Knowledge (XXG)

Fluorescent microthermography

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of fluorescence decreases exponentially with temperature, differences in emitted light intensity can be therefore used to assess differences on surface temperature, with hot areas showing as darker.
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of temperature distribution in small scale; the achievable spatial resolution is half micrometer and temperature resolution of 0.005 
149: 93: 43: 173: 168: 50: 35:. Time-dependent measurements are possible, as the fluorescence lifetime is only about 200 microseconds. 142: 183: 188: 178: 135: 62: 47: 89: 119: 28: 111: 162: 58: 54: 24: 39: 32: 123: 85:Semiconductor Material and Device Characterization 143: 8: 150: 136: 82:Schroder, Dieter K. (10 February 2006). 74: 57:light at 340–380 nm, stimulating 118:This technology-related article is a 46:, is applied on the surface (e.g. an 7: 108: 106: 44:europium thenoyl-trifluoroacetonate 122:. You can help Knowledge (XXG) by 14: 110: 61:at mainly 612 nm line. The 1: 17:Fluorescent microthermography 205: 105: 98:– via Google Books. 88:. John Wiley & Sons. 53:) and illuminated by 63:quantum efficiency 48:integrated circuit 131: 130: 38:A thin film of a 196: 174:Infrared imaging 169:Technology stubs 152: 145: 138: 114: 107: 100: 99: 79: 29:infrared imaging 204: 203: 199: 198: 197: 195: 194: 193: 159: 158: 157: 156: 104: 103: 96: 81: 80: 76: 71: 12: 11: 5: 202: 200: 192: 191: 186: 181: 176: 171: 161: 160: 155: 154: 147: 140: 132: 129: 128: 115: 102: 101: 94: 73: 72: 70: 67: 27:technique for 13: 10: 9: 6: 4: 3: 2: 201: 190: 187: 185: 182: 180: 177: 175: 172: 170: 167: 166: 164: 153: 148: 146: 141: 139: 134: 133: 127: 125: 121: 116: 113: 109: 97: 95:9780471749080 91: 87: 86: 78: 75: 68: 66: 64: 60: 56: 52: 49: 45: 41: 36: 34: 30: 26: 22: 18: 184:Thermometers 124:expanding it 117: 84: 77: 59:fluorescence 37: 20: 16: 15: 189:Measurement 55:ultraviolet 179:Microscopy 163:Categories 69:References 25:microscopy 40:phosphor 23:) is a 92:  120:stub 90:ISBN 51:die 21:FMT 165:: 42:, 151:e 144:t 137:v 126:. 33:K 19:(

Index

microscopy
infrared imaging
K
phosphor
europium thenoyl-trifluoroacetonate
integrated circuit
die
ultraviolet
fluorescence
quantum efficiency
Semiconductor Material and Device Characterization
ISBN
9780471749080
Stub icon
stub
expanding it
v
t
e
Categories
Technology stubs
Infrared imaging
Microscopy
Thermometers
Measurement

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