1348:
883:
1649:
827:
1506:
839:
833:
527:
772:
1452:
1728:
941:
635:
401:
889:
1033:
666:
1548:
716:
1775:
1765:
1586:
906:
734:
285:
1752:
1580:
1500:
965:
641:
505:
273:
1805:
1563:
984:
864:
741:
310:
1697:
1569:
1542:
1397:
1165:
821:
722:
474:
1902:
1458:
660:
1715:
1252:
1861:
1643:
1258:
1093:
1008:
784:
754:
515:
499:
316:
304:
1691:
1512:
1488:
1403:
1385:
1366:
1069:
1063:
778:
766:
1476:
1205:
487:
352:
1883:
1276:
1270:
566:
543:
521:
493:
442:
418:
370:
235:
1494:
1289:
1811:
1672:
1667:
1628:
1536:
978:
959:
912:
845:
604:
560:
481:
430:
218:
1598:
1530:
1342:
990:
924:
851:
629:
582:
570:
539:
509:
1936:
1931:
1440:
1379:
1323:
1141:
996:
223:
194:
395:
1926:
1781:
1592:
1470:
1057:
796:
705:
467:
448:
1014:
1823:
1787:
1604:
1482:
1446:
1409:
1178:
935:
616:
328:
322:
253:
1746:
1434:
1117:
424:
389:
206:
1223:
930:
436:
1921:
1634:
1283:
1210:
1075:
809:
200:
1045:
1661:
1655:
1560:
1554:
1428:
1422:
1372:
1329:
1295:
1234:
1229:
1159:
1098:
1051:
1002:
953:
790:
672:
533:
334:
1799:
1621:
1617:
1264:
1240:
1216:
1087:
728:
593:
589:
554:
412:
364:
358:
340:
876:
1524:
1129:
900:
710:
699:
622:
454:
406:
212:
181:
647:
1842:
1039:
815:
175:
1793:
1187:
1104:
947:
918:
1848:
1518:
1246:
685:
1123:
576:
549:
346:
1836:
1829:
1709:
1678:
1360:
1317:
894:
694:
376:
1898:
1879:
1817:
1307:
1081:
870:
17:
1147:
1020:
678:
760:
1915:
1574:
1464:
1733:
1312:
689:
610:
266:
229:
1192:
1453:
Surface composition by analysis of neutral species and ion-impact radiation
1135:
1771:
1391:
1153:
247:
241:
1294:
PIGE β Particle (or proton) induced gamma-ray spectroscopy, see
1301:
600:
473:
EBS β Elastic (non-Rutherford) backscattering spectrometry (see
291:
279:
20:. Analysis methods are listed by their acronym, if one exists.
1183:
ODNMR β Optically detected magnetic resonance, see ESR or EPR
23:
1349:
Quartz crystal microbalance with dissipation monitoring
884:
Inductively coupled plasma atomic emission spectroscopy
1253:
Potentiodynamic electrochemical impedance spectroscopy
248:
Angle resolved ultraviolet photoemission spectroscopy
305:
Coaxial impact collision ion scattering spectroscopy
1876:
Materials
Science and Engineering β An Introduction
625:
mass spectrometry or electrospray mass spectrometry
1776:NEXAFS (near edge X-ray absorption fine structure)
1895:Focused Ion Beam Systems: Basics and Applications
1650:Total internal reflection fluorescence microscopy
1477:Surface enhanced infrared absorption spectroscopy
828:High resolution electron energy loss spectroscopy
727:FRS β Forward Recoil Spectrometry, a synonym of
1654:TLS β Photothermal lens spectroscopy, a type of
1620:or thermoacoustic computed tomography (see also
1507:Surface extended X-ray absorption fine structure
840:High-resolution transmission electron microscopy
528:Energy filtered transmission electron microscopy
290:BSED β Back scattered electron diffraction, see
1302:Particle (or proton) induced X-ray spectroscopy
773:Grazing incidence small angle X-ray scattering
1897:. Cambridge, UK: Cambridge University Press.
