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Highly accelerated life test

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36: 170:. When HALT is used at the time a product is being introduced into the market, it can expose problems caused by new manufacturing processes. When used after a product has been introduced into the market, HALT can be used to audit product reliability caused by changes in components, manufacturing processes, suppliers, etc. 259:
must transmit vibration to the item under test. They must also be open in design or use air circulation to produce rapid temperature change to internal components. Test fixtures can use simple channels to attach the product to the chamber table or more complicated fixtures sometimes are fabricated.
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and temperatures from -100 to +200°C. Sometimes HALT chambers are called repetitive shock chambers because pneumatic air hammers are used to produce vibration. The chamber should also be capable of rapid changes in temperature, 50°C per minute should be considered a minimum rate of change. Usually
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Highly accelerated life testing (HALT) techniques are important in uncovering many of the weak links of a new product. These discovery tests rapidly find weaknesses using accelerated stress conditions. The goal of HALT is to proactively find weaknesses and fix them, thereby increasing product
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HALT uses several stress factors (decided by a Reliability Test Engineer) and/or the combination of various factors. Commonly used stress factors are temperature, vibration, and humidity for electronics and mechanical products. Other factors can include voltage, current, power cycling and
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A specialized environmental chamber is required for HALT. A suitable chamber also has to be capable of applying pseudo-random vibration with a suitable profile in relation to frequency. The HALT chamber should be capable of applying random vibration energy from 2 to 10,000 Hz in 6
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Environmental stresses are applied in a HALT procedure, eventually reaching a level significantly beyond that expected during use. The stresses used in HALT are typically hot and cold temperatures, temperature cycles, random vibration, power margining, and power cycling. The
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is in operation during HALT and is continuously monitored for failures. As stress-induced failures occur, the cause should be determined, and if possible, the problem should be repaired so that the test can continue to find other weaknesses.
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It is highly recommended to perform HALT in the initial phases of product development to uncover weak links in a product, so that there is better chance and more time to modify and improve the product.
186:, where a product is tested until failure. HALT does not help to determine or demonstrate the reliability value or failure probability in field. Many accelerated life tests are 342: – process of testing a product by subjecting it to excessive conditions beyond its normal service parameters in an effort to uncover faults and potential modes of failure 315:
HALT is conducted before qualification testing. By catching failures early, flaws are found earlier in the acceptance process, eliminating repetitive later-stage reviews.
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in which prototypes are stressed to a much higher degree than expected from actual use in order to identify weaknesses in the design or manufacture of the product.
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The equipment under test must be monitored so that if the equipment fails under test, the failure is detected. Monitoring is typically performed with
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when changes are much less costly to make. By finding weaknesses and making changes early, HALT can lower product development costs and compress
287:. Common causes of failures during HALT are poor product design, workmanship, and poor manufacturing. Failures to individual components such as 162:
HALT can be effectively used multiple times over a product's life time. During product development, it can find design weakness earlier in the
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reliability. Because of its accelerated nature, HALT is typically faster and less expensive than traditional testing techniques.
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occur because of these issues. Failure types found during HALT testing are associated with the infant mortality region of the
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Operating limits of the product (upper and lower). These can be compared with a designer's margin or supplier specifications
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organizations in the electronics, computer, medical, and military industries use HALT to improve product reliability.
