1343:. Put simply, in a crystalline solid, the probability of interaction between an electron and ion in the lattice depends strongly on the momentum (direction and velocity) of the electron. When probing a sample under diffraction conditions near a zone axis, as is often the case in EDS and EELS applications, channelling can have a large impact on the effective interaction of the incident electrons with specific ions in the crystal structure. In practice, this can lead to erroneous measurements of composition that depend strongly on the orientation and thickness of the sample and the accelerating voltage. Since PED entails an integration over incident directions of the electron probe, and generally does not include beams parallel to the zone axis, the detrimental channeling effects outlined above can be minimized, yielding far more accurate composition measurements in both techniques.
124:) that is excited at any given moment during precession extends farther into reciprocal space. After integration over multiple precessions, many more reflections in the zeroeth order Laue zone (ZOLZ) are present, and as stated previously, their relative intensities are much more kinematical. This provides considerably more information to input into direct methods calculations, improving the accuracy of phase determination algorithms. Similarly, more higher order Laue zone (HOLZ) reflections are present in the pattern, which can provide more complete information about the three-dimensional nature of reciprocal space, even in a single two-dimensional PED pattern.
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71:. The animation illustrates the geometry used to generate a PED pattern. Specifically, the beam tilt coils located pre-specimen are used to tilt the electron beam off of the optic axis so it is incident with the specimen at an angle, φ. The image shift coils post-specimen are then used to tilt the diffracted beams back in a complementary manner such that the direct beam falls in the center of the diffraction pattern. Finally, the beam is precessed around the optic axis while the diffraction pattern is collected over multiple revolutions.
114:. Few reflections are strongly excited at any moment during precession, and those that are excited are generally much closer to a two-beam condition (dynamically coupled only to the forward-scattered beam). Furthermore, for large precession angles, the radius of the excited Laue circle becomes quite large. These contributions combine such that the overall integrated diffraction pattern resembles the kinematical pattern much more closely than a single zone axis pattern.
1126:. Because of the increased number of reflections in both the zero order Laue zone and higher order Laue zones, the geometric relationship between Laue zones is more readily determined. This provides three-dimensional information about the crystal structure that can be used to determine its space group. Furthermore, because the PED technique is insensitive to slight misorientation from the zone axis, it provides the practical benefit of more robust data collection.
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standard cases 60 Hz has been used. In choosing a precession rate, it is important to ensure that many revolutions of the beam occur over the relevant exposure time used to record the diffraction pattern. This ensures adequate averaging over the excitation error of each reflection. Beam sensitive samples may dictate shorter exposure times and thus, motivate the use of higher precession frequencies.
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specimen. Because many dynamical contrast effects are highly sensitive to the orientation of the crystalline sample with respect to the incident beam, these effects can convolute the reconstruction process in tomography. Similarly to single imaging applications, by reducing dynamical contrast, interpretation of the 2-D projections and thus the 3-D reconstruction are more straightforward.
110:: While the underlying physics of the electron diffraction is still dynamical in nature, the conditions used to collect PED patterns minimize many of these effects. The scan/de-scan procedure reduces ion channeling because the pattern is generated off of the zone axis. Integration via precession of the beam minimizes the effect of non-systematic inelastic scattering, such as
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1275:, this is accomplished by recording a diffraction pattern at a large number of points (pixels) over a region of the crystalline specimen. By comparing the recorded patterns to a database of known patterns (either previously indexed experimental patterns or simulated patterns), the relative orientation of grains in the field of view can be determined.
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calculations can the diffraction patterns generated by PED be simulated. However, this requires the crystal potential to be known, and thus is most valuable in refining the crystal potentials suggested through direct methods approaches. The theory of precession electron diffraction is still an active
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One of the most significant parameters affecting the diffraction pattern obtained is the precession angle, φ. In general, larger precession angles result in more kinematical diffraction patterns, but both the capabilities of the beam tilt coils in the microscope and the requirements on the probe size
1846:
Hadermann, Joke; Abakumov, Artem M.; Tsirlin, Alexander A.; Filonenko, Vladimir P.; Gonnissen, Julie; Tan, Haiyan; Verbeeck, Johan; Gemmi, Mauro; Antipov, Evgeny V.; Rosner, Helge (2010). "Direct space structure solution from precession electron diffraction data: Resolving heavy and light scatterers
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in the TEM. Specifically, the reduced dynamical intensity transfer between beams that is associated with PED results in reduced dynamical contrast in images collected during precession of the beam. This includes a reduction in thickness fringes, bend contours, and strain fields. While these features
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While it is clear that precession reduces many of the dynamical diffraction effects that plague other forms of electron diffraction, the resulting patterns cannot be considered purely kinematical in general. There are models that attempt to introduce corrections to convert measured PED patterns into
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corrected instruments. In principle the minimum precessed probe can reach approximately the full-width-half-max (FWHM) of the converged un-precessed probe in any instrument, however in practice the effective precessed probe is typically ~10-50x larger due to uncontrolled aberrations present at high
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The result of this process is a diffraction pattern that consists of a summation or integration over the patterns generated during precession. While the geometry of this pattern matches the pattern associated with a normally incident beam, the intensities of the various reflections approximate those
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Though many people conceptualize images and diffraction patterns separately, they contain principally the same information. In the simplest approximation, the two are simply
Fourier transforms of one another. Thus, the effects of beam precession on diffraction patterns also have significant effects
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According to NanoMEGAS, as of June, 2015, more than 200 publications have relied on the technique to solve or corroborate crystal structures; many on materials that could not be solved by other conventional crystallography techniques like x-ray diffraction. Their retrofit hardware system is used in
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PED is less sensitive to small experimental variations than other electron diffraction techniques. Since the measurement is an average over many incident beam directions, the pattern is less sensitive to slight misorientation of the zone axis from the optic axis of the microscope, and resulting PED
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The PED technique has been used to determine the crystal structure of many classes of materials. Initial investigations during the emergence of the technique focused on complex oxides and nano-precipitates in
Aluminum alloys that could not be resolved using x-ray diffraction. Since becoming a more
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If the precession angle is made too large, further complications due to the overlap of the ZOLZ and HOLZ reflections in the projected pattern can occur. This complicates the indexing of the diffraction pattern and can corrupt the measured intensities of reflections near the overlap region, thereby
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Because this process is highly automated, the quality of the recorded diffraction patterns is crucial to the software's ability to accurately compare and assign orientations to each pixel. Thus, the advantages of PED are well-suited for use with this scanning technique. By instead recording a PED
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Automated diffraction tomography (ADT) uses software to collect diffraction patterns over a series of slight tilt increments. In this way, a three-dimensional (tomographic) data set of reciprocal lattice intensities can be generated and used for structure determination. By coupling this technique
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crystal structure demonstrated the feasibility of the technique at reducing dynamical effects and providing quasi-kinematical patterns that could be solved through direct methods to determine crystal structure. Over the next ten years, a number of university groups developed their own precession