1729:differential interference contrast microscopy
1495:Surface enhanced resonance Raman spectroscopy
1290:photon-induced near-field electron microscopy
942:Infrared non-destructive testing of materials
636:Electrochemical scanning tunneling microscopy
402:Differential interference contrast microscopy
8:
1702:USANS β Ultra small-angle neutron scattering
890:Inductively coupled plasma mass spectrometry
1537:Sputtered neutral species mass spectrometry
1392:Reflection high energy electron diffraction
1034:Matrix-assisted laser desorption/ionization
846:Heavy-ion elastic recoil detection analysis
667:Fluorescence cross-correlation spectroscopy
601:Electron spectroscopy for chemical analysis
278:BKD β Backscatter Kikuchi diffraction, see
16:This is a list of analysis methods used in
1705:USAXS β Ultra small-angle X-ray scattering
1549:Single-photon emission computed tomography
717:Feature-oriented scanning probe microscopy
617:Environmental scanning electron microscopy
1766:X-ray induced Auger electron spectroscopy
1587:Scanning transmission electron microscopy
1559:SRM-CE/MS β Selected-reaction-monitoring
1136:Near edge X-ray absorption fine structure
907:Inelastic electron tunneling spectroscopy
852:High-energy proton induced X-ray emission
735:Fourier-transform ion cyclotron resonance
286:Bioluminescence resonance energy transfer
242:Angle resolved photoemission spectroscopy
1753:Wavelength dispersive X-ray spectroscopy
1639:TIKA β Transmitting ion kinetic analysis
1581:Stimulated emission depletion microscopy
1501:Spin Echo Small Angle Neutron Scattering
966:Intermediate voltage electron microscopy
642:Extended X-ray absorption fine structure
506:Electrically detected magnetic resonance
274:Bimolecular fluorescence complementation
1806:X-ray photoelectron emission microscopy
1148:Nuclear magnetic resonance spectroscopy
1142:Nuclear inelastic scattering/absorption
985:Liquid chromatography-mass spectrometry
865:Ion induced Auger electron spectroscopy
742:Fourier-transform infrared spectroscopy
311:Coherent anti-Stokes Raman spectroscopy
1570:Solid-state nuclear magnetic resonance
1543:Scanning near-field optical microscopy
1398:Resonance ionization mass spectrometry
1279:(or photoelectron emission microscopy)
1154:Nuclear Overhauser effect spectroscopy
923:IIX β Ion induced X-ray analysis, see
822:High performance liquid chromatography
737:or Fourier-transform mass spectrometry
723:Fluorescence resonance energy transfer
1459:Scanning confocal electron microscopy
661:Fluorescence correlation spectroscopy
7:
1862:Characterization (materials science)
1644:Thermal ionization mass spectrometry
1259:Photothermal deflection spectroscopy
1219:or photoacoustic computed tomography
1094:Mechanically stimulated gas emission
1009:Laser induced breakdown spectroscopy
785:Grazing incidence X-ray reflectivity
755:Gas chromatography-mass spectrometry
630:Electron spin resonance spectroscopy
516:Energy dispersive X-ray spectroscopy
500:Energy-dispersive analysis of x-rays
470:(see IBIC: ion beam induced charge)
317:Convergent beam electron diffraction
1692:Ultrasound attenuation spectroscopy
1513:Scanning ion-conductance microscopy
1489:Surface enhanced Raman spectroscopy
1404:Resonant inelastic X-ray scattering
1386:Reflectance difference spectroscopy
1367:Resonant anomalous X-ray scattering
1070:Magnetic resonance force microscopy
1064:Multiphoton fluorescence microscopy
1015:Laser optical emission spectroscopy
834:High-resolution electron microscopy
779:Grazing incidence X-ray diffraction
767:Glow discharge optical spectroscopy
269:(BET from Brunauer, Emmett, Teller)
1824:X-ray resonant exchange scattering
1429:Selected area electron diffraction
1206:Positron annihilation spectroscopy
488:Exclusive correlation spectroscopy
353:Confocal laser scanning microscopy
14:
1277:Photoemission electron microscopy
1271:electron energy loss spectroscopy
567:Electron nuclear double resonance
544:electrical resistivity tomography
522:Electron energy loss spectroscopy
494:Electrical capacitance tomography
443:Differential scanning calorimetry
419:Deep-level transient spectroscopy
371:Cryo-scanning electron microscopy
236:Appearance potential spectroscopy
1812:X-ray photoelectron spectroscopy
1716:Ultravioletβvisible spectroscopy
1673:Two-photon excitation microscopy
1668:Time-of-flight mass spectrometry
1629:Transmission electron microscopy
979:Low-angle laser light scattering
960:Isothermal titration calorimetry
913:Intelligent gravimetric analysis
761:Glow discharge mass spectrometry
561:Electrophoretic light scattering
482:Electron backscatter diffraction
431:Dual polarisation interferometry
219:Atomic fluorescence spectroscopy
1878:. London: John Wiley and Sons.
