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Embedded wafer level ball grid array

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chips are placed on a carrier. The distance between the chips can be chosen freely, but it is typically larger than on the silicon wafer. The gaps and the edges around the chips are now filled with a casting compound to form a wafer. After curing an artificial wafer containing a mold frame around the
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With this technology any number of additional interconnects can be realized on the package in an arbitrary distance (fan-out design). Therefore, this wafer level packaging technology can also be used for space sensitive applications, where the chip area wouldn’t be sufficient to place the required
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The eWLB technology allows the realization of chips with a high number of interconnects. The package is not created on a silicon wafer as for the classical wafer level package, but on an artificial wafer. Therefore a front-end-processed wafer is diced and the
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https://web.archive.org/web/20080517033548/http://www.ciol.com/Semicon/Tech-Watch/News-Reports/Infineon,-ASE-intro-eWLB-package-technology/131107101404/0/
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All process steps for the generation of the package are performed on the wafer. This allows, in comparison to classical packaging technologies (e. g.
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https://web.archive.org/web/20120305094749/http://www.infineonventures.com/cms/en/corporate/press/news/releases/2007/INFCOM200711-013.html
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http://www.statschippac.com/services/packagingservices/waferlevelproducts/~/media/Files/Package%20Datasheets/eWLB.ashx
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dies for carrying additional interconnect elements is created. After the build of the artificial wafer (the so-called
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It is relatively common to find packages that contain other components than their designated ones, such as diodes or
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https://web.archive.org/web/20090728202431/http://annualreport2008.infineon.com/de/template.asp?content=innovationen
855: 816: 801: 786: 318:). The main driving force behind the eWLB technology was to allow fanout and more space for interconnect routing. 123: 76: 251: 982: 646: 537:
https://web.archive.org/web/20110703111509/http://141.30.122.65/Keynotes/6-Plieninger-ESTC_Keynote_20060907.pdf
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that states a Knowledge (XXG) editor's personal feelings or presents an original argument about a topic.
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Mechanical stress between package and board is transmitted stronger than for other package technologies
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eWLB is a further development of the classical wafer level ball grid array technology (WLB or WLP:
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and STATS ChipPAC Ltd. First components were brought into market mid of 2009 (mobile phone).
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number of interconnects at a suitable distance. The eWLB technology was developed by
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Thermal and Electrical Characterization of eWLB (embedded Wafer Level BGA),
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http://content.yudu.com/Library/A1mxrk/3DPackagingFebruaryi/resources/4.htm
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Inspection and repair difficult since visual inspection is restricted
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Number of realizable interconnects on the package is not restricted
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https://safe.nrao.edu/pub/Main/EuropeanMicrowaveWeek08/WFR14-1.pdf
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High integration potential for multi-die- and stacked packages
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Electronic Components and Technology Conference (ECTC), 2010
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personal reflection, personal essay, or argumentative essay
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http://www.wsdmag.com/Articles/ArticleID/19576/19576.html
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http://www.amkor.com/go/packaging/all-packages/cspnl/
467:"Infineon, ST and STATS Develops eWLB | TopNews" 955: 903: 872: 835: 779: 763: 637: 593: 90:. Unsourced material may be challenged and removed. 371:Lamination of foil onto carrier (lamination tool) 571: 8: 532:https://ieeexplore.ieee.org/document/4147210 16:Packaging technology for integrated circuits 409:Excellent electrical and thermal properties 53:Learn how and when to remove these messages 973:List of integrated circuit packaging types 578: 564: 556: 288:Learn how and when to remove this message 270:Learn how and when to remove this message 208:Learn how and when to remove this message 150:Learn how and when to remove this message 331: 305: 233:This article includes a list of general 630:(SOD-123 / SOD-323 / SOD-523 / SOD-923) 458: 406:Minimal lateral package size and height 387:De-bonding of carrier (de-bonding tool) 99:"Embedded wafer level ball grid array" 7: 301:Embedded wafer level ball grid array 88:adding citations to reliable sources 521:Francoise von Trapp, Nov. 30, 2009 239:it lacks sufficient corresponding 14: 34:This article has multiple issues. 224: 166: 64: 23: 393:Ball drop reflow and wafer test 75:needs additional citations for 42:or discuss these issues on the 612:(DO-7 / DO-26 / DO-35 / DO-41) 1: 1002:in transistor packages, etc. 968:Integrated circuit packaging 403:Low cost (package and test) 374:Chip placement onto wafer ( 1036: 996: 418:Upcoming package standard 983:Surface-mount technology 390:Flip reconstructed wafer 988:Through-hole technology 546:Seung Wook Yoon et al. 254:more precise citations. 618:(MELF / SOD-80 / LL34) 587:Semiconductor packages 519:eWLB hits the big time 337: 311: 188:by rewriting it in an 978:Printed circuit board 335: 309: 963:Electronic packaging 84:improve this article 316:wafer level package 1000:voltage regulators 525:2012-03-04 at the 442:Chip-scale package 360:STMicroelectronics 338: 336:Cross-section eWLB 312: 190:encyclopedic style 177:is written like a 1007: 1006: 756:(Super-247) (SMT) 750:(Super-220) (SMT) 624:(SMA / SMB / SMC) 298: 297: 290: 280: 279: 272: 218: 217: 210: 160: 159: 152: 134: 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"Embedded wafer level ball grid array"
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introducing
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wafer level package
ball grid array
solder balls

singulated

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