Knowledge (XXG)

Microprobe

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cannot be scanned and therefore masks are needed to selectively expose your sample to radiation. It is the radiation that causes changes in the sample, which in turn allows scientists and engineers to develop tiny devices such as microprocessors, accelerometers (like in most car safety systems), etc.
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processes is that a microprobe beam can be scanned or directed over any area of the sample. This scanning of the microprobe beam can be imagined to be like using a very fine tipped pencil to draw your design on a paper or in a drawing program. Traditional lithography processes use photons which
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techniques as microscopies with spot sizes in the micro-/nanometre range. These instruments are applied to solve scientific problems in a diverse range of fields, from microelectronics to biomedicine. In addition to the development of new ways to exploit these probes as analytical tools (this
103:(in the case where the primary beam consists of charged electrons) or measurement of an emitted secondary beam of material sputtered from the target (in the case where the primary beam consists of charged ions). 145:. Some of the most advanced nuclear microprobes have beam energies in excess of 2 MeV. This gives the device very high sensitivity to minute concentrations of elements, around 1  253:
Denoyer, Eric.; Van Grieken, Rene.; Adams, Fred.; Natusch, David F. S. (1982). "Laser microprobe mass spectrometry. 1. Basic principles and performance characteristics".
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analytical techniques, when the instrument is set up to analyse micro samples or micro areas of larger specimens. Such techniques include micro
416: 385: 354: 68: 114:). An FIB makes a small portion of the material into a plasma; the analysis is done by the same basic techniques as the ones used in 373:
Applications of Nuclear Microprobe in the Life Sciences: An Efficient Analytical Technique for the Research in Biology and Medicine
443: 173: 177: 134:), strong progress has been made in the area of materials modification recently (most of which can be described as PBW, 125:(mega-electronvolt) they are called nuclear microprobes. Nuclear microprobes are extremely powerful tools that utilize 346: 202:
Hillenkamp, F.; Unsöld, E.; Kaufmann, R.; Nitsche, R. (1975). "A high-sensitivity laser microprobe mass analyzer".
153:. This elemental sensitivity exists because when the beam interacts with the a sample it gives off characteristic 162: 453: 288:
Van Vaeck, L (1997). "Laser Microprobe Mass Spectrometry: Principle and Applications in Biology and Medicine".
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Scientists use this beam of charged particles to determine the elemental composition of solid materials (
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to locate the area to be analysed, direct the probe beam and collect the analytical signal.
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that uses ionization by a pulsed laser and subsequent mass analysis of the generated ions.
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composition of the target can be found from the elemental data extracted through emitted
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Another use for microprobes is the production of micro and nano sized devices, as in
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of each element present in the sample. This type of detection of radiation is called
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is an instrument that applies a stable and well-focused beam of charged particles (
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When the primary beam consists of accelerated electrons, the probe is termed an
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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
266: 161:. Other analysis techniques are applied to nuclear microscopy including 223: 84: 45: 154: 100: 92: 88: 141:
