83:. In contrast to desktop X-ray sources that work at a limited set of fixed wavelengths, synchrotron radiation is generated by accelerating electrons and using an undulator (device of periodic placed dipole magnets) to "wiggle" the electrons in their path, to generate the wanted wavelength of X-rays. This allows scientists to vary the wavelength, which in turn makes it possible to vary the scattering factor for one particular element in the sample under investigation. Thus a particular element can be highlighted. This is known as
104:
oxygen do not contribute to anomalous scattering at normal X-ray wavelengths used for X-ray crystallography. Thus, in order to observe anomalous scattering, a heavy atom must be native to the protein or a heavy atom derivative should be made. In addition, the X-ray's wavelength should be close to the heavy atom's absorption edge.
48:
for an atom is roughly proportional to the number of electrons that it possesses. However, for wavelengths that approximate those for which the atom strongly absorbs radiation the scattering factor undergoes a change due to anomalous dispersion. The dispersion not only affects the magnitude of the
103:
refers to a change in a diffracting X-ray's phase that is unique from the rest of the atoms in a crystal due to strong X-ray absorbance. The amount of energy that individual atoms absorb depends on their atomic number. The relatively light atoms found in proteins such as carbon, nitrogen, and
87:. In addition to this effect the anomalous scatter is more sensitive to any deviation from sphericity of the electron cloud around the atom. This can lead to resonant effects involving transitions in the outer shell of the atom:
35:
that occurs when a wavelength is selected that is in the vicinity of an absorption edge of one of the constituent elements of the sample. It is used in materials research to study nanometer sized differences in structure.
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The anomalous aspects of X-ray scattering have become the focus of considerable interest in the scientific community because of the availability of
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factor but also imparts a phase shift in the elastic collision of the photon. The scattering factor can therefore best be described as a
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Kawaguchi, T; Fukuda, K; Tokuda, K; Shimada, K; Ichitsubo, T; Oishi, M; Mizuki, J; Matsubara, E (November 2014).
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262:, describes the techniques supported by the commonly-used PHENIX refining program, including MAD & SAD.
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X-ray diffraction in crystals, imperfect crystals and amorphous bodies. A. Guinier. Dover 1994
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at skuld.bmsc.washington.edu. A resource mainly aimed at crystallographers.
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Crystal structure analysis for chemists and biologists.
128:(DAFS) combines the use of anomalous diffraction with
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194:"Revisit to diffraction anomalous fine structure"
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180:Crystallography made crystal clear (2nd ed.).
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44:In X-ray diffraction the scattering factor
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120:Single-wavelength anomalous diffraction
114:Multi-wavelength anomalous diffraction
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126:Diffraction anomalous fine structure
89:resonant anomalous X-ray scattering
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198:Journal of Synchrotron Radiation
130:X-ray absorption fine structure
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165:Glusker J.P. et al. (1994).
99:In protein crystallography,
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560:X-Ray Fluorescence Imaging
448:Anomalous X-ray scattering
254:X-ray Anomalous Scattering
182:San Diego: Academic Press.
17:Anomalous X-ray scattering
219:10.1107/S1600577514015148
156:original publication 1963
40:Atomic scattering factors
387:Synchrotron light source
406:Interaction with matter
365:Sources and instruments
95:Protein crystallography
538:Diffraction tomography
31:that makes use of the
757:X-ray crystallography
752:Scientific techniques
649:X-ray crystallography
518:Soft x-ray microscopy
486:Panoramic radiography
326:Synchrotron radiation
81:synchrotron radiation
418:Photoelectric effect
351:Characteristic X-ray
101:anomalous scattering
33:anomalous dispersion
438:Photodisintegration
413:Rayleigh scattering
392:Free-electron laser
210:2014JSynR..21.1247K
178:Rhodes, G. (2000).
679:X-ray reflectivity
458:X-ray fluorescence
423:Compton scattering
356:High-energy X-rays
85:contrast variation
75:Contrast variation
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727:X-ray lithography
659:Backscatter X-ray
654:X-ray diffraction
481:X-ray radiography
453:X-ray diffraction
346:Siegbahn notation
204:(Pt 6): 1247–51.
29:X-ray diffraction
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565:X-ray holography
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443:Radiation damage
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304:Characteristics
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260:PHENIX glossary
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108:List of methods
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589:