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Destruct limits of the product (limit at which product functionality is lost and no recovery can be made)
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Multiple failure modes in the product before it is subjected to demonstration testing
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The Application of Accelerated Testing Methods and Theory (HALT and HASS)
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Next Generation HALT and HASS: Robust Design of Electronics and Systems
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high power resistive heating elements are used for heating and
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HALT AND HASS: The Accepted Quality and Reliability Paradigm
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Stress testing methodology for enhancing product reliability
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60:. Unsourced material may be challenged and removed. 335:Reliability engineering § Accelerated testing 8: 480:: CS1 maint: location missing publisher ( 452:. John James Paschkewitz. Chichester, UK. 393:"What is HALT HASS » Performing HALT" 365: 363: 120:Learn how and when to remove this message 359: 473: 428:. QualMark Corporation. Archived from 399:. Qualmark Corporation. Archived from 7: 58:adding citations to reliable sources 371:"Fundamentals of HALT/HASS Testing" 25: 182:HALT is a test technique called 34: 264:Monitoring and failure analysis 45:needs additional citations for 325:Highly accelerated stress test 215:Output of the HALT gives you: 69:"Highly accelerated life test" 1: 134:highly accelerated life test 18:Highly Accelerated Life Test 547: 501:What is HALT/HASS Testing? 506:A Beginners Guide to HALT 378:Keithley Instruments, Inc 380:. Cleveland, Ohio. 2000. 340:Accelerated life testing 157:research and development 248:) is used for cooling. 202:Typical HALT procedures 521:Electronic engineering 301:printed circuit boards 198:combinations of them. 147:for enhancing product 531:Environmental testing 422:Doertenbach, Neill. 311:Military application 54:improve this article 446:Gray, Kirk (2016). 391:Staff (1998–2012). 237:degrees of freedom 209:product under test 459:978-1-118-70020-4 164:product lifecycle 130: 129: 122: 104: 16:(Redirected from 538: 485: 479: 471: 434: 433: 419: 413: 412: 410: 408: 403:on March 1, 2012 388: 382: 381: 375: 367: 345: 330: 125: 118: 114: 111: 105: 103: 62: 38: 30: 21: 546: 545: 541: 540: 539: 537: 536: 535: 526:Product testing 511: 510: 492: 472: 460: 445: 442: 440:Further reading 437: 421: 420: 416: 406: 404: 390: 389: 385: 373: 369: 368: 361: 357: 349:Fault injection 343: 328: 321: 313: 266: 254: 247: 242:liquid nitrogen 232: 204: 176: 126: 115: 109: 106: 63: 61: 51: 39: 28: 23: 22: 15: 12: 11: 5: 544: 542: 534: 533: 528: 523: 513: 512: 509: 508: 503: 498: 491: 490:External links 488: 487: 486: 458: 441: 438: 436: 435: 432:on 2012-03-01. 414: 383: 358: 356: 353: 352: 351: 346: 337: 332: 320: 317: 312: 309: 277:accelerometers 265: 262: 253: 250: 245: 231: 228: 227: 226: 223: 220: 203: 200: 175: 172: 168:time to market 142:stress testing 128: 127: 42: 40: 33: 26: 24: 14: 13: 10: 9: 6: 4: 3: 2: 543: 532: 529: 527: 524: 522: 519: 518: 516: 507: 504: 502: 499: 497: 494: 493: 489: 483: 477: 469: 465: 461: 455: 451: 450: 444: 443: 439: 431: 427: 426: 418: 415: 402: 398: 394: 387: 384: 379: 372: 366: 364: 360: 354: 350: 347: 341: 338: 336: 333: 326: 323: 322: 318: 316: 310: 308: 306: 305:bathtub curve 302: 298: 294: 290: 286: 282: 278: 275: 271: 263: 261: 258: 257:Test fixtures 251: 249: 243: 238: 230:Test chambers 229: 224: 221: 218: 217: 216: 213: 210: 201: 199: 195: 191: 189: 185: 180: 173: 171: 169: 165: 160: 158: 154: 153:Manufacturing 150: 146: 143: 139: 135: 124: 121: 113: 102: 99: 95: 92: 88: 85: 81: 78: 74: 71: –  70: 66: 65:Find sources: 59: 55: 49: 48: 43:This article 41: 37: 32: 31: 19: 448: 430:the original 424: 417: 405:. Retrieved 401:the original 396: 386: 377: 314: 285:data loggers 270:thermocouple 267: 255: 233: 214: 205: 196: 192: 188:test-to-pass 187: 184:test-to-fail 183: 181: 177: 161: 137: 133: 131: 116: 107: 97: 90: 83: 76: 64: 52:Please help 47:verification 44: 281:multimeters 149:reliability 145:methodology 110:August 2008 515:Categories 355:References 293:capacitors 80:newspapers 476:cite book 468:933211556 289:resistors 274:vibration 272:sensors, 397:Qualmark 319:See also 252:Fixtures 174:Overview 407:10 June 140:) is a 94:scholar 466:  456:  297:diodes 96:  89:  82:  75:  67:  374:(PDF) 101:JSTOR 87:books 482:link 464:OCLC 454:ISBN 409:2012 329:HAST 283:and 155:and 138:HALT 73:news 244:(LN 56:by 517:: 478:}} 474:{{ 462:. 395:. 376:. 362:^ 307:. 299:, 295:, 291:, 279:, 132:A 484:) 470:. 411:. 331:) 327:( 246:2 136:( 123:) 117:( 112:) 108:( 98:· 91:· 84:· 77:· 50:. 20:)

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Highly Accelerated Life Test

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stress testing
methodology
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Test fixtures
thermocouple
vibration
accelerometers
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