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File:Optical flat interference fringes.jpg

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282: 294: 246: 87: 43: 150:. The surface in the left photo is nearly flat, indicated by a pattern of almost straight parallel interference fringes at equal intervals. The surface in the right photo is uneven, resulting in a pattern of curved fringes. Each pair of adjacent fringes represents a difference in surface elevation of half a 145:
testing the flatness of surfaces, showing the different patterns of interference fringes. The flats are resting with their bottom surfaces in contact with the surface to be tested (toolmaker's flats) and they are illuminated by a monochromatic light source. When there is a slight gap between the
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for US works, such as Canada, Mainland China (not Hong Kong or Macao), Germany, Mexico, and Switzerland. The creator and year of publication are essential information and must be provided. See
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of the light used, so differences in elevation can be measured by counting the fringes. The flatness of surfaces can be measured to millionths of an inch by this method.
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This image might not be in the public domain outside of the United States; this especially applies in the countries and areas that do not apply the
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two surfaces, the light waves reflected from both surfaces interfere, resulting in a pattern of bright and dark bands called an
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occurred prior to January 1, 1929, and if not then due to lack of notice or renewal. See
151: 397: 376: 258: 266:. This applies to U.S. works where the copyright has expired, often because its first 93: 402: 267: 183:, Vol. 26, April, 1920, The Industrial Press, New York, p. 706, fig. 21 & 22 263: 163: 333:
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Franklin D. Jones "How precision gage-blocks are made" in
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Public domain in USA - published prior to 1923 in USA
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File:Optical flat interference fringes.jpg
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320 × 134 pixels
846 × 354 pixels
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Wikimedia Commons
description page there
You can help
optical flats
interference pattern
wavelength
2011-03-04
Franklin D. Jones "How precision gage-blocks are made" in Machinery, Vol. 26, April, 1920, The Industrial Press, New York, p. 706, fig. 21 & 22
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16:19, 6 March 2011
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Interferometry

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