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in a layered perovskite structure. He invented a method (scanning tunnelling potentiometry) to realise images of electrical surface potentials by means of scanning tunnelling microscopy at the IBM Research
Laboratory Zurich. Later he specialised in thin film processing and applications of
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89:. He was born in 1954 in Zurich, Switzerland. He studied solid state physics at the
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This article about a Swiss engineer, inventor or industrial designer is a
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P. Muralt, R. Kind, R. Blind, B. Zeks, Phys. Rev. Lett. 49, 1019 (1986)
93:(ETH). He made a thesis at the same university on incommensurate
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Fellow of the
Institute of Electrical and Electronics Engineers
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Academic staff of the École
Polytechnique Fédérale de Lausanne
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piezoelectric, pyroelectric, and ferroelectric thin films.
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P. Muralt, D.W.Pohl, Appl.Phys.Lett. 48, 514 (1982)
79:Swiss Federal Institute of Technology in Lausanne
91:Swiss Federal Institute of Technology in Zurich
160:P. Muralt, J.Micromech.Microeng.10, 136 (2000)
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85:(IEEE) in 2013 for his contributions to
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81:, Switzerland. He was named a
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232:Categories
102:References
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