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Because x-rays interact so weakly with matter, there is a minimum size limit of approximately 5 ÎĽm for single crystals that can be examined via x-ray diffraction methods. In contrast, electrons can be used to probe much smaller nano-crystals in a TEM. In PED, the probe size is limited by the
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In an extension of the application of PED to imaging, electron tomography can benefit from the reduction of dynamic contrast effects. Tomography entails collecting a series of images (2-D projections) at various tilt angles and combining them to reconstruct the three dimensional structure of the
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Precession electron diffraction is typically conducted using accelerating voltages between 100-400 kV. Patterns can be formed under parallel or convergent beam conditions. Most modern TEMs can achieve a tilt angle, φ, ranging from 0-3°. Precession frequencies can be varied from Hz to kHz, but in
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This form seeks to correct for both geometric and dynamical effects, but is still only an approximation that often fails to significantly improve the kinematic quality of the diffraction pattern (sometimes even worsening it). More complete and accurate treatments of these theoretical correction
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Feyand, Mark; Mugnaioli, Enrico; Vermoortele, Frederik; Bueken, Bart; Dieterich, Johannes M.; Reimer, Tim; Kolb, Ute; DeVos, Dirk; Stock, Norbert (2012). "Automated
Diffraction Tomography for the Structure Elucidation of Twinned, Sub-micrometer Crystals of a Highly Porous, Catalytically Active
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developed the first commercial precession system capable of being retrofit to any modern TEM. This hardware solution enabled more widespread implementation of the technique and spurred its more mainstream adoption into the crystallography community. Software methods have also been developed to
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PED also enables the use of electron diffraction to investigate beam-sensitive organic materials. Because PED can reproduce symmetric zone axis diffraction patterns even when the zone axis is not perfectly aligned, it enables information to be extracted from sensitive samples without risking
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is the radius of the Laue circle, usually taken to be equal to φ. While this correction accounts for the integration over the excitation error, it takes no account for the dynamical effects that are ever-present in electron diffraction. This has been accounted for using a two-beam correction
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Energy-dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) are commonly used techniques to both qualitatively and quantitatively probe the composition of samples in the TEM. A primary challenge in the quantitative accuracy of both techniques is the phenomenon of
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Thus, if the specimen of interest is quite small, the maximum precession angle will be restrained. This is most significant for conditions of convergent beam illumination. 50 nm is a general lower limit on probe size for standard TEMs operating at high precession angles
625:
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Hadermann, Joke; Abakumov, Artem M.; Turner, Stuart; Hafideddine, Zainab; Khasanova, Nellie R.; Antipov, Evgeny V.; Van
Tendeloo, Gustaaf (2011). "Solving the Structure of Li Ion Battery Materials with Precession Electron Diffraction: Application to Li2CoPO4F".
643:
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Boulahya, Khalid; Ruiz-González, Luisa; Parras, Marina; González-Calbet, José M.; Nickolsky, M.S.; Nicolopoulos, Stavros (2007). "Ab initio determination of heavy oxide perovskite related structures from precession electron diffraction data".
458:
1173:, and is one of the primary reasons that technique has been so successful at solving crystal structures. However, in electron diffraction, the probing wave interacts much more strongly with the electrostatic crystal potential, and complex
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true kinematical patterns that can be used for more accurate direct methods calculations, with varying degrees of success. Here, the most basic corrections are discussed. In purely kinematical diffraction, the intensities of various
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angles of tilt. For example, a 2 nm precessed probe with >40 mrad precession angle was demonstrated in an aberration-corrected Nion UltraSTEM with native sub-Ă… probe (aberrations corrected to ~35 mrad half-angle).
152:
limit how large this angle can become in practice. Because PED takes the beam off of the optic axis by design, it accentuates the effect of the spherical aberrations within the probe forming lens. For a given spherical aberration, C
42:(TEM). By rotating (precessing) a tilted incident electron beam around the central axis of the microscope, a PED pattern is formed by integration over a collection of diffraction conditions. This produces a quasi-kinematical
1164:
If the diffraction can be considered kinematical, constraints may be used to probabilistically relate the phases of the reflections to their amplitudes, and the original structure can be solved via direct methods (see
131:
patterns will generally still display the zone axis symmetry. The patterns obtained are also less sensitive to the thickness of the sample, a parameter with strong influence in standard electron diffraction patterns.
138:
lens aberrations and sample thickness. With a typical value for spherical aberration, the minimum probe size is usually around 50 nm. However, with Cs corrected microscopes, the probe can be made much smaller.
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Diffraction patterns collected through PED often agree well-enough with the kinematical pattern to serve as input data for direct methods calculations. A three-dimensional set of intensities mapped over the
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with PED, the range and quality of the data set can be improved. The combination of ADT-PED has been employed effectively to investigate complex framework structures and beam-sensitive organic crystals
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for the
DigitalMicrograph software. This plug-in enables the widely used software package to collect precession electron diffraction patterns without additional modifications to the microscope.
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that typically occur. PED has been demonstrated to be a viable alternative to solving many of these structures, including the ZSM-10, MCM-68, and many of the ITQ-n class of zeolite structures.
205:
319:
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Gilmore, Christopher J.; Dong, Wei; Dorset, Douglas L. (2008). "Solving the crystal structures of zeolites using electron diffraction data. I. The use of potential-density histograms".
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pattern at each pixel, dynamical effects are reduced, and the patterns are more easily compared to simulated data, improving the accuracy of the automated phase/orientation assignment.
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844:{\displaystyle I_{\mathbf {g} }^{kinematical}\propto I_{\mathbf {g} }^{experimental}\cdot g{\sqrt {1-{\frac {g}{2R_{o}}}}}\cdot \int \limits _{0}^{A_{\mathbf {g} }}J_{0}(2x)\,dx}
352:
1964:
Dorset, Douglas L.; Gilmore, Christopher J.; Jorda, Jose Luis; Nicolopoulos, Stavros (2007). "Direct electron crystallographic determination of zeolite zonal structures".
255:
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20:
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466:. First, a Lorentz correction analogous to that used in x-ray diffraction can be applied to account for the fact that reflections are infrequently exactly at the
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EstradĂ©, Sonia; Portillo, Joaquim; Yedra, LluĂs; Rebled, JosĂ© Manuel; PeirĂł, Francesca (2012). "EELS signal enhancement by means of beam precession in the TEM".
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information is lost in general since intensity is a measurement of the square of the modulus of the amplitude of any given diffracted beam. This is known as the
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can often provide useful information, their suppression enables a more straightforward interpretation of diffraction contrast and mass contrast in images.
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are a collection of mathematical techniques that seek to determine crystal structure based on measurements of diffraction patterns and potentially other
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with a radius equal to the precession angle, φ. It is crucial to note that these snapshots contain far fewer strongly excited reflections than a normal
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Derived from Three-Dimensional
Electron Diffraction Intensity Data Collected by a Precession Technique. Comparison with Convergent-Beam Diffraction"
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factors have been shown to adjust measured intensities into better agreement with kinematical patterns. For details, see
Chapter 4 of reference.
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Own, C.S.; Sinkler, W.; Marks, L.D. (2006). "Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction data".
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1203:. Applying direct methods to this data set will then yield probable crystal structures. Coupling direct methods results with simulations (e.g.
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Geometry of electron beam in precession electron diffraction. Original diffraction patterns collected by C.S. Own at
Northwestern University
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Morniroli, J.-P.; Redjaimia, A. (2007). "Electron precession microdiffraction as a useful tool for the identification of the space group".