The nuclear microprobe's beam is usually composed of protons and
166: 158: 57: 40:, when the primary beam consists of accelerated ions, the term 122: 110:(kilo-electronvolt) these microprobes are usually called FIB ( 107: 25: 121:
When the ion energy is higher, hundreds of keV to a few
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Microprobe Characterization of Optoelectronic Materials
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application area of the nuclear microprobes is called
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When the ion energy is in the range of a few tens of
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is used. The term microprobe may also be applied to
60:. All of these techniques involve modified optical 180:. The advantage that microprobes have over other 8: 370:Yvan Llabador; Philippe Moretto (1998). 194: 7: 149:at beam sizes smaller than 1  14: 401:Juan Jimenez (15 November 2002). 339:S. J. B. Reed (25 August 2005). 174:microelectromechanical systems 1: 178:nanoelectromechanical systems 470: 347:Cambridge University Press 290:Cell Biology International 163:Rutherford backscattering 302:10.1006/cbir.1997.0198 444:Measuring instruments 54:infrared spectroscopy 255:Analytical Chemistry 267:10.1021/ac00238a001 216:1975ApPhy...8..341H 136:proton beam writing 38:electron microprobe 224:10.1007/BF00898368 132:nuclear microscopy 50:Raman spectroscopy 418:978-1-56032-941-1 387:978-981-02-2362-5 356:978-1-139-44638-9 127:ion beam analysis 116:mass spectrometry 73:mass spectrometer 461: 423: 422: 398: 392: 391: 378:World Scientific 367: 361: 360: 336: 330: 329: 285: 279: 278: 250: 244: 243: 199: 112:Focused ion beam 69:laser microprobe 469: 468: 464: 463: 462: 460: 459: 458: 454:Microtechnology 429: 428: 427: 426: 419: 400: 399: 395: 388: 369: 368: 364: 357: 338: 337: 333: 296:(10): 635–648. 287: 286: 282: 252: 251: 247: 204:Applied Physics 201: 200: 196: 191: 143:alpha particles 81: 34: 28:) to a sample. 12: 11: 5: 467: 465: 457: 456: 451: 446: 441: 431: 430: 425: 424: 417: 393: 386: 362: 355: 331: 280: 245: 210:(4): 341–348. 193: 192: 190: 187: 80: 77: 42:ion microprobe 33: 30: 13: 10: 9: 6: 4: 3: 2: 466: 455: 452: 450: 447: 445: 442: 440: 437: 436: 434: 420: 414: 410: 406: 405: 397: 394: 389: 383: 379: 375: 374: 366: 363: 358: 352: 348: 344: 343: 335: 332: 327: 323: 319: 315: 311: 307: 303: 299: 295: 291: 284: 281: 276: 272: 268: 264: 260: 256: 249: 246: 241: 237: 233: 229: 225: 221: 217: 213: 209: 205: 198: 195: 188: 186: 183: 179: 175: 170: 168: 164: 160: 156: 152: 148: 144: 139: 137: 133: 128: 124: 119: 117: 113: 109: 104: 102: 98: 94: 90: 86: 78: 76: 74: 70: 65: 63: 59: 55: 51: 47: 43: 39: 31: 29: 27: 23: 19: 449:Spectroscopy 403: 396: 372: 365: 341: 334: 293: 289: 283: 261:(1): 26–41. 258: 254: 248: 207: 203: 197: 171: 140: 120: 105: 82: 66: 35: 17: 15: 439:Microscopes 182:lithography 62:microscopes 433:Categories 189:References 151:micrometer 56:and micro 18:microprobe 409:CRC Press 310:1065-6995 275:0003-2700 240:135753888 232:0340-3793 22:electrons 97:chemical 85:minerals 52:, micro 326:7601994 318:9693833 212:Bibcode 169:, etc. 165:(RBS), 95:). The 89:glasses 46:optical 415:  384:  353:  324:  316:  308:  273:  238:  230:  155:X-rays 101:X-rays 93:metals 322:S2CID 236:S2CID 71:is a 32:Types 413:ISBN 382:ISBN 351:ISBN 314:PMID 306:ISSN 271:ISSN 228:ISSN 176:and 167:STIM 159:PIXE 79:Uses 58:LIBS 26:ions 298:doi 263:doi 220:doi 147:ppm 138:). 123:MeV 108:keV 24:or 435:: 411:. 407:. 380:. 376:. 349:. 345:. 320:. 312:. 304:. 294:21 292:. 269:. 259:54 257:. 234:. 226:. 218:. 206:. 118:. 91:, 87:, 67:A 16:A 421:. 390:. 359:. 328:. 300:: 277:. 265:: 242:. 222:: 214:: 208:8

Index

electrons
ions
electron microprobe
ion microprobe
optical
Raman spectroscopy
infrared spectroscopy
LIBS
microscopes
laser microprobe
mass spectrometer
minerals
glasses
metals
chemical
X-rays
keV
Focused ion beam
mass spectrometry
MeV
ion beam analysis
nuclear microscopy
proton beam writing
alpha particles
ppm
micrometer
X-rays
PIXE
Rutherford backscattering
STIM

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