1599:Scanning tunneling spectroscopy
1531:Secondary ion mass spectrometry
1343:Quasielastic neutron scattering
1224:Photoemission of adsorbed xenon
991:Low-energy electron diffraction
931:Ion neutralization spectroscopy
925:particle induced X-ray emission
583:Electron paramagnetic resonance
540:Electrical impedance tomography
437:Diffuse reflection spectroscopy
230:Atom probe field ion microscopy
158:
1441:Small angle neutron scattering
1380:Reflection electron microscopy
1324:Photothermal microspectroscopy
997:Low-energy electron microscopy
611:Electron stimulated desorption
224:Analytical ultracentrifugation
195:Atomic absorption spectroscopy
1:
1782:X-ray absorption spectroscopy
1698:UV-photoelectron spectroscopy
1593:Scanning tunneling microscopy
1471:Size exclusion chromatography
1188:Optical emission spectroscopy
1166:Near-field optical microscopy
1058:Magnetic induction tomography
797:Gel permeation chromatography
706:Fluorescence lifetime imaging
468:Electron beam induced current
449:Differential thermal analysis
153:
1788:X-ray crystal truncation rod
1483:Scanning electron microscopy
1447:Small angle X-ray scattering
1410:Resonance Raman spectroscopy
1179:Optical beam induced current
1046:Medium energy ion scattering
936:Inelastic neutron scattering
577:Electron probe microanalysis
329:Coherent diffraction imaging
323:Charge collection microscopy
267:BET surface area measurement
254:Attenuated total reflectance
1747:Wide angle X-ray scattering
1118:Neutron activation analysis
954:Ion scattering spectroscopy
534:Electron induced desorption
425:Dynamic mechanical analysis
390:Dielectric thermal analysis
207:Auger electron spectroscopy
1953:
1635:Thermogravimetric analysis
1465:Spectroscopic ellipsometry
1284:Photoelectron spectroscopy
1211:Photoacoustic spectroscopy
1076:Magnetic resonance imaging
810:annular dark-field imaging
201:Auger electron diffraction
1662:Thermomechanical analysis
1656:photothermal spectroscopy
1618:Thermoacoustic tomography
1605:Surface X-ray diffraction
1561:capillary-electrophoresis
1555:Scanning probe microscopy
1435:Scanning Auger microscopy
1423:Selected area diffraction
1373:Rutherford backscattering
1330:Photothermal spectroscopy
1296:nuclear reaction analysis
1265:Photoelectron diffraction
1241:Photoelectron diffraction
1235:Phase contrast microscopy
1230:Photocurrent spectroscopy
1160:Nuclear reaction analysis
1052:Magnetic force microscopy
1003:Low-energy ion scattering
791:Gas-liquid chromatography
673:Field emission microscopy
396:De Haasβvan Alphen effect
335:Capillary electrophoresis
33:
1800:X-ray diffuse scattering
1677:TXRF β Total reflection
1622:photoacoustic tomography
1217:Photoacoustic tomography
1088:Tandem mass spectrometry
1021:Light (Raman) scattering
594:elastic recoil detection
590:Elastic recoil detection
555:Electron crystallography
413:Dynamic light scattering
365:Cryo-electron microscopy
359:Correlation spectroscopy
341:Cryo-electron tomography
1727:VEDIC β Video-enhanced
1130:Neutron depth profiling
901:Ion cyclotron resonance
877:Ion beam induced charge
711:Fluorescence microscopy
700:Fluorescence anisotropy
623:Electrospray ionization
455:Dynamic vapour sorption
407:Dielectric spectroscopy
213:Atomic force microscopy
182:magnetic susceptibility
1874:Callister, WD (2000).
