Knowledge (XXG)

IEEE Electron Device Letters

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545: 470: 156: 465: 540: 126: 569: 494: 623: 524: 241: 216: 628: 599: 212: 192: 517: 358:. It was founded in 1980 by IEEE Electron Devices Society. The journal covers the advances in electron and ion integrated circuit devices. Its 256: 648: 638: 592: 363: 151: 573: 510: 498: 633: 618: 184: 180: 29: 653: 585: 233: 139: 643: 114: 422: 371: 34: 332: 87: 130: 229: 135: 118: 73: 555: 351: 250: 277: 271: 396: 322: 451: 327: 301: 287: 264: 559: 484: 204: 480: 359: 49: 428: 612: 376: 348: 99: 544: 469: 147: 477: 464: 432: 200: 308: 552: 221: 539: 165: 293: 355: 79: 563: 488: 572:. Further suggestions might be found on the article's 497:. Further suggestions might be found on the article's 570:
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314: 299: 285: 262: 248: 176: 164: 110: 96: 86: 72: 64: 59: 48: 40: 28: 155: 624:Electrical and electronic engineering journals 593: 518: 8: 19: 600: 586: 525: 511: 18: 397:"Overview: IEEE Electron Device Letters" 388: 629:Academic journals established in 1980 7: 536: 534: 461: 459: 562:. You can help Knowledge (XXG) by 487:. You can help Knowledge (XXG) by 364:University of California, Berkeley 14: 543: 538: 468: 463: 421:"IEEE Electron Device Letters". 154: 1: 424:2022 Journal Citation Reports 344:IEEE Electron Device Letters 22:IEEE Electron Device Letters 670: 533: 458: 171:IEEE Electron Device Lett. 649:Engineering journal stubs 639:English-language journals 375:, the journal has a 2022 354:published monthly by the 319: 372:Journal Citation Reports 35:Electronics engineering 634:Semiconductor journals 619:IEEE academic journals 476:This article about an 362:is Sayeef Salahuddin ( 111:Standard abbreviations 654:Physics journal stubs 551:This article about a 431:(Science ed.). 60:Publication details 25: 352:scientific journal 581: 580: 506: 505: 369:According to the 340: 339: 55:Sayeef Salahuddin 661: 644:Monthly journals 602: 595: 588: 547: 542: 535: 527: 520: 513: 472: 467: 460: 455: 454: 452:Official website 437: 436: 418: 412: 411: 409: 407: 393: 323:Journal homepage 305: 290: 274: 267: 253: 244: 160: 158: 157: 102: 26: 23: 16:Academic journal 669: 668: 664: 663: 662: 660: 659: 658: 609: 608: 607: 606: 532: 531: 450: 449: 446: 441: 440: 420: 419: 415: 405: 403: 395: 394: 390: 385: 360:editor-in-chief 300: 286: 281: 276: 270: 263: 249: 220: 179: 178: 134: 113: 112: 103: 98: 82: 21: 17: 12: 11: 5: 667: 665: 657: 656: 651: 646: 641: 636: 631: 626: 621: 611: 610: 605: 604: 597: 590: 582: 579: 578: 548: 530: 529: 522: 515: 507: 504: 503: 473: 457: 456: 445: 444:External links 442: 439: 438: 429:Web of Science 413: 387: 386: 384: 381: 338: 337: 336: 335: 333:Online archive 330: 325: 317: 316: 312: 311: 306: 297: 296: 291: 283: 282: 268: 260: 259: 254: 246: 245: 174: 173: 168: 162: 161: 108: 107: 104: 97: 94: 93: 90: 84: 83: 78: 76: 70: 69: 66: 62: 61: 57: 56: 53: 46: 45: 42: 38: 37: 32: 15: 13: 10: 9: 6: 4: 3: 2: 666: 655: 652: 650: 647: 645: 642: 640: 637: 635: 632: 630: 627: 625: 622: 620: 617: 616: 614: 603: 598: 596: 591: 589: 584: 583: 577: 575: 571: 567: 565: 561: 557: 554: 549: 546: 541: 537: 528: 523: 521: 516: 514: 509: 508: 502: 500: 496: 492: 490: 486: 482: 479: 474: 471: 466: 462: 453: 448: 447: 443: 434: 430: 426: 425: 417: 414: 402: 398: 392: 389: 382: 380: 378: 377:impact factor 374: 373: 367: 365: 361: 357: 353: 350: 349:peer-reviewed 346: 345: 334: 331: 329: 328:Online access 326: 324: 321: 320: 318: 313: 310: 307: 303: 298: 295: 292: 289: 284: 279: 275: (print) 273: 269: 266: 261: 258: 255: 252: 247: 243: 239: 235: 231: 227: 223: 218: 214: 210: 206: 202: 198: 194: 190: 186: 182: 175: 172: 169: 167: 163: 153: 149: 145: 141: 137: 132: 128: 124: 120: 116: 109: 105: 101: 100:Impact factor 95: 91: 89: 85: 81: 77: 75: 71: 67: 63: 58: 54: 51: 47: 43: 39: 36: 33: 31: 27: 24: 568: 564:expanding it 550: 493: 489:expanding it 475: 423: 416: 404:. Retrieved 400: 391: 370: 368: 343: 342: 341: 237: 225: 208: 196: 188: 170: 143: 122: 68:1980-present 20: 478:engineering 280: (web) 613:Categories 383:References 148:MathSciNet 106:4.9 (2022) 30:Discipline 574:talk page 499:talk page 433:Clarivate 304: no. 294:499741646 278:1558-0563 272:0741-3106 88:Frequency 74:Publisher 379:of 4.9. 309:81643614 177:Indexing 127:Bluebook 52: by 41:Language 556:journal 553:physics 481:journal 435:. 2023. 406:May 25, 236:)  207:)  195:)  142:)  121:)  92:Monthly 65:History 44:English 257:EDLEDZ 242:Scopus 238:· 226:· 224:  209:· 197:· 189:· 187:  144:· 123:· 50:Edited 558:is a 483:is a 347:is a 315:Links 251:CODEN 240: 228: 211: 201:JSTOR 199: 191: 181:CODEN 166:ISO 4 146: 125: 115:ISO 4 560:stub 485:stub 408:2024 401:IEEE 356:IEEE 302:OCLC 288:LCCN 265:ISSN 222:MIAR 213:LCCN 193:alt2 80:IEEE 366:). 234:alt 230:NLM 217:alt 205:alt 185:alt 152:alt 140:alt 136:NLM 131:alt 119:alt 615:: 427:. 399:. 601:e 594:t 587:v 576:. 566:. 526:e 519:t 512:v 501:. 491:. 410:. 232:( 219:) 215:( 203:( 183:( 159:) 150:( 138:( 133:) 129:( 117:(

Index

Discipline
Electronics engineering
Edited
Publisher
IEEE
Frequency
Impact factor
ISO 4
alt
Bluebook
alt
NLM
alt
MathSciNet
alt
ISO 4
CODEN
alt
alt2
JSTOR
alt
LCCN
alt
MIAR
NLM
alt
Scopus
CODEN
EDLEDZ
ISSN

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