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Highly accelerated life test

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25: 159:. When HALT is used at the time a product is being introduced into the market, it can expose problems caused by new manufacturing processes. When used after a product has been introduced into the market, HALT can be used to audit product reliability caused by changes in components, manufacturing processes, suppliers, etc. 248:
must transmit vibration to the item under test. They must also be open in design or use air circulation to produce rapid temperature change to internal components. Test fixtures can use simple channels to attach the product to the chamber table or more complicated fixtures sometimes are fabricated.
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and temperatures from -100 to +200°C. Sometimes HALT chambers are called repetitive shock chambers because pneumatic air hammers are used to produce vibration. The chamber should also be capable of rapid changes in temperature, 50°C per minute should be considered a minimum rate of change. Usually
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Highly accelerated life testing (HALT) techniques are important in uncovering many of the weak links of a new product. These discovery tests rapidly find weaknesses using accelerated stress conditions. The goal of HALT is to proactively find weaknesses and fix them, thereby increasing product
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HALT uses several stress factors (decided by a Reliability Test Engineer) and/or the combination of various factors. Commonly used stress factors are temperature, vibration, and humidity for electronics and mechanical products. Other factors can include voltage, current, power cycling and
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A specialized environmental chamber is required for HALT. A suitable chamber also has to be capable of applying pseudo-random vibration with a suitable profile in relation to frequency. The HALT chamber should be capable of applying random vibration energy from 2 to 10,000 Hz in 6
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Environmental stresses are applied in a HALT procedure, eventually reaching a level significantly beyond that expected during use. The stresses used in HALT are typically hot and cold temperatures, temperature cycles, random vibration, power margining, and power cycling. The
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is in operation during HALT and is continuously monitored for failures. As stress-induced failures occur, the cause should be determined, and if possible, the problem should be repaired so that the test can continue to find other weaknesses.
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It is highly recommended to perform HALT in the initial phases of product development to uncover weak links in a product, so that there is better chance and more time to modify and improve the product.
175:, where a product is tested until failure. HALT does not help to determine or demonstrate the reliability value or failure probability in field. Many accelerated life tests are 331: – process of testing a product by subjecting it to excessive conditions beyond its normal service parameters in an effort to uncover faults and potential modes of failure 304:
HALT is conducted before qualification testing. By catching failures early, flaws are found earlier in the acceptance process, eliminating repetitive later-stage reviews.
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in which prototypes are stressed to a much higher degree than expected from actual use in order to identify weaknesses in the design or manufacture of the product.
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The equipment under test must be monitored so that if the equipment fails under test, the failure is detected. Monitoring is typically performed with
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when changes are much less costly to make. By finding weaknesses and making changes early, HALT can lower product development costs and compress
276:. Common causes of failures during HALT are poor product design, workmanship, and poor manufacturing. Failures to individual components such as 151:
HALT can be effectively used multiple times over a product's life time. During product development, it can find design weakness earlier in the
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reliability. Because of its accelerated nature, HALT is typically faster and less expensive than traditional testing techniques.
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occur because of these issues. Failure types found during HALT testing are associated with the infant mortality region of the
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Operating limits of the product (upper and lower). These can be compared with a designer's margin or supplier specifications
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organizations in the electronics, computer, medical, and military industries use HALT to improve product reliability.
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Destruct limits of the product (limit at which product functionality is lost and no recovery can be made)