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Mapping the relative orientation of crystalline grains and/or phases helps understand material texture at the micro and nano scales. In a
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are a technologically valuable class of materials that have historically been difficult to solve using x-ray diffraction due to the large
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Vincent, R.; Midgley, P.A. (1994). "Double conical beam-rocking system for measurement of integrated electron diffraction intensities".
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This relationship is generally far from accurate for experimental dynamical electron diffraction and when many reflections have a large
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Kolb, U.; Gorelik, T.; Kübel, C.; Otten, M.T.; Hubert, D. (2007). "Towards automated diffraction tomography: Part I—Data acquisition".
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Own, C. S.: PhD thesis, System Design and
Verification of the Precession Electron Diffraction Technique, Northwestern University, 2005,
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PED possesses many advantageous attributes that make it well suited to investigating crystal structures via direct methods approaches:
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of the technique have been found to enhance many other investigative techniques in the TEM. These include bright field and dark field
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For an introduction to the theory of electron diffraction, see part 2 of
Williams and Carter's Transmission Electron Microscopy text
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Gjønnes, Kjersti (1997). "On the integration of electron diffraction intensities in the Vincent-Midgley precession technique".
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effects can dominate the measured diffraction patterns. This makes application of direct methods much more challenging without
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achieve the necessary scanning and descanning using the built-in electronics of the TEM. HREM Research Inc has developed the
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Morniroli, J.P.; Steeds, J.W. (1992). "Microdiffraction as a tool for crystal structure identification and determination".
620:{\displaystyle I_{\mathbf {g} }^{kinematical}\propto I_{\mathbf {g} }^{experimental}\cdot g{\sqrt {1-{\frac {g}{2R_{o}}}}}}
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2103:"Ab-initiocrystal structure analysis and refinement approaches of oligop-benzamides based on electron diffraction data"
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Own, CS; Dellby, N; Krivanek, O; Marks, LD; Murfitt, M (2007). "Aberration-corrected Precession Electron Diffraction".
91:. Thus, the composite pattern will display far less dynamical character, and will be well suited for use as input into
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over the course of a PED measurement. This geometrical correction factor can be shown to assume the approximate form:
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Precession electron diffraction enables much more direct determination of space group symmetries over other forms of
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M Gemmi , L.Righi ,G.Calestani, A.Migliori, A.Speghini, M.Santarosa , M.Bettinelli Ultramicroscopy 84 (2000)133-142
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J.Gjonnes,V.Hansen, BS Berg, P.Runde, YF Gheng, K.Gjonnes,DL Dorset ,C.Gilmore Acta Crystallogr (1998) A54, 306-319
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Gjønnes, J.; Hansen, V.; Berg, B. S.; Runde, P.; Cheng, Y. F.; Gjønnes, K.; Dorset, D. L.; Gilmore, C. J. (1998).
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knowledge (constraints). The central challenge of inverting measured diffraction intensities (i.e. applying an
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Eggeman, Alexander S.; Midgley, Paul A. (2012). "Precession Electron Diffraction". In Hawkes, Peter W. (ed.).
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Precession electron diffraction is accomplished utilizing the standard instrument configuration of a modern
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Gorelik, Tatiana E.; Van De Streek, Jacco; Kilbinger, Andreas F. M.; Brunklaus, Gunther; Kolb, Ute (2012).
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is to determine the three dimensional arrangement of atoms in a crystalline material. While historically,
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pattern much more closely. At any moment in time during precession, the diffraction pattern consists of a
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System Design and Verification of the Precession Electron Diffraction Technique, Ph.D. Thesis, C.S. Own
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M.Gemmi, X.Zou, S.Hovmoller, A.Migliori, M.Vennstrom, Y.Anderson Acta Crystallogr A (2003) A59, 117-126
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systems and verified the technique by solving complex crystal structures, including the groups of J.
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453:{\displaystyle {\begin{aligned}I_{\mathbf {g} }^{kinematical}=|F_{\mathbf {g} }|^{2}\end{aligned}}}
43:
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Although the PED technique was initially developed for its improved diffraction applications, the
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The symmetry of a crystalline material has profound impacts on its emergent properties, including
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widespread crystallographic technique, many more complex metal oxide structures have been solved.
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area of research, and efforts to improve on the ability to correct measured intensities without
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Smeets, Stef; McCusker, Lynne B.; Baerlocher, Christian; Mugnaioli, Enrico; Kolb, Ute (2013).
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2016:
1981:
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ASTAR TEM Orientation imaging of gold particles, courtesy of Dr. Mauro Gemmi, IIT Pisa Italia
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of the material. Determination of these attributes is an important aspect of crystallography.
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1076:, the advantages of precession electron diffraction make it one of the preferred methods of
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from Advanced Electron Microscopy course at Northwestern University. Prepared by Professor
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2072:"UsingFOCUSto solve zeolite structures from three-dimensional electron diffraction data"
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2144:
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156:, the probe diameter, d, varies with convergence angle, α, and precession angle, φ, as
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reducing the effectiveness of the collected pattern for direct methods calculations.
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2012:
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has been the predominant experimental method used to solve crystal structures
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The first precession electron diffraction system was developed by Vincent and
994:
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where g is the reciprocal space magnitude of the reflection in question and R
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in Bristol, UK and published in 1994. Preliminary investigation into the Er
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Zhang, Daliang; Oleynikov, Peter; Hovmöller, Sven; Zou, Xiaodong (2010).
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BS Berg,V.Hansen, PA Midgley, J Gjonnes Ultramicroscopy 74 (1998) 147-157
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following the form of the Blackman correction originally developed for
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2236:. Advances in Imaging and Electron Physics. Vol. 170. p. 1.
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1914:
908:{\displaystyle A_{\mathbf {g} }={\frac {2\pi tF_{\mathbf {g} }}{k}}}
638:. Combining this with the aforementioned Lorentz correction yields:
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1371:
http://www.numis.northwestern.edu/Research/Current/precession.shtml
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can be generated by collecting diffraction patterns over multiple
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http://www.nanomegas.com/Documents/Precession%20Applications.pdf
1581:"Collecting 3D electron diffraction data by the rotation method"
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overexposure during a time-intensive orientation of the sample.
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as an example). Kinematical diffraction is often the case in
2145:"Reduction of electron channeling in EDS using precession"
3728:
Zeitschrift für Kristallographie – New Crystal Structures
3723:
Zeitschrift für Kristallographie – Crystalline Materials
2221:
1207:) and iteratively refining the solution can lead to the
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Zuo, J. M. & Rouviere, J. L. (2015). IUCrJ 2, 7-8.
1151:) to determine the original crystal potential is that
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Only by considering the full dynamical model through
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321:, are related to the square of the amplitude of the
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619:
452:
346:
313:
249:
199:
2232:Eggeman, Alexander S.; Midgley, Paul A. (2012).
200:{\displaystyle d\propto 4C_{s}\phi ^{2}\alpha }
2688:Serial block-face scanning electron microscopy
2391:Detectors for transmission electron microscopy
314:{\displaystyle I_{\mathbf {g} }^{kinematical}}
2960:
2274:
8:
1628:
1626:
1624:
1051:more than 75 laboratories across the world.