1843:X-ray Raman scattering
1525:Solid immersion mirror
1099:MΓΆssbauer spectroscopy
1040:Molecular beam epitaxy
816:Helium atom scattering
176:muon spin spectroscopy
148:
143:
138:
133:
128:
123:
118:
113:
108:
103:
98:
93:
88:
83:
78:
73:
68:
63:
58:
53:
48:
43:
38:
1937:Scientific techniques
1932:Science-related lists
1794:X-ray crystallography
1105:Microthermal analysis
948:Infrared spectroscopy
648:Exchange spectroscopy
1927:Analytical chemistry
1893:Yao, N, ed. (2007).
1519:Solid immersion lens
686:Field ion microscopy
1849:X-ray standing wave
1124:Neutron diffraction
808:HAADF β High angle
550:Electroluminescence
347:Cathodoluminescence
27:Contents:
1837:X-ray reflectivity
1830:X-ray fluorescence
1774:, synonymous with
1710:Ultrasonic testing
1679:X-ray fluorescence
1575:Stark spectroscopy
1408:RR spectroscopy β
1361:Raman spectroscopy
1318:Powder diffraction
895:Immunofluorescence
695:Flow birefringence
621:ESI-MS or ES-MS β
377:Cyclic voltammetry
1922:Materials science
1904:978-0-521-83199-4
1818:X-ray diffraction
1564:mass-spectrometry
1308:Photoluminescence
1269:PEELS β parallel
1082:Mass spectrometry
871:Ion beam analysis
733:FTICR or FT-MS β
18:materials science
1944:
1908:
1889:
919:Inert gas fusion
679:Focused ion beam
28:
1952:
1951:
1947:
1946:
1945:
1943:
1942:
1941:
1912:
1911:
1905:
1892:
1886:
1873:
1870:
1858:
1761:
1742:
1724:
1688:
1613:
1418:
1357:
1338:
1247:Photodesorption
1201:
1174:
1113:
1029:
974:
860:
805:
750:
656:
463:
385:
300:
262:
190:
171:
166:
165:
164:
163:
29:
26:
12:
11:
5:
1950:
1948:
1940:
1939:
1934:
1929:
1924:
1914:
1913:
1910:
1909:
1903:
1890:
1884:
1869:
1866:
1865:
1864:
1857:
1854:
1853:
1852:
1845:
1839:
1833:
1826:
1820:
1814:
1808:
1802:
1796:
1791:
1784:
1778:
1768:
1760:
1757:
1756:
1755:
1749:
1741:
1738:
1737:
1736:
1731:
1723:
1720:
1719:
1718:
1712:
1706:
1703:
1700:
1694:
1687:
1684:
1683:
1682:
1675:
1670:
1664:
1658:
1652:
1646:
1640:
1637:
1631:
1625:
1616:TAT or TACT β
1612:
1609:
1608:
1607:
1601:
1595:
1589:
1583:
1577:
1572:
1566:
1557:
1551:
1545:
1539:
1533:
1527:
1521:
1515:
1509:
1503:
1497:
1491:
1485:
1479:
1473:
1467:
1461:
1455:
1449:
1443:
1437:
1431:
1425:
1417:
1414:
1413:
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1406:
1400:
1394:
1388:
1382:
1376:
1369:
1363:
1356:
1353:
1352:
1351:
1345:
1337:
1334:
1333:
1332:
1326:
1320:
1315:
1310:
1304:
1298:
1292:
1286:
1280:
1273:
1267:
1261:
1255:
1249:
1243:
1237:
1232:
1226:
1220:
1215:PAT or PACT β
1213:
1208:
1200:
1197:
1196:
1195:
1190:
1184:
1181:
1173:
1170:
1169:
1168:
1162:
1156:
1150:
1144:
1138:
1132:
1126:
1120:
1112:
1109:
1108:
1107:
1101:
1096:
1090:
1084:
1078:
1072:
1066:
1060:
1054:
1048:
1042:
1036:
1028:
1025:
1024:
1023:
1017:
1011:
1005:
999:
993:
987:
981:
973:
970:
969:
968:
962:
956:
950:
944:
938:
933:
927:
921:
915:
909:
903:
897:
892:
886:
880:
873:
867:
859:
856:
855:
854:
848:
842:
836:
830:
824:
818:
812:
804:
801:
800:
799:
793:
787:
781:
775:
769:
763:
757:
749:
746:
745:
744:
738:
731:
725:
719:
713:
708:
702:
697:
692:
682:
675:
669:
663:
655:
652:
651:
650:
644:
638:
632:
626:
619:
613:
607:
597:
588:ERD or ERDA β
586:
579:
573:
563:
557:
552:
546:
538:EIT and ERT β
536:
530:
524:
518:
512:
502:
496:
490:
484:
478:
471:
462:
459:
458:
457:
451:
445:
439:
433:
427:
421:
415:
409:
404:
398:
392:
