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65 nm process

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466:. The cost of these techniques adds substantially to the cost of manufacturing sub-wavelength semiconductor products, with the cost increasing exponentially with each advancing technology node. Furthermore, these costs are multiplied by an increasing number of mask layers that must be printed at the minimum pitch, and the reduction in yield from printing so many layers at the cutting edge of the technology. For new integrated-circuit designs, this factors into the costs of prototyping and production. 48: 497:(metal and poly pitch) continue to shrink, thus reducing chip area and chip cost, as well as shortening the distance between transistors, leading to higher-performance devices of greater complexity when compared with earlier nodes. Intel's 65nm process has a transistor density of 2.08 million transistors per square milimeter (MTr/mm2). 492:
papers from Intel in 2002, 2004, and 2005 illustrate the industry trend that the transistor sizes can no longer scale along with the rest of the feature dimensions (gate width only changed from 220 nm to 210 nm going from 90 nm to 65 nm technologies). However, the
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Gate thickness, another important dimension, is reduced to as little as 1.2 nm (Intel). Only a few atoms insulate the "switch" part of the transistor, causing charge to flow through it. This undesired
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There are actually two versions of the process: CS200, focusing on high performance, and CS200A, focusing on low power.
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are 193 nm and 248 nm. Fabrication of sub-wavelength features requires special imaging technologies, such as
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on a nominally 65 nm process, while the pitch between two lines may be greater than 130 nm.
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While feature sizes may be drawn as 65 nm or less, the wavelengths of light used for
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and multiple threshold voltages, to prevent leakage from prohibitively consuming power.
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Advanced lithographic node used in volume CMOS semiconductor fabrication
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gate dielectrics must be combined with existing techniques, including
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International Technology Roadmap for Semiconductors lithography nodes
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Gate length: 30 nm (high-performance) to 50 nm (low-power)
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of 0.543 nm, so such transistors are on the order of 100
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Gate oxide thickness: 1.9 nm (n), 2.1 nm (p)
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Processors using 65 nm manufacturing technology
419:are about 20 nm end-to-end. A crystal of bulk 935:Engineering Sample of the "Yonah" core Pentium M 920:"Intel to cut Prescott leakage by 75% at 65nm" 353: 8: 360: 346: 31: 618:series (starting from Tyler) – 2007-05-07 970: 611:series (starting from Lima) – 2007-02-20 718: 516:layers using nano-clustering silica as 34: 955: 858:"AMD preps 65 nm Turion X2 processors" 451:were also producing 65 nm chips. 942:"AMD's 65 nano silicon ready to roll" 824:from the original on August 13, 2016. 399:lengths) can reach as low as 25  7: 902:"ФГУ ФНЦ НИИСИ РАН: Разработка СБИС" 814:"ソニー、65nm対応の半導体設備を導入。3年間で2,000億円の投資" 501:Example: Fujitsu 65 nm process 25: 856:Gruener, Wolfgang (May 3, 2007). 46: 922:. The Register. August 31, 2004 597:(Cedar Mill cores) – 2006-05-28 937:, IDF Spring 2005, ExtremeTech 789:Kim, Paul (February 7, 2006). 1: 792:65nm CMOS Process Technology 460:optical proximity correction 731:September 27, 2007, at the 431:across. By September 2007, 395:. Printed linewidths (i.e. 1031: 888:"Microprocessor Elbrus-4C" 523:Metal 1 pitch: 180 nm 962:: CS1 maint: unfit URL ( 666:Xbox 360 Processor - 2007 572:(Cedar Mill) – 2006-01-16 393:semiconductor fabrication 639:) (updated) – 2007-10-30 509:Core voltage: 1.0 V 988:manufacturing processes 579:900-series – 2006-01-16 478:. The new chemistry of 818:pc.watch.impress.co.jp 708:SRISA 1890VM9Ya – 2016 868:on September 13, 2007 770:on September 27, 2011 726:2006 industry roadmap 518:ultralow κ dielectric 464:phase-shifting masks 845:. 