Knowledge (XXG)

Electron spectrometer

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velocity, whereas electrostatic fields will cause electrons to move along the field gradient, which may change electron energies if the component of the direction of propagation and field gradients are not perpendicular. Owing to these effects, sector based designs are commonly used in electron spectrometers.
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An electrostatic electron spectrometer uses the electric field, which cause electrons to move along field gradients, whereas magnetic devices cause electrons to move at right angles to the field. Magnetic fields will act in a direction perpendicular to the electron propagation, thereby conserving
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in which the beam of electrons is bent with electric or magnetic fields. Higher energy electrons will be bent less by the beam, this produces a spatially distributed range of energies.
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in the solution of motion in a magnetic or electric system with rotational symmetry leads to radial focusing onto a mean radius. By superposition of a
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and related techniques. There, a position sensitive detector detects the energy along one direction and depending on the additional
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spectra from single crystals exhibit a dependency on the emission angle, and the entrance slit is needed at the entrance of the
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vanishes. By breaking the rotational symmetry a bit and varying the electrostatic potential along the mean path of the
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All the electrons from an isotopic source may be sucked off and focused into a directed beam (much like in an
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Device used to perform different forms of electron spectroscopy and electron microscopy
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Electron spectrometers are used on a range of scientific equipment, including
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axial focusing is possible while weakening the radial focusing, until the
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Roy, D.; Tremblay, D. (1990). "Design of electron spectrometers".
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Zworykin,V; Morton, G; Ramberg, E; Hillier J; Vance A (1945).
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Electron spectrometers may determine electron energy based on
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lateral resolution or one angle along the other direction.
367: 46: 251:Energy filtered transmission electron microscopy 118:is a device used to perform different forms of 387: 231:, for electronic band structure determination 8: 329: 327: 51:introducing citations to additional sources 336:Electron optics and the electron microscope 394: 380: 229:Angle-resolved photoemission spectroscopy 215:Electrostatic spectrometers preserve the 206:angle-resolved photoemission spectroscopy 41:Relevant discussion may be found on the 272: 237:, field of analyzing material surfaces 128:hemispherical electron energy analyzer 157:, retarding potential (effectively a 7: 348: 346: 219:, which can be resolved afterwards. 366:. You can help Knowledge (XXG) by 14: 241:Electron energy loss spectroscopy 139:transmission electron microscopes 350: 338:. John Wiley and Sons, New York. 261:Time-of-flight mass spectrometry 34:relies largely or entirely on a 23: 202:hemispherical electron analyzer 282:Reports on Progress in Physics 1: 302:10.1088/0034-4885/53/12/003 235:Auger electron spectroscopy 449: 345: 143:astronomical satellites 62:"Electron spectrometer" 362:-related article is a 428:Microscope components 423:Electron spectroscopy 135:particle accelerators 120:electron spectroscopy 116:electron spectrometer 187:spherical aberration 47:improve this article 294:1990RPPh...53.1621R 175:effective potential 124:electron microscopy 433:Spectroscopy stubs 375: 374: 288:(12): 1621–1674. 256:Mass spectrometry 112: 111: 97: 440: 396: 389: 382: 354: 347: 340: 339: 331: 322: 321: 277: 179:quadrupole field 159:high-pass filter 107: 104: 98: 96: 55: 27: 19: 448: 447: 443: 442: 441: 439: 438: 437: 403: 402: 401: 400: 344: 343: 333: 332: 325: 279: 278: 274: 269: 225: 171: 151: 108: 102: 99: 56: 54: 40: 28: 17: 12: 11: 5: 446: 444: 436: 435: 430: 425: 420: 415: 405: 404: 399: 398: 391: 384: 376: 373: 372: 355: 342: 341: 323: 271: 270: 268: 265: 264: 263: 258: 253: 248: 243: 238: 232: 224: 221: 189:is minimized. 170: 167: 155:time of flight 150: 147: 110: 109: 45:. Please help 31: 29: 22: 15: 13: 10: 9: 6: 4: 3: 2: 445: 434: 431: 429: 426: 424: 421: 419: 418:Spectrometers 416: 414: 413:Electron beam 411: 410: 408: 397: 392: 390: 385: 383: 378: 377: 371: 369: 365: 361: 356: 353: 349: 337: 330: 328: 324: 319: 315: 311: 307: 303: 299: 295: 291: 287: 283: 276: 273: 266: 262: 259: 257: 254: 252: 249: 247: 244: 242: 239: 236: 233: 230: 227: 226: 222: 220: 218: 213: 211: 207: 203: 199: 198:Photoelectron 195: 190: 188: 184: 180: 176: 168: 166: 162: 160: 156: 148: 146: 144: 140: 136: 131: 129: 125: 121: 117: 106: 103:February 2015 95: 92: 88: 85: 81: 78: 74: 71: 67: 64: –  63: 59: 58:Find sources: 52: 48: 44: 38: 37: 36:single source 32:This article 30: 26: 21: 20: 368:expanding it 360:spectroscopy 357: 335: 285: 281: 275: 214: 194:electron gun 191: 172: 169:Construction 163: 152: 132: 115: 113: 100: 90: 83: 76: 69: 57: 33: 183:astigmatism 407:Categories 267:References 73:newspapers 318:250872079 310:0034-4885 43:talk page 223:See also 290:Bibcode 87:scholar 316:  308:  210:optics 141:, and 89:  82:  75:  68:  60:  358:This 314:S2CID 149:Types 94:JSTOR 80:books 364:stub 306:ISSN 246:PEEM 217:spin 173:The 122:and 66:news 298:doi 204:in 114:An 49:by 409:: 326:^ 312:. 304:. 296:. 286:53 284:. 145:. 137:, 395:e 388:t 381:v 370:. 320:. 300:: 292:: 105:) 101:( 91:· 84:· 77:· 70:· 53:. 39:.

Index


single source
talk page
improve this article
introducing citations to additional sources
"Electron spectrometer"
news
newspapers
books
scholar
JSTOR
electron spectroscopy
electron microscopy
hemispherical electron energy analyzer
particle accelerators
transmission electron microscopes
astronomical satellites
time of flight
high-pass filter
effective potential
quadrupole field
astigmatism
spherical aberration
electron gun
Photoelectron
hemispherical electron analyzer
angle-resolved photoemission spectroscopy
optics
spin
Angle-resolved photoemission spectroscopy

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