384:
381:
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379:
373:
367:
361:
355:
349:
343:
337:
331:
325:
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313:
307:
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288:
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276:
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261:
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136:
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96:
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56:
51:
46:
41:
36:
30:
25:
24:
22:
13:
10:
9:
6:
4:
3:
2:
1949:
1938:
1935:
1933:
1930:
1928:
1925:
1923:
1920:
1919:
1917:
1906:
1900:
1896:
1891:
1887:
1885:0-471-32013-7
1881:
1877:
1872:
1871:
1867:
1863:
1860:
1859:
1855:
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1846:
1844:
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1815:
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1809:
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1803:
1801:
1797:
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1792:
1789:
1785:
1783:
1779:
1777:
1773:
1769:
1767:
1763:
1762:
1758:
1754:
1751:WDX or WDS β
1750:
1748:
1744:
1743:
1739:
1735:
1732:
1730:
1726:
1725:
1721:
1717:
1713:
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1393:
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1370:
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1218:
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1202:
1198:
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1189:
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1133:
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1127:
1125:
1121:
1119:
1115:
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1106:
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1100:
1097:
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1091:
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1073:
1071:
1067:
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1059:
1055:
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1049:
1047:
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1026:
1022:
1018:
1016:
1012:
1010:
1006:
1004:
1000:
998:
994:
992:
988:
986:
982:
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976:
975:
971:
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961:
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951:
949:
945:
943:
939:
937:
934:
932:
928:
926:
922:
920:
916:
914:
910:
908:
904:
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893:
891:
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881:
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868:
866:
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837:
835:
831:
829:
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823:
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811:
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788:
786:
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764:
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541:
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531:
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514:EDS or EDX β
513:
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497:
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107:
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62:
