Knowledge (XXG)

Parasitic extraction

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sub-nodes in a proportional way. Note that unlike Interconnect Capacitance, Interconnect Resistance needs to add sub-nodes between the circuit elements to place these parasitic resistors. This can greatly increase the size of the extracted output netlist and can cause additional simulation problems.
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run), and a cross sectional understanding of these layers. This information is used to create a set of layout wires that have added capacitors where the input polygons and cross sectional structure indicate. The output netlist contains the same set of input nets as the input design netlist and adds
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run), and a cross sectional understanding of these layers including the resistivity of the layers. This information is used to create a set of layout sub.wires that have added resistance between various sub-parts of the wires. The above Interconnect Capacitance is divided and shared amongst the
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The major purpose of parasitic extraction is to create an accurate analog model of the circuit, so that detailed simulations can emulate actual digital and analog circuit responses. Digital circuit responses are often used to populate databases for signal delay and loading calculation such as:
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Interconnect capacitance is calculated by giving the extraction tool the following information: the top view layout of the design in the form of input polygons on a set of layers; a mapping to a set of devices and pins (from a
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Interconnect resistance is calculated by giving the extraction tool the following information: the top view layout of the design in the form of input polygons on a set of layers; a mapping to a set of devices and pins (from a
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is a parasitic extractor tool for both digital and analog designs. It was based on QuickCap developed by Ralph Iverson of Random Logic Corporation, which was acquired by Magma and Synopsys.
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is a parasitic extractor tool for both digital and analog designs. It was based on PexRC developed by Wangqi Qiu and Weiping Shi of Pextra Corporation, which was acquired by Mentor.
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is a parasitic extractor tool for both digital and analog designs and parasitics extraction check have to be carried out to prepare the design for postlayout verification.
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analysis. Analog circuits are often run in detailed test benches to indicate if the extra extracted parasitics will still allow the designed circuit to function.
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Approximate solutions with pattern matching techniques are the only feasible approach to extract parasitics for complete modern integrated circuit designs.
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Q3D Extractor uses method of moments (integral equations) and FEMs to compute capacitive, conductance, inductance and resistance matrices. It uses the
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the impact of the wiring was negligible, and wires were not considered as electrical elements of the circuit. However below the 0.5-
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resistance and capacitance of the interconnects started making a significant impact on circuit performance. With shrinking
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provide physically accurate solutions. They calculate electromagnetic parameters by directly solving
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is the calculation of the parasitic effects in both the designed devices and the required wiring
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Source code and Windows binary versions with viewer and editor are freely available from
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technologies inductance effects of interconnects became important as well.
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The tools fall into the following broad categories.
94:Major effects of interconnect parasitics include: 120:parasitic capacitor devices between these nets. 48:, parasitic components, or simply parasitics. 8: 104:IR drop (resistive component of voltage) 315: 7: 357:MIT Computational Prototyping Group 335:MIT Computational Prototyping Group 110:Interconnect capacitance extraction 304:Standard Parasitic Exchange Format 138:Interconnect inductance extraction 124:Interconnect resistance extraction 14: 145: 430:Electronic circuit verification 390:Quantus QRC Extraction Solution 1: 219:FastCap and FastHenry, from 18:electronic design automation 446: 131:Layout Versus Schematic 117:Layout Versus Schematic 154:This section is empty. 34:parasitic capacitances 209:fast multipole method 42:parasitic inductances 38:parasitic resistances 290:Calibre xACT3D from 22:parasitic extraction 346:ANSYS Q3D Extractor 200:ANSYS Q3D Extractor 190:Maxwell's equations 78:integrated circuits 215:FastCap, FastHenry 62:circuit simulation 44:, commonly called 30:electronic circuit 278:QuickCap NX from 254:(previously from 177:Tools and vendors 174: 173: 46:parasitic devices 437: 414: 409: 403: 398: 392: 387: 381: 376: 370: 368:FastFieldSolvers 365: 359: 354: 348: 343: 337: 332: 326: 320: 240:FastFieldSolvers 238:FasterCap, from 228:FastFieldSolvers 169: 166: 156:You can help by 149: 142: 66:signal integrity 445: 444: 440: 439: 438: 436: 435: 434: 420: 419: 418: 417: 410: 406: 399: 395: 388: 384: 377: 373: 366: 362: 355: 351: 344: 340: 333: 329: 321: 317: 312: 300: 292:Mentor Graphics 288: 276: 264: 248: 236: 217: 202: 179: 170: 164: 161: 140: 126: 112: 85:technology node 74: 54:timing analysis 12: 11: 5: 443: 441: 433: 432: 422: 421: 416: 415: 412:Calibre xACT3D 404: 393: 382: 371: 360: 349: 338: 327: 314: 313: 311: 308: 307: 306: 299: 296: 287: 286:Calibre xACT3D 284: 275: 272: 263: 260: 247: 244: 235: 232: 216: 213: 201: 198: 197: 196: 193: 178: 175: 172: 171: 152: 150: 139: 136: 125: 122: 111: 108: 73: 70: 58:power analysis 13: 10: 9: 6: 4: 3: 2: 442: 431: 428: 427: 425: 413: 408: 405: 402: 397: 394: 391: 386: 383: 380: 375: 372: 369: 364: 361: 358: 353: 350: 347: 342: 339: 336: 331: 328: 325: 319: 316: 309: 305: 302: 301: 297: 295: 293: 285: 283: 281: 273: 271: 269: 266:Quantus from 261: 259: 257: 253: 245: 243: 241: 233: 231: 229: 224: 222: 214: 212: 210: 206: 199: 194: 191: 187: 186:Field solvers 184: 183: 182: 176: 168: 159: 155: 151: 148: 144: 143: 137: 135: 132: 123: 121: 118: 109: 107: 105: 101: 97: 92: 90: 86: 83: 79: 71: 69: 67: 63: 59: 55: 49: 47: 43: 39: 35: 31: 27: 26:interconnects 23: 19: 407: 396: 385: 374: 363: 352: 341: 330: 318: 289: 277: 265: 250:StarRC from 249: 237: 225: 218: 203: 180: 162: 158:adding to it 153: 127: 113: 100:signal noise 96:signal delay 93: 75: 50: 21: 15: 310:References 82:micrometre 72:Background 234:FasterCap 165:July 2010 76:In early 424:Category 401:QuickCap 298:See also 280:Synopsys 274:QuickCap 252:Synopsys 268:Cadence 262:Quantus 89:process 379:StarRC 324:p. 120 256:Avanti 246:StarRC 64:; and 28:of an 205:ANSYS 40:and 221:MIT 160:. 16:In 426:: 230:. 106:. 102:, 98:, 60:; 56:; 36:, 32:: 20:, 167:) 163:(

Index

electronic design automation
interconnects
electronic circuit
parasitic capacitances
parasitic resistances
parasitic inductances
parasitic devices
timing analysis
power analysis
circuit simulation
signal integrity
integrated circuits
micrometre
technology node
process
signal delay
signal noise
IR drop (resistive component of voltage)
Layout Versus Schematic
Layout Versus Schematic

adding to it
Field solvers
Maxwell's equations
ANSYS
fast multipole method
MIT
FastFieldSolvers
FastFieldSolvers
Synopsys

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