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Multiple failure modes in the product before it is subjected to demonstration testing
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The Application of Accelerated Testing Methods and Theory (HALT and HASS)
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Next Generation HALT and HASS: Robust Design of Electronics and Systems
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high power resistive heating elements are used for heating and
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HALT AND HASS: The Accepted Quality and Reliability Paradigm
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Stress testing methodology for enhancing product reliability
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Pages displaying wikidata descriptions as a fallback
49:. Unsourced material may be challenged and removed. 324:Reliability engineering § Accelerated testing 8: 469:: CS1 maint: location missing publisher ( 441:. John James Paschkewitz. Chichester, UK. 382:"What is HALT HASS » Performing HALT" 354: 352: 109:Learn how and when to remove this message 348: 462: 417:. QualMark Corporation. Archived from 388:. Qualmark Corporation. Archived from 7: 47:adding citations to reliable sources 360:"Fundamentals of HALT/HASS Testing" 14: 171:HALT is a test technique called 23: 253:Monitoring and failure analysis 34:needs additional citations for 314:Highly accelerated stress test 204:Output of the HALT gives you: 58:"Highly accelerated life test" 1: 123:highly accelerated life test 536: 490:What is HALT/HASS Testing? 495:A Beginners Guide to HALT 367:Keithley Instruments, Inc 369:. Cleveland, Ohio. 2000. 329:Accelerated life testing 146:research and development 237:) is used for cooling. 191:Typical HALT procedures 510:Electronic engineering 290:printed circuit boards 187:combinations of them. 136:for enhancing product 520:Environmental testing 411:Doertenbach, Neill. 300:Military application 43:improve this article 435:Gray, Kirk (2016). 380:Staff (1998–2012). 226:degrees of freedom 198:product under test 448:978-1-118-70020-4 153:product lifecycle 119: 118: 111: 93: 527: 474: 468: 460: 423: 422: 408: 402: 401: 399: 397: 392:on March 1, 2012 377: 371: 370: 364: 356: 334: 319: 114: 107: 103: 100: 94: 92: 51: 27: 19: 535: 534: 530: 529: 528: 526: 525: 524: 515:Product testing 500: 499: 481: 461: 449: 434: 431: 429:Further reading 426: 410: 409: 405: 395: 393: 379: 378: 374: 362: 358: 357: 350: 346: 338:Fault injection 332: 317: 310: 302: 255: 243: 236: 231:liquid nitrogen 221: 193: 165: 115: 104: 98: 95: 52: 50: 40: 28: 17: 12: 11: 5: 533: 531: 523: 522: 517: 512: 502: 501: 498: 497: 492: 487: 480: 479:External links 477: 476: 475: 447: 430: 427: 425: 424: 421:on 2012-03-01. 403: 372: 347: 345: 342: 341: 340: 335: 326: 321: 309: 306: 301: 298: 266:accelerometers 254: 251: 242: 239: 234: 220: 217: 216: 215: 212: 209: 192: 189: 164: 161: 157:time to market 131:stress testing 117: 116: 31: 29: 22: 15: 13: 10: 9: 6: 4: 3: 2: 532: 521: 518: 516: 513: 511: 508: 507: 505: 496: 493: 491: 488: 486: 483: 482: 478: 472: 466: 458: 454: 450: 444: 440: 439: 433: 432: 428: 420: 416: 415: 407: 404: 391: 387: 383: 376: 373: 368: 361: 355: 353: 349: 343: 339: 336: 330: 327: 325: 322: 315: 312: 311: 307: 305: 299: 297: 295: 294:bathtub curve 291: 287: 283: 279: 275: 271: 267: 264: 260: 252: 250: 247: 246:Test fixtures 240: 238: 232: 227: 219:Test chambers 218: 213: 210: 207: 206: 205: 202: 199: 190: 188: 184: 180: 178: 174: 169: 162: 160: 158: 154: 149: 147: 143: 142:Manufacturing 139: 135: 132: 128: 124: 113: 110: 102: 91: 88: 84: 81: 77: 74: 70: 67: 63: 60: –  59: 55: 54:Find sources: 48: 44: 38: 37: 32:This article 30: 26: 21: 20: 437: 419:the original 413: 406: 394:. Retrieved 390:the original 385: 375: 366: 303: 274:data loggers 259:thermocouple 256: 244: 222: 203: 194: 185: 181: 177:test-to-pass 176: 173:test-to-fail 172: 170: 166: 150: 126: 122: 120: 105: 96: 86: 79: 72: 65: 53: 41:Please help 36:verification 33: 270:multimeters 138:reliability 134:methodology 99:August 2008 504:Categories 344:References 282:capacitors 69:newspapers 465:cite book 457:933211556 278:resistors 263:vibration 261:sensors, 386:Qualmark 308:See also 241:Fixtures 163:Overview 396:10 June 129:) is a 83:scholar 455:  445:  286:diodes 85:  78:  71:  64:  56:  363:(PDF) 90:JSTOR 76:books 471:link 453:OCLC 443:ISBN 398:2012 318:HAST 272:and 144:and 127:HALT 62:news 233:(LN 45:by 506:: 467:}} 463:{{ 451:. 384:. 365:. 351:^ 296:. 288:, 284:, 280:, 268:, 121:A 473:) 459:. 400:. 320:) 316:( 235:2 125:( 112:) 106:( 101:) 97:( 87:· 80:· 73:· 66:· 39:.

Index


verification
improve this article
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"Highly accelerated life test"
news
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books
scholar
JSTOR
Learn how and when to remove this message
stress testing
methodology
reliability
Manufacturing
research and development
product lifecycle
time to market
product under test
degrees of freedom
liquid nitrogen
Test fixtures
thermocouple
vibration
accelerometers
multimeters
data loggers
resistors
capacitors
diodes

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