: 1207: 1203: 1202: 1198: 1194: 1191: 1189: 1185: 1182: 1180: 1176: 1175: 1171: 1167: 1163: 1161: 1157: 1155: 1151: 1149: 1145: 1143: 1139: 1137: 1133: 1131: 1127: 1125: 1121: 1119: 1115: 1114: 1110: 1106: 1102: 1100: 1097: 1095: 1091: 1089: 1085: 1083: 1079: 1077: 1073: 1071: 1067: 1065: 1061: 1059: 1055: 1053: 1049: 1047: 1043: 1041: 1037: 1035: 1031: 1030: 1026: 1022: 1018: 1016: 1012: 1010: 1006: 1004: 1000: 998: 994: 992: 988: 986: 982: 980: 976: 975: 971: 967: 963: 961: 957: 955: 951: 949: 945: 943: 939: 937: 934: 932: 928: 926: 922: 920: 916: 914: 910: 908: 904: 902: 898: 896: 893: 891: 887: 885: 881: 878: 874: 872: 868: 866: 862: 861: 857: 853: 849: 847: 843: 841: 837: 835: 831: 829: 825: 823: 819: 817: 813: 811: 807: 806: 802: 798: 794: 792: 788: 786: 782: 780: 776: 774: 770: 768: 764: 762: 758: 756: 752: 751: 747: 743: 739: 736: 732: 730: 726: 724: 720: 718: 714: 712: 709: 707: 703: 701: 698: 696: 693: 691: 687: 683: 680: 676: 674: 670: 668: 664: 662: 658: 657: 653: 649: 645: 643: 639: 637: 633: 631: 627: 624: 620: 618: 614: 612: 608: 606: 602: 598: 595: 591: 587: 584: 580: 578: 574: 572: 568: 564: 562: 558: 556: 553: 551: 547: 545: 541: 537: 535: 531: 529: 525: 523: 519: 517: 514:EDS or EDX – 513: 511: 507: 503: 501: 497: 495: 491: 489: 485: 483: 479: 476: 472: 469: 465: 464: 460: 456: 452: 450: 446: 444: 440: 438: 434: 432: 428: 426: 422: 420: 416: 414: 410: 408: 405: 403: 399: 397: 393: 391: 387: 386: 382: 378: 374: 372: 368: 366: 362: 360: 356: 354: 350: 348: 344: 342: 338: 336: 332: 330: 326: 324: 320: 318: 314: 312: 308: 306: 302: 301: 297: 293: 289: 287: 283: 281: 277: 275: 271: 268: 264: 263: 259: 255: 251: 249: 245: 243: 239: 237: 233: 231: 227: 225: 222: 220: 216: 214: 210: 208: 204: 202: 198: 196: 192: 191: 187: 183: 179: 177: 173: 172: 168: 160: 157: 155: 152: 150: 147: 145: 142: 140: 137: 135: 132: 130: 127: 125: 122: 120: 117: 115: 112: 110: 107: 105: 102: 100: 97: 95: 92: 90: 87: 85: 82: 80: 77: 75: 72: 70: 67: 65: 62: 60: 57: 55: 52: 50: 47: 45: 42: 40: 37: 35: 32: 31: 21: 19: 1894: 1875: 1375:spectrometry 1228:PC or PCS – 585:spectroscopy 15: 1734:Voltammetry 1313:Porosimetry 369:Cryo-SEM – 1916:Categories 1868:References 1790:scattering 1451:SCANIIR – 882:ICP-AES – 879:microscopy 850:HE-PIXE – 844:HI-ERDA – 690:atom probe 681:microscopy 571:ESR or EPR 510:ESR or EPR 363:Cryo-EM – 303:CAICISS – 174:ΞΌSR – see 159:References 1851:technique 1714:UV-Vis – 1666:TOF-MS – 1505:SEXAFS – 1499:SESANS – 1193:Osmometry 1134:NEXAFS – 888:ICP-MS – 826:HREELS – 771:GISAXS – 684:FIM-AP – 388:DE(T)A – 1856:See also 1832:analysis 1804:XPEEM – 1786:X-CTR – 1770:XANES – 1681:analysis 1648:TIRFM – 1568:SSNMR – 1547:SPECT – 1493:SERRS – 1475:SEIRA – 1390:RHEED – 1365:RAXRS – 1347:QCM-D – 1288:PINEM – 1251:PDEIS – 1152:NOESY – 1086:MS/MS – 1032:MALDI – 983:LC-MS – 977:LALLS – 940:IRNDT – 838:HRTEM – 753:GC-MS – 715:FOSPM – 640:EXAFS – 596:analysis 565:ENDOR – 526:EFTEM – 486:ECOSY – 246:ARUPS – 240:ARPES – 228:APFIM – 180:Ο‡ – see 154:See also 1822:XRES – 1764:XAES – 1745:WAXS – 1642:TIMS – 1603:SXRD – 1585:STEM – 1579:STED – 1541:SNOM – 1535:SNMS – 1529:SIMS – 1511:SICM – 1487:SERS – 1457:SCEM – 1445:SAXS – 1439:SANS – 1427:SAED – 1402:RIXS – 1396:RIMS – 1341:QENS – 1322:PTMS – 1300:PIXE – 1275:PEEM – 1177:OBIC – 1164:NSOM – 1092:MSGE – 1068:MRFM – 1044:MEIS – 1013:LOES – 1007:LIBS – 1001:LEIS – 995:LEEM – 989:LEED – 964:IVEM – 905:IETS – 875:IBIC – 863:IAES – 832:HREM – 820:HPLC – 783:GIXR – 777:GIXD – 765:GDOS – 759:GDMS – 740:FTIR – 721:FRET – 704:FLIM – 665:FCCS – 646:EXSY – 634:ESTM – 615:ESEM – 599:ESCA – 575:EPMA – 520:EELS – 504:EDMR – 498:EDAX – 480:EBSD – 466:EBIC – 417:DLTS – 394:dHvA – 357:COSY – 351:CLSM – 315:CBED – 309:CARS – 284:BRET – 272:BiFC – 169:Symbols 1901:  1882:  1847:XSW – 1841:XRS – 1835:XRR – 1828:XRF – 1816:XRD – 1810:XPS – 1798:XDS – 1780:XAS – 1696:UPS – 1660:TMA – 1633:TGA – 1627:TEM – 1624:– PAT) 1597:STS – 1591:STM – 1553:SPM – 1523:SIM – 1517:SIL – 1481:SEM – 1469:SEC – 1433:SAM – 1421:SAD – 1384:RDS – 1378:REM – 1371:RBS – 1328:PTS – 1282:PES – 1263:PED – 1257:PDS – 1239:PhD – 1222:PAX – 1204:PAS – 1186:OES – 1158:NRA – 1146:NMR – 1140:NIS – 1128:NDP – 1116:NAA – 1103:MTA – 1074:MRI – 1062:MPM – 1056:MIT – 1050:MFM – 1038:MBE – 958:ITC – 952:ISS – 946:IRS – 929:INS – 917:IGF – 911:IGA – 899:ICR – 869:IBA – 814:HAS – 795:GPC – 789:GLC – 677:FIB – 671:FEM – 659:FCS – 628:ESR – 609:ESD – 581:EPR – 569:, see 559:ELS – 532:EID – 508:, see 492:ECT – 453:DVS – 447:DTA – 441:DSC – 435:DRS – 429:DPI – 423:DMA – 411:DLS – 400:DIC – 339:CET – 327:CDI – 321:CCM – 265:BET – 252:ATR – 234:APS – 217:AFS – 211:AFM – 205:AES – 199:AED – 193:AAS – 1772:XANES 1708:UT – 1463:SE – 1306:PL – 1245:PD – 1122:ND – 1080:MS – 1019:LS – 548:EL – 375:CV – 345:CL – 333:CE – 1899:ISBN 1880:ISBN 603:see 542:and 292:EBSD 280:EBSD 34:!$ @ 729:ERD 605:XPS 592:or 475:RBS 1918:: 1907:. 1888:. 1759:X 1740:W 1722:V 1686:U 1611:T 1416:S 1355:R 1336:Q 1199:P 1172:O 1111:N 1027:M 972:L 858:I 803:H 748:G 688:– 654:F 477:) 461:E 383:D 298:C 260:B 188:A 149:X 144:W 139:V 134:U 129:T 124:S 119:R 114:Q 109:P 104:O 99:N 94:M 89:L 84:K 79:I 74:H 69:G 64:F 59:E 54:D 49:C 44:B 39:A

Index

materials science
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A
B
C
D
E
F
G
H
I
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
See also
References
muon spin spectroscopy
magnetic susceptibility
Atomic absorption spectroscopy

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