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57:
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47:
45:
42:
40:
37:
35:
32:
31:
21:
19:
1894:
1875:
1375:spectrometry
1228:PC or PCS β
585:spectroscopy
15:
1734:Voltammetry
1313:Porosimetry
369:Cryo-SEM β
1916:Categories
1868:References
1790:scattering
1451:SCANIIR β
882:ICP-AES β
879:microscopy
850:HE-PIXE β
844:HI-ERDA β
690:atom probe
681:microscopy
571:ESR or EPR
510:ESR or EPR
363:Cryo-EM β
303:CAICISS β
174:ΞΌSR β see
159:References
1851:technique
1714:UV-Vis β
1666:TOF-MS β
1505:SEXAFS β
1499:SESANS β
1193:Osmometry
1134:NEXAFS β
888:ICP-MS β
826:HREELS β
771:GISAXS β
684:FIM-AP β
388:DE(T)A β
1856:See also
1832:analysis
1804:XPEEM β
1786:X-CTR β
1770:XANES β
1681:analysis
1648:TIRFM β
1568:SSNMR β
1547:SPECT β
1493:SERRS β
1475:SEIRA β
1390:RHEED β
1365:RAXRS β
1347:QCM-D β
1288:PINEM β
1251:PDEIS β
1152:NOESY β
1086:MS/MS β
1032:MALDI β
983:LC-MS β
977:LALLS β
940:IRNDT β
838:HRTEM β
753:GC-MS β
715:FOSPM β
640:EXAFS β
596:analysis
565:ENDOR β
526:EFTEM β
486:ECOSY β
246:ARUPS β
240:ARPES β
228:APFIM β
180:Ο β see
154:See also
1822:XRES β
1764:XAES β
1745:WAXS β
1642:TIMS β
1603:SXRD β
1585:STEM β
1579:STED β
1541:SNOM β
1535:SNMS β
1529:SIMS β
1511:SICM β
1487:SERS β
1457:SCEM β
1445:SAXS β
1439:SANS β
1427:SAED β
1402:RIXS β
1396:RIMS β
1341:QENS β
1322:PTMS β
1300:PIXE β
1275:PEEM β
1177:OBIC β
1164:NSOM β
1092:MSGE β
1068:MRFM β
1044:MEIS β
1013:LOES β
1007:LIBS β
1001:LEIS β
995:LEEM β
989:LEED β
964:IVEM β
905:IETS β
875:IBIC β
863:IAES β
832:HREM β
820:HPLC β
783:GIXR β
777:GIXD β
765:GDOS β
759:GDMS β
740:FTIR β
721:FRET β
704:FLIM β
665:FCCS β
646:EXSY β
634:ESTM β
615:ESEM β
599:ESCA β
575:EPMA β
520:EELS β
504:EDMR β
498:EDAX β
480:EBSD β
466:EBIC β
417:DLTS β
394:dHvA β
357:COSY β
351:CLSM β
315:CBED β
309:CARS β
284:BRET β
272:BiFC β
169:Symbols
1901:
1882:
1847:XSW β
1841:XRS β
1835:XRR β
1828:XRF β
1816:XRD β
1810:XPS β
1798:XDS β
1780:XAS β
1696:UPS β
1660:TMA β
1633:TGA β
1627:TEM β
1624:β PAT)
1597:STS β
1591:STM β
1553:SPM β
1523:SIM β
1517:SIL β
1481:SEM β
1469:SEC β
1433:SAM β
1421:SAD β
1384:RDS β
1378:REM β
1371:RBS β
1328:PTS β
1282:PES β
1263:PED β
1257:PDS β
1239:PhD β
1222:PAX β
1204:PAS β
1186:OES β
1158:NRA β
1146:NMR β
1140:NIS β
1128:NDP β
1116:NAA β
1103:MTA β
1074:MRI β
1062:MPM β
1056:MIT β
1050:MFM β
1038:MBE β
958:ITC β
952:ISS β
946:IRS β
929:INS β
917:IGF β
911:IGA β
899:ICR β
869:IBA β
814:HAS β
795:GPC β
789:GLC β
677:FIB β
671:FEM β
659:FCS β
628:ESR β
609:ESD β
581:EPR β
569:, see
559:ELS β
532:EID β
508:, see
492:ECT β
453:DVS β
447:DTA β
441:DSC β
435:DRS β
429:DPI β
423:DMA β
411:DLS β
400:DIC β
339:CET β
327:CDI β
321:CCM β
265:BET β
252:ATR β
234:APS β
217:AFS β
211:AFM β
205:AES β
199:AED β
193:AAS β
1772:XANES
1708:UT β
1463:SE β
1306:PL β
1245:PD β
1122:ND β
1080:MS β
1019:LS β
548:EL β
375:CV β
345:CL β
333:CE β
1899:ISBN
1880:ISBN
603:see
542:and
292:EBSD
280:EBSD
34:!$ @
729:ERD
605:XPS
592:or
475:RBS
1918::
1907:.
1888:.
1759:X
1740:W
1722:V
1686:U
1611:T
1416:S
1355:R
1336:Q
1199:P
1172:O
1111:N
1027:M
972:L
858:I
803:H
748:G
688:β
654:F
477:)
461:E
383:D
298:C
260:B
188:A
149:X
144:W
139:V
134:U
129:T
124:S
119:R
114:Q
109:P
104:O
99:N
94:M
89:L
84:K
79:I
74:H
69:G
64:F
59:E
54:D
49:C
44:B
39:A
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