16:Averaging technique for electron diffraction
3794:
3245:
3067:
3012:
2967:
2953:
2945:
2710:
2433:
2281:
2267:
2259:
1428:
1426:
1424:
1396:
1394:
1299:, and composition-probing techniques like
2168:
2143:Liao, Yifeng; Marks, Laurence D. (2013).
1604:
966:
960:
955:is the wave-vector of the electron beam.
940:
920:
892:
891:
875:
865:
864:
858:
834:
816:
803:
802:
797:
792:
774:
761:
753:
708:
702:
701:
658:
652:
651:
645:
606:
593:
585:
540:
534:
533:
490:
484:
483:
477:
440:
435:
427:
426:
417:
378:
372:
371:
363:
361:
337:
336:
330:
275:
269:
268:
262:
242:
240:
188:
178:
163:
1435:Advances in Imaging and Electron Physics
1365:
1363:
1361:
1359:
1357:
1355:
18:
2037:Angewandte Chemie International Edition
1351:
1211:determination of the crystal structure.
1181:knowledge of the structure in question.
118:Broader range of measured reflections:
108:Quasi-kinematical diffraction patterns
1501:Williams, D.B.; Carter, C.B. (1996).
34:) is a specialized method to collect
7:
3861:
3201:Phase transformation crystallography
2927:
1505:. New York and London: Plenum Press.
1301:energy-dispersive x-ray spectroscopy
1105:is described and categorized by the
46:that is more suitable as input into
3708:Journal of Chemical Crystallography
1774:"Structure Model for the Phase Alm
1031:(Oslo), Migliori (Bologna), and L.
2242:10.1016/B978-0-12-394396-5.00001-4
2076:Journal of Applied Crystallography
2035:Bismuth Metal-Organic Framework".
1443:10.1016/B978-0-12-394396-5.00001-4
14:
2324:Timeline of microscope technology
1305:electron energy loss spectroscopy
3860:
3849:
3848:
3455:
2926:
2915:
2914:
2110:Acta Crystallographica Section B
1923:Acta Crystallographica Section A
1785:Acta Crystallographica Section A
1685:10.1111/j.1365-2818.2007.01800.x
1585:Zeitschrift fĂĽr Kristallographie
1503:Transmission Electron Microscopy
1437:. Vol. 170. pp. 1–63.
1273:transmission electron microscope
1248:Automated diffraction tomography
893:
866:
804:
703:
653:
535:
485:
428:
373:
347:{\displaystyle F_{\mathbf {g} }}
338:
270:
243:
87:pattern and extend farther into
40:transmission electron microscope
2683:Precession electron diffraction
2234:Precession Electron Diffraction
1288:
28:Precession electron diffraction
3650:Bilbao Crystallographic Server
2206:10.1016/j.ultramic.2012.03.018
2161:10.1016/j.ultramic.2012.11.007
2013:10.1016/j.ultramic.2006.10.007
1978:10.1016/j.ultramic.2006.05.013
1897:10.1016/j.ultramic.2006.03.008
1861:10.1016/j.ultramic.2010.03.012
1751:10.1016/j.ultramic.2005.06.058
1225:Example of a zeolite structure
831:
822:
436:
418:
1:
1530:10.1016/S0304-3991(97)00031-4
935:is the sample thickness, and
1658:10.1016/0304-3991(92)90511-H
1468:Microscopy and Microanalysis
1415:10.1016/0304-3991(94)90039-6
250:{\displaystyle \mathbf {g} }
214:), but can be surpassed in C
50:algorithms to determine the
3698:Crystal Growth & Design
2990:Timeline of crystallography
3910:
3509:Nuclear magnetic resonance
2668:Immune electron microscopy
2586:Annular dark-field imaging
2401:Everhart–Thornley detector
227:Theoretical considerations
3844:
3713:Journal of Crystal Growth
3453:
2910:
2822:Hitachi High-Technologies
2122:10.1107/S0108768112003138
2088:10.1107/S0021889813014817
1943:10.1107/S010876730705862X
1805:10.1107/S0108767397017030
1480:10.1017/S1431927607078555
1334:Investigating composition
1149:inverse Fourier Transform
1091:electronic band structure
3579:Single particle analysis
3437:Hermann–Mauguin notation
2847:Thermo Fisher Scientific
2673:Geometric phase analysis
2561:Aberration-Corrected TEM
1095:electromagnetic behavior
1078:electron crystallography
636:powder x-ray diffraction
143:Practical considerations
3703:Crystallography Reviews
3547:Isomorphous replacement
3341:Lomer–Cottrell junction
2596:Charge contrast imaging
2406:Field electron emission
1289:advantageous properties
1189:structure determination
1002:knowledge are ongoing.
3216:Spinodal decomposition
2786:Thomas Eugene Everhart
2049:10.1002/anie.201204963
1821:Chemistry of Materials
1606:10.1524/zkri.2010.1202
1268:
1226:
1084:Symmetry determination
1006:Historical development
976:
949:
929:
909:
845:
811:
621:
454:
348:
315:
251:
201:
135:Very small probe size:
24:
3756:Gregori Aminoff Prize
3552:Molecular replacement
2791:Vernon Ellis Cosslett
2611:Dark-field microscopy
1673:Journal of Microscopy
1316:on the corresponding
1266:
1224:
1175:dynamical diffraction
1099:mechanical properties
1070:x-ray crystallography
977:
975:{\displaystyle J_{0}}
950:
930:
910:
846:
788:
622:
455:
349:
316:
252:
202:
128:Practical robustness:
120:The Laue circle (see
22:
3062:Structure prediction
2796:Vladimir K. Zworykin
2446:Correlative light EM
2355:Electron diffraction
1633:http://nanomegas.com
1124:electron diffraction
1064:The primary goal of
959:
939:
919:
857:
644:
476:
360:
329:
261:
239:
162:
36:electron diffraction
3326:Cottrell atmosphere
3306:Partial dislocation
3050:Restriction theorem
2761:Manfred von Ardenne
2746:Gerasimos Danilatos
2653:Electron tomography
2648:Electron holography
2591:Cathodoluminescence
2370:Secondary electrons
2360:Electron scattering
2304:Electron microscopy
2290:Electron microscopy
2043:(41): 10373–10376.
1935:2008AcCrA..64..284G
1797:1998AcCrA..54..306G
1597:2010ZK....225...94Z
1297:electron tomography
1259:Orientation mapping
1159:of crystallography.
746:
693:
578:
525:
413:
310:
44:diffraction pattern
3746:Carl Hermann Medal
3557:Molecular dynamics
3404:Defects in diamond
3399:Stone–Wales defect
3045:Reciprocal lattice
3007:Biocrystallography
2883:Digital Micrograph
2489:Environmental SEM
2411:Field emission gun
2375:X-ray fluorescence
1283:Beyond diffraction
1269:
1227:
1197:reciprocal lattice
986:of zeroeth order.