2007. p. 1. 1003: 1002: 993:Succeeded by 843:Texas Instruments 631:Sony/Toshiba/IBM 476:quantum tunneling 370: 369: 16:(Redirected from 1022: 974:Preceded by 971: 967: 961: 953: 951: 949: 931: 929: 927: 906: 905: 898: 892: 891: 884: 878: 877: 875: 873: 864:. 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DesignCon. 794: 793: 785: 782: 769: 765: 761: 755: 752: 747: 741: 738: 734: 730: 727: 722: 719: 712: 707: 704: 701: 698: 694: 691: 688: 685: 681: 678: 675: 672: 668: 665: 661: 659: 655: 652: 648: 645: 644:UltraSPARC T2 641: 638: 637:PlayStation 3 634: 630: 627: 623: 620: 617: 613: 610: 606: 603: 599: 596: 592: 589: 585: 581: 578: 574: 571: 567: 564: 561: 558: 554: 550: 547:Sony/Toshiba 546: 545: 541: 539: 537: 531: 528: 525: 522: 519: 515: 511: 508: 505: 504: 500: 498: 496: 495:interconnects 491: 487: 485: 481: 477: 474:is caused by 473: 467: 465: 461: 457: 452: 450: 446: 442: 438: 434: 430: 426: 422: 418: 414: 406: 404: 402: 398: 394: 390: 386: 382: 379: 375: 374:65 nm process 363: 358: 356: 351: 349: 344: 343: 341: 340: 334: 331: 329: 326: 324: 323:Semiconductor 321: 319: 316: 314: 311: 308: 304: 301: 299: 296: 294: 291: 289: 286: 285: 282: 281: 274: 268: 267: 264: 263: 256: 250: 247: 241: 238: 232: 229: 223: 220: 214: 211: 205: 202: 196: 193: 187: 184: 178: 175: 169: 166: 160: 157: 154: 151: 148: 145: 142: 139: 136: 133: 130: 127: 124: 121: 115: 112: 106: 103: 97: 94: 88: 85: 79: 76: 70: 69: 67: 66: 62: 61:process nodes 57: 54: 53: 49: 45: 44: 41: 36:Semiconductor 33: 30: 19: 995: 983: 976: 946:. 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Retrieved 768:the original 763: 754: 740: 735:, Table 40a. 721: 684:Turion Ultra 616:Turion 64 X2 604:– 2006-07-27 565:– 2006-01-05 538: 535: 529:source/drain 488: 468: 453: 410: 407:Process node 378:lithographic 373: 371: 275: ~ 2025 257: – 2022 248: – 2020 239: – 2018 230: – 2016 221: – 2014 212: – 2012 203: – 2010 194: – 2009 185: – 2007 176: – 2005 173: 167: – 2003 158: – 2001 152: – 1999 146: – 1996 140: – 1993 134: – 1990 128: – 1987 122: – 1984 113: – 1981 104: – 1977 95: – 1974 86: – 1971 77: – 1968 29: 456:lithography 415:, cellular 313:Moore's law 156:130 nm 150:180 nm 144:250 nm 138:350 nm 132:600 nm 126:800 nm 111:1.5 μm 40:fabrication 997:45 nm 978:90 nm 948:August 25, 926:August 25, 774:August 10, 713:References 563:Intel Core 413:comparison 307:multi-gate 288:Half-nodes 228:10 nm 219:14 nm 210:22 nm 201:28 nm 192:32 nm 183:45 nm 174:65 nm 165:90 nm 84:10 μm 75:20 μm 958:cite news 686:– 2008-06 679:– 2008-05 646:– 2007–10 609:Athlon 64 595:Celeron D 577:Pentium D 570:Pentium 4 449:Chartered 417:ribosomes 273:2 nm 255:3 nm 246:5 nm 237:7 nm 120:1 μm 102:3 μm 93:6 μm 1009:Category 872:March 4, 862:TG Daily 822:Archived 729:Archived 697:Expeed 2 690:Loongson 677:VIA Nano 624:GeForce 588:Sossaman 559:) - 2005 520:(κ=2.25) 328:Industry 913:Sources 800:Fujitsu 764:Fujitsu 472:leakage 421:silicon 293:Density 266:Future 985:MOSFET 699:– 2010 695:Nikon 692:– 2009 671:OMAP 3 664:"Loki" 656:IBM's 653:series 651:Phenom 626:8800GT 622:NVIDIA 602:Core 2 600:Intel 593:Intel 582:Intel 575:Intel 568:Intel 480:high-κ 423:has a 389:MOSFET 303:Device 108:  38:device 839:(PDF) 796:(PDF) 557:PStwo 433:Intel 429:atoms 18:65 nm 964:link 950:2007 928:2007 874:2008 776:2008 703:MCST 682:AMD 662:IBM 649:AMD 642:Sun 633:Cell 614:AMD 607:AMD 584:Xeon 490:IEDM 462:and 447:and 411:For 385:CMOS 381:node 372:The 298:CMOS 669:TI 658:z10 512:11 445:UMC 441:IBM 437:AMD 1011:: 960:}} 956:{{ 860:. 841:. 820:. 816:. 762:. 553:GS 549:EE 443:, 439:, 435:, 401:nm 391:) 270:00 252:00 243:00 234:00 117:00 99:00 90:00 966:) 952:. 930:. 904:. 890:. 876:. 802:. 778:. 748:. 635:( 586:( 555:( 551:+ 387:( 361:e 354:t 347:v 309:) 305:( 225:0 216:0 207:0 198:0 189:0 180:0 171:0 162:0 81:0 72:0 63:) 59:( 20:)

Index

65 nm
Semiconductor
device
fabrication


MOSFET scaling
process nodes
20 μm
10 μm
6 μm
3 μm
1.5 μm
1 μm
800 nm
600 nm
350 nm
250 nm
180 nm
130 nm
90 nm
65 nm
45 nm
32 nm
28 nm
22 nm
14 nm
10 nm
7 nm
5 nm
3 nm
2 nm
Half-nodes

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