972:
945:
925:
905:
841:
697:
647:
617:
529:
479:
450:
448:
367:
344:
311:
264:
247:
197:
25:
3876:
3875:
3840:
3839:
3447:Thermal ellipsoid
3412:
3411:
3321:Frank–Read source
3281:
3280:
3147:Aperiodic crystal
3113:
3112:
2995:Crystallographers
2942:
2941:
2906:
2905:
2776:Nestor J. Zaluzec
2771:Maximilian Haider
2569:
2568:
1833:10.1021/cm201257b
1452:978-0-12-394396-5
1171:x-ray diffraction
948:{\displaystyle k}
928:{\displaystyle t}
903:
783:
781:
615:
613:
354:by the equation:
52:crystal structure
3901:
3864:
3863:
3852:
3851:
3795:
3718:Kristallografija
3572:Gerchberg–Saxton
3467:Characterisation
3459:
3442:Structure factor
3246:
3231:Ostwald ripening
3068:
3013:
2969:
2962:
2955:
2946:
2930:
2929:
2918:
2917:
2726:Bodo von Borries
2711:
2471:Photoemission EM
2434:
2283:
2276:
2269:
2260:
2255:
2210:
2209:
2189:
2183:
2182:
2172:
2140:
2134:
2133:
2107:
2098:
2092:
2091:
2067:
2061:
2060:
2031:
2025:
2024:
2007:(6–7): 507–513.
1996:
1990:
1989:
1972:(6–7): 462–473.
1961:
1955:
1954:
1918:
1909:
1908:
1891:(6–7): 445–452.
1879:
1873:
1872:
1847:in Pb13Mn9O25".
1843:
1837:
1836:
1815:
1809:
1808:
1782:
1769:
1763:
1762:
1734:
1728:
1725:
1719:
1714:
1705:
1704:
1668:
1662:
1661:
1641:
1635:
1630:
1619:
1618:
1608:
1576:
1570:
1567:
1561:
1558:
1552:
1549:
1543:
1540:
1534:
1533:
1513:
1507:
1506:
1498:
1492:
1491:
1463:
1457:
1456:
1430:
1419:
1418:
1398:
1389:
1379:
1373:
1367:
1103:Crystal symmetry
1035:(Northwestern).
981:
979:
978:
973:
971:
970:
954:
952:
951:
946:
934:
932:
931:
926:
914:
912:
911:
906:
904:
899:
898:
897:
896:
876:
871:
870:
869:
850:
848:
847:
842:
821:
820:
810:
809:
808:
807:
796:
784:
782:
780:
779:
778:
762:
754:
745:
707:
706:
692:
657:
656:
626:
624:
623:
618:
616:
614:
612:
611:
610:
594:
586:
577:
539:
538:
524:
489:
488:
464:excitation error
459:
457:
456:
451:
449:
445:
444:
439:
433:
432:
431:
421:
412:
377:
376:
353:
351:
350:
345:
343:
342:
341:
323:structure factor
320:
318:
317:
312:
309:
274:
273:
256:
254:
253:
248:
246:
206:
204:
203:
198:
193:
192:
183:
182:
89:reciprocal space
3909:
3908:
3904:
3903:
3902:
3900:
3899:
3898:
3894:Crystallography
3879:
3878:
3877:
3872:
3836:
3793:
3760:
3732:
3684:
3636:
3607:CrystalExplorer
3583:
3567:Phase retrieval
3530:
3461:
3460:
3451:
3408:
3387:Schottky defect
3286:Perfect crystal
3277:
3273:Abnormal growth
3235:
3221:Supersaturation
3184:Miscibility gap
3165:
3158:
3109:
3066:
3030:Bravais lattice
3011:
2978:
2976:Crystallography
2973:
2943:
2938:
2902:
2851:
2800:
2781:Ondrej Krivanek
2702:
2565:
2513:
2475:
2461:Liquid-Phase EM
2425:
2384:Instrumentation
2379:
2337:
2328:
2292:
2287:
2252:
2231:
2218:
2213:
2194:Ultramicroscopy
2191:
2190:
2186:
2149:Ultramicroscopy
2142:
2141:
2137:
2105:
2100:
2099:
2095:
2069:
2068:
2064:
2033:
2032:
2028:
2001:Ultramicroscopy
1998:
1997:
1993:
1966:Ultramicroscopy
1963:
1962:
1958:
1920:
1919:
1912:
1885:Ultramicroscopy
1881:
1880:
1876:
1849:Ultramicroscopy
1845:
1844:
1840:
1817:
1816:
1812:
1780:
1771:
1770:
1766:
1739:Ultramicroscopy
1736:
1735:
1731:
1726:
1722:
1715:
1708:
1670:
1669:
1665:
1646:Ultramicroscopy
1643:
1642:
1638:
1631:
1622:
1578:
1577:
1573:
1568:
1564:
1559:
1555:
1550:
1546:
1541:
1537:
1518:Ultramicroscopy
1515:
1514:
1510:
1500:
1499:
1495:
1465:
1464:
1460:
1453:
1432:
1431:
1422:
1403:Ultramicroscopy
1400:
1399:
1392:
1380:
1376:
1368:
1353:
1349:
1336:
1327:
1313:
1285:
1261:
1250:
1191:
1141:crystallography
1133:
1086:
1066:crystallography
1062:
1060:Crystallography
1057:
1025:
1021:
1017:
1008:
984:Bessel function
962:
957:
956:
937:
936:
917:
916:
887:
877:
860:
855:
854:
851:
812:
798:
770:
766:
642:
641:
632:
627:
602:
598:
474:
473:
468:Bragg condition
460:
447:
446:
434:
422:
358:
357:
332:
327:
326:
259:
258:
237:
236:
229:
217:
207:
184:
174:
160:
159:
155:
145:
101:
65:
60:
54:of the sample.
17:
12:
11:
5:
3907:
3905:
3897:
3896:
3891:
3881:
3880:
3874:
3873:
3871:
3870:
3858:
3845:
3842:
3841:
3838:
3837:
3835:
3834:
3829:
3824:
3823:
3822:
3817:
3812:
3801:
3799:
3792:
3791:
3786:
3781:
3776:
3770:
3768:
3762:
3761:
3759:
3758:
3753:
3748:
3742:
3740:
3734:
3733:
3731:
3730:
3725:
3720:
3715:
3710:
3705:
3700:
3694:
3692:
3686:
3685:
3683:
3682:
3677:
3672:
3667:
3662:
3657:
3652:
3646:
3644:
3638:
3637:
3635:
3634:
3629:
3624:
3619:
3614:
3609:
3604:
3599:
3593:
3591:
3585:
3584:
3582:
3581:
3576:
3575:
3574:
3564:
3559:
3554:
3549:
3544:
3542:Direct methods
3538:
3536:
3532:
3531:
3529:
3528:
3527:
3526:
3521:
3511:
3506:
3505:
3504:
3499:
3489:
3488:
3487:
3482:
3471:
3469:
3463:
3462:
3454:
3452:
3450:
3449:
3444:
3439:
3434:
3429:
3427:Ewald's sphere
3424:
3419:
3413:
3410:
3409:
3407:
3406:
3401:
3396:
3395:
3394:
3389:
3379:
3378:
3377:
3372:
3370:Frenkel defect
3367:
3365:Bjerrum defect
3357:
3356:
3355:
3345:
3344:
3343:
3338:
3333:
3331:Peierls stress
3328:
3323:
3318:
3313:
3308:
3303:
3301:Burgers vector
3293:
3291:Stacking fault
3288:
3282:
3279:
3278:
3276:
3275:
3270:
3265:
3260:
3254:
3252:
3250:Grain boundary
3243:
3237:
3236:
3234:
3233:
3228:
3223:
3218:
3213:
3208:
3203:
3198:
3197:
3196:
3194:Liquid crystal
3191:
3186:
3181:
3170:
3168:
3160:
3159:
3157:
3156:
3155:
3154:
3144:
3143:
3142:
3132:
3131:
3130:
3125:
3114:
3111:
3110:
3108:
3107:
3102:
3097:
3092:
3087:
3082:
3076:
3074:
3065:
3064:
3059:
3057:Periodic table
3054:
3053:
3052:
3047:
3042:
3037:
3032:
3021:
3019:
3010:
3009:
3004:
2999:
2998:
2997:
2986:
2984:
2980:
2979:
2974:
2972:
2971:
2964:
2957:
2949:
2940:
2939:
2937:
2936:
2924:
2911:
2908:
2907:
2904:
2903:
2901:
2900:
2895:
2890:
2888:Direct methods
2885:
2880:
2875:
2870:
2865:
2859:
2857:
2853:
2852:
2850:
2849:
2844:
2839:
2834:
2829:
2824:
2819:
2814:
2808:
2806:
2802:
2801:
2799:
2798:
2793:
2788:
2783:
2778:
2773:
2768:
2763:
2758:
2753:
2748:
2743:
2738:
2736:Ernst G. Bauer
2733:
2728:
2723:
2717:
2715:
2708:
2704:
2703:
2701:
2700:
2695:
2690:
2685:
2680:
2675:
2670:
2665:
2660:
2655:
2650:
2645:
2640:
2635:
2630:
2629:
2628:
2618:
2613:
2608:
2603:
2598:
2593:
2588:
2583:
2577:
2575:
2571:
2570:
2567:
2566:
2564:
2563:
2558:
2557:
2556:
2546:
2541:
2536:
2535:
2534:
2523:
2521:
2515:
2514:
2512:
2511:
2506:
2501:
2496:
2491:
2485:
2483:
2477:
2476:
2474:
2473:
2468:
2463:
2458:
2453:
2448:
2442:
2440:
2431:
2427:
2426:
2424:
2423:
2418:
2413:
2408:
2403:
2398:
2393:
2387:
2385:
2381:
2380:
2378:
2377:
2372:
2367:
2362:
2357:
2352:
2350:Bremsstrahlung
2347:
2341:
2339:
2330:
2329:
2327:
2326:
2321:
2316:
2311:
2306:
2300:
2298:
2294:
2293:
2288:
2286:
2285:
2278:
2271:
2263:
2257:
2256:
2250:
2229:
2224:
2217:
2216:External links
2214:
2212:
2211:
2184:
2135:
2116:(2): 171–181.
2093:
2062:
2026:
1991:
1956:
1929:(2): 284–294.
1910:
1874:
1855:(7): 881–890.
1838:
1827:(15): 3540–5.
1810:
1764:
1745:(2): 114–122.
1729:
1720:
1706:
1679:(2): 157–171.
1663:
1636:
1620:
1571:
1562:
1553:
1544:
1535:
1508:
1493:
1458:
1451:
1420:
1390:
1374:
1350:
1348:
1345:
1335:
1332:
1326:
1323:
1312:
1309:
1284:
1281:
1260:
1257:
1256:
1255:
1249:
1246:
1245:
1244:
1239:
1238:
1219:
1218:
1213:
1212:
1190:
1184:
1183:
1182:
1167:Sayre equation
1161:
1160:
1137:Direct methods
1132:
1131:Direct methods
1129:
1128:
1127:
1119:
1118:
1107:crystal system
1085:
1082:
1061:
1058:
1056:
1053:
1023:
1019:
1015:
1007:
1004:
969:
965:
944:
924:
902:
895:
890:
886:
883:
880:
874:
868:
863:
840:
837:
833:
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827:
824:
819:
815:
806:
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795:
791:
787:
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773:
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738:
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691:
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685:
682:
679:
676:
673:
670:
667:
664:
661:
655:
650:
640:
630:
609:
605:
601:
597:
592:
589:
584:
581:
576:
573:
570:
567:
564:
561:
558:
555:
552:
549:
546:
543:
537:
532:
528:
523:
520:
517:
514:
511:
508:
505:
502:
499:
496:
493:
487:
482:
472:
443:
438:
430:
425:
420:
416:
411:
408:
405:
402:
399:
396:
393:
390:
387:
384:
381:
375:
370:
366:
365:
356:
340:
335:
308:
305:
302:
299:
296:
293:
290:
287:
284:
281:
278:
272:
267:
245:
228:
225:
215:
196:
191:
187:
181:
177:
173:
170:
167:
158:
153:
144:
141:
140:
139:
132:
125:
115:
100:
97:
95:calculations.
93:direct methods
64:
61:
59:
56:
48:direct methods
38:patterns in a
15:
13:
10:
9:
6:
4:
3:
2:
3906:
3895:
3892:
3890:
3887:
3886:
3884:
3869:
3868:
3859:
3857:
3856:
3847:
3846:
3843:
3833:
3830:
3828:
3825:
3821:
3818:
3816:
3813:
3811:
3808:
3807:
3806:
3803:
3802:
3800:
3796:
3790:
3787:
3785:
3782:
3780:
3777:
3775:
3772:
3771:
3769:
3767:
3763:
3757:
3754:
3752:
3749:
3747:
3744:
3743:
3741:
3739:
3735:
3729:
3726:
3724:
3721:
3719:
3716:
3714:
3711:
3709:
3706:
3704:
3701:
3699:
3696:
3695:
3693:
3691:
3687:
3681:
3678:
3676:
3673:
3671:
3668:
3666:
3663:
3661:
3658:
3656:
3653:
3651:
3648:
3647:
3645:
3643:
3639:
3633:
3630:
3628:
3625:
3623:
3620:
3618:
3615:
3613:
3610:
3608:
3605:
3603:
3600:
3598:
3595:
3594:
3592:
3590:
3586:
3580:
3577:
3573:
3570:
3569:
3568:
3565:
3563:
3562:Patterson map
3560:
3558:
3555:
3553:
3550:
3548:
3545:
3543:
3540:
3539:
3537:
3533:
3525:
3522:
3520:
3517:
3516:
3515:
3512:
3510:
3507:
3503:
3500:
3498:
3495:
3494:
3493:
3490:
3486:
3483:
3481:
3478:
3477:
3476:
3473:
3472:
3470:
3468:
3464:
3458:
3448:
3445:
3443:
3440:
3438:
3435:
3433:
3432:Friedel's law
3430:
3428:
3425:
3423:
3420:
3418:
3415:
3414:
3405:
3402:
3400:
3397:
3393:
3390:
3388:
3385:
3384:
3383:
3380:
3376:
3375:Wigner effect
3373:
3371:
3368:
3366:
3363:
3362:
3361:
3360:Interstitials
3358:
3354:
3351:
3350:
3349:
3346:
3342:
3339:
3337:
3334:
3332:
3329:
3327:
3324:
3322:
3319:
3317:
3314:
3312:
3309:
3307:
3304:
3302:
3299:
3298:
3297:
3294:
3292:
3289:
3287:
3284:
3283:
3274:
3271:
3269:
3266:
3264:
3261:
3259:
3256:
3255:
3253:
3251:
3247:
3244:
3242:
3238:
3232:
3229:
3227:
3224:
3222:
3219:
3217:
3214:
3212:
3209:
3207:
3206:Precipitation
3204:
3202:
3199:
3195:
3192:
3190:
3187:
3185:
3182:
3180:
3177:
3176:
3175:
3174:Phase diagram
3172:
3171:
3169:
3167:
3161:
3153:
3150:
3149:
3148:
3145:
3141:
3138:
3137:
3136:
3133:
3129:
3126:
3124:
3121:
3120:
3119:
3116:
3115:
3106:
3103:
3101:
3098:
3096:
3093:
3091:
3088:
3086:
3083:
3081:
3078:
3077:
3075:
3073:
3069:
3063:
3060:
3058:
3055:
3051:
3048:
3046:
3043:
3041:
3038:
3036:
3033:
3031:
3028:
3027:
3026:
3023:
3022:
3020:
3018:
3014:
3008:
3005:
3003:
3000:
2996:
2993:
2992:
2991:
2988:
2987:
2985:
2981:
2977:
2970:
2965:
2963:
2958:
2956:
2951:
2950:
2947:
2935:
2934:
2925:
2923:
2922:
2913:
2912:
2909:
2899:
2896:
2894:
2891:
2889:
2886:
2884:
2881:
2879:
2876:
2874:
2871:
2869:
2866:
2864:
2861:
2860:
2858:
2854:
2848:
2845:
2843:
2840:
2838:
2835:
2833:
2830:
2828:
2825:
2823:
2820:
2818:
2815:
2813:
2812:Carl Zeiss AG
2810:
2809:
2807:
2805:Manufacturers
2803:
2797:
2794:
2792:
2789:
2787:
2784:
2782:
2779:
2777:
2774:
2772:
2769:
2767:
2764:
2762:
2759:
2757:
2756:James Hillier
2754:
2752:
2749:
2747:
2744:
2742:
2739:
2737:
2734:
2732:
2729:
2727:
2724:
2722:
2719:
2718:
2716:
2712:
2709:
2705:
2699:
2696:
2694:
2691:
2689:
2686:
2684:
2681:
2679:
2676:
2674:
2671:
2669:
2666:
2664:
2661:
2659:
2656:
2654:
2651:
2649:
2646:
2644:
2641:
2639:
2636:
2634:
2631:
2627:
2624:
2623:
2622:
2619:
2617:
2614:
2612:
2609:
2607:
2604:
2602:
2599:
2597:
2594:
2592:
2589:
2587:
2584:
2582:
2579:
2578:
2576:
2572:
2562:
2559:
2555:
2552:
2551:
2550:
2547:
2545:
2542:
2540:
2537:
2533:
2530:
2529:
2528:
2525:
2524:
2522:
2520:
2516:
2510:
2509:Ultrafast SEM
2507:
2505:
2502:
2500:
2497:
2495:
2492:
2490:
2487:
2486:
2484:
2482:
2478:
2472:
2469:
2467:
2466:Low-energy EM
2464:
2462:
2459:
2457:
2454:
2452:
2449:
2447:
2444:
2443:
2441:
2439:
2435:
2432:
2428:
2422:
2419:
2417:
2416:Magnetic lens
2414:
2412:
2409:
2407:
2404:
2402:
2399:
2397:
2394:
2392:
2389:
2388:
2386:
2382:
2376:
2373:
2371:
2368:
2366:
2365:Kikuchi lines
2363:
2361:
2358:
2356:
2353:
2351:
2348:
2346:
2343:
2342:
2340:
2335:
2331:
2325:
2322:
2320:
2317:
2315:
2312:
2310:
2307:
2305:
2302:
2301:
2299:
2295:
2291:
2284:
2279:
2277:
2272:
2270:
2265:
2264:
2261:
2253:
2251:9780123943965
2247:
2243:
2239:
2235:
2230:
2228:
2225:
2223:
2220:
2219:
2215:
2207:
2203:
2199:
2195:
2188:
2185:
2180:
2176:
2171:
2166:
2162:
2158:
2154:
2150:
2146:
2139:
2136:
2131:
2127:
2123:
2119:
2115:
2111:
2104:
2097:
2094:
2089:
2085:
2081:
2077:
2073:
2066:
2063:
2058:
2054:
2050:
2046:
2042:
2038:
2030:
2027:
2022:
2018:
2014:
2010:
2006:
2002:
1995:
1992:
1987:
1983:
1979:
1975:
1971:
1967:
1960:
1957:
1952:
1948:
1944:
1940:
1936:
1932:
1928:
1924:
1917:
1915:
1911:
1906:
1902:
1898:
1894:
1890:
1886:
1878:
1875:
1870:
1866:
1862:
1858:
1854:
1850:
1842:
1839:
1834:
1830:
1826:
1822:
1814:
1811:
1806:
1802:
1798:
1794:
1790:
1786:
1779:
1777:
1768:
1765:
1760:
1756:
1752:
1748:
1744:
1740:
1733:
1730:
1724:
1721:
1718:
1713:
1711:
1707:
1702:
1698:
1694:
1690:
1686:
1682:
1678:
1674:
1667:
1664:
1659:
1655:
1651:
1647:
1640:
1637:
1634:
1629:
1627:
1625:
1621:
1616:
1612:
1607:
1602:
1598:
1594:
1590:
1586:
1582:
1575:
1572:
1566:
1563:
1557:
1554:
1548:
1545:
1539:
1536:
1531:
1527:
1523:
1519:
1512:
1509:
1504:
1497:
1494:
1489:
1485:
1481:
1477:
1473:
1469:
1462:
1459:
1454:
1448:
1444:
1440:
1436:
1429:
1427:
1425:
1421:
1416:
1412:
1409:(3): 271–82.
1408:
1404:
1397:
1395:
1391:
1387:
1383:
1378:
1375:
1372:
1366:
1364:
1362:
1360:
1358:
1356:
1352:
1346:
1344:
1342:
1333:
1331:
1324:
1322:
1319:
1310:
1308:
1306:
1302:
1298:
1294:
1290:
1282:
1280:
1276:
1274:
1265:
1258:
1252:
1251:
1247:
1241:
1240:
1236:
1232:
1229:
1228:
1223:
1215:
1214:
1210:
1206:
1202:
1198:
1193:
1192:
1188:
1185:
1180:
1176:
1172:
1168:
1163:
1162:
1158:
1157:phase problem
1154:
1150:
1146:
1142:
1138:
1135:
1134:
1130:
1125:
1121:
1120:
1116:
1112:
1108:
1104:
1100:
1096:
1092:
1088:
1087:
1083:
1081:
1079:
1075:
1071:
1067:
1059:
1054:
1052:
1048:
1046:
1041:
1036:
1034:
1030:
1013:
1005:
1003:
1001:
996:
991:
987:
985:
967:
963:
942:
922:
900:
888:
884:
881:
878:
872:
861:
838:
835:
828:
825:
817:
813:
799:
793:
789:
785:
775:
771:
767:
763:
758:
755:
750:
747:
742:
739:
736:
733:
730:
727:
724:
721:
718:
715:
712:
709:
698:
694:
689:
686:
683:
680:
677:
674:
671:
668:
665:
662:
659:
648:
639:
637:
607:
603:
599:
595:
590:
587:
582:
579:
574:
571:
568:
565:
562:
559:
556:
553:
550:
547:
544:
541:
530:
526:
521:
518:
515:
512:
509:
506:
503:
500:
497:
494:
491:
480:
471:
469:
465:
441:
423:
414:
409:
406:
403:
400:
397:
394:
391:
388:
385:
382:
379:
368:
355:
333:
324:
306:
303:
300:
297:
294:
291:
288:
285:
282:
279:
276:
265:
257:reflections,
232:
226:
224:
220:
213:
210:(>30
194:
189:
185:
179:
175:
171:
168:
165:
157:
149:
142:
136:
133:
129:
126:
123:
119:
116:
113:
112:Kikuchi lines
109:
106:
105:
104:
98:
96:
94:
90:
86:
82:
78:
72:
70:
62:
57:
55:
53:
49:
45:
41:
37:
33:
29:
21:
3865:
3853:
3798:Associations
3766:Organisation
3258:Disclination
3189:Polymorphism
3152:Quasicrystal
3095:Orthorhombic
3035:Miller index
2983:Key concepts
2931:
2919:
2873:EM Data Bank
2837:Nion Company
2731:Dennis Gabor
2721:Albert Crewe
2682:
2499:Confocal SEM
2396:Electron gun
2345:Auger effect
2233:
2197:
2193:
2187:
2152:
2148:
2138:
2113:
2109:
2096:
2079:
2075:
2065:
2040:
2036:
2029:
2004:
2000:
1994:
1969:
1965:
1959:
1926:
1922:
1888:
1884:
1877:
1852:
1848:
1841:
1824:
1820:
1813:
1788:
1784:
1775:
1767:
1742:
1738:
1732:
1723:
1676:
1672:
1666:
1649:
1645:
1639:
1588:
1584:
1574:
1565:
1556:
1547:
1538:
1521:
1517:
1511:
1502:
1496:
1471:
1467:
1461:
1434:
1406:
1402:
1386:Laurie Marks
1377:
1337:
1328:
1314:
1286:
1277:
1270:
1208:
1186:
1178:
1144:
1073:
1063:
1055:Applications
1049:
1037:
1009:
999:
992:
988:
852:
628:
461:
233:
230:
221:
208:
150:
146:
134:
127:
122:Ewald sphere
117:
107:
102:
73:
66:
31:
27:
26:
3889:Diffraction
3751:Ewald Prize
3519:Diffraction
3497:Diffraction
3480:Diffraction
3422:Bragg plane
3417:Bragg's law
3296:Dislocation
3211:Segregation
3123:Crystallite
3040:Point group
2817:FEI Company
2751:Harald Rose
2741:Ernst Ruska
2430:Microscopes
2338:with matter
2336:interaction
2200:: 135–137.
2082:(4): 1017.
1591:(2–3): 94.
1524:(1): 1–11.
1341:channelling
1115:space group
1045:QED plug-in
81:Laue circle
77:kinematical
3883:Categories
3535:Algorithms
3524:Scattering
3502:Scattering
3485:Scattering
3353:Slip bands
3316:Cross slip
3166:transition
3100:Tetragonal
3090:Monoclinic
3002:Metallurgy
2898:Multislice
2714:Developers
2574:Techniques
2319:Microscope
2314:Micrograph
1791:(3): 306.
1652:(2): 219.
1347:References
1325:Tomography
1303:(EDS) and
1235:unit cells
1205:multislice
995:multislice
99:Advantages
3642:Databases
3105:Triclinic
3085:Hexagonal
3025:Unit cell
3017:Structure
2766:Max Knoll
2421:Stigmator
2222:NanoMEGAS
2155:: 19–22.
1209:ab initio
1201:zone axes
1187:Ab Initio
1074:ab initio
1040:NanoMEGAS
1038:In 2004,
882:π
790:∫
786:⋅
759:−
748:⋅
695:∝
591:−
580:⋅
527:∝
195:α
186:ϕ
169:∝
85:zone axis
3855:Category
3690:Journals
3622:OctaDist
3617:JANA2020
3589:Software
3475:Electron
3392:F-center
3179:Eutectic
3140:Fiveling
3135:Twinning
3128:Equiaxed
2921:Category
2868:CrysTBox
2856:Software
2527:Cryo-TEM
2334:Electron
2179:23376402
2130:22436916
2057:22976879
2021:17234347
1986:17240069
1951:18285623
1905:17254714
1869:20409638
1759:16125847
1701:23575344
1693:17845710
1615:55751260
1488:27057286
1307:(EELS).
1231:Zeolites
1179:a priori
1145:a priori
1000:a priori
63:Geometry
58:Overview
3867:Commons
3815:Germany
3492:Neutron
3382:Vacancy
3241:Defects
3226:GP-zone
3072:Systems
2933:Commons
2581:4D STEM
2554:4D STEM
2532:Cryo-ET
2504:SEM-XRF
2494:CryoSEM
2451:Cryo-EM
2309:History
2170:3608828
1931:Bibcode
1793:Bibcode
1593:Bibcode
1474:(S02).
1311:Imaging
1293:imaging
1111:lattice
1029:Gjønnes
1012:Midgley
982:is the
75:of the
3810:France
3805:Europe
3738:Awards
3268:Growth
3118:Growth
2878:EMsoft
2863:CASINO
2842:TESCAN
2707:Others
2606:cryoEM
2297:Basics
2248:
2177:
2167:
2128:
2055:
2019:
1984:
1949:
1903:
1867:
1757:
1699:
1691:
1613:
1486:
1449:
1318:images
1113:, and
1097:, and
853:where
3832:Japan
3779:IOBCr
3632:SHELX
3627:Olex2
3514:X-ray
3164:Phase
3080:Cubic
2832:Leica
2678:PINEM
2544:HRTEM
2539:EFTEM
2106:(PDF)
1781:(PDF)
1697:S2CID
1611:S2CID
1484:S2CID
1382:Notes
1153:phase
1033:Marks
3774:IUCr
3675:ICDD
3670:ICSD
3655:CCDC
3602:Coot
3597:CCP4
3348:Slip
3311:Kink
2893:IUCr
2827:JEOL
2698:WBDF
2693:WDXS
2643:EBIC
2638:EELS
2633:ECCI
2621:EBSD
2601:CBED
2549:STEM
2246:ISBN
2175:PMID
2126:PMID
2053:PMID
2017:PMID
1982:PMID
1947:PMID
1901:PMID
1865:PMID
1755:PMID
1689:PMID
1447:ISBN
212:mrad
3789:DMG
3784:RAS
3680:PDB
3665:COD
3660:CIF
3612:DSR
3336:GND
3263:CSL
2663:FEM
2658:FIB
2626:TKD
2616:EDS
2519:TEM
2481:SEM
2456:EMP
2238:doi
2202:doi
2198:116
2165:PMC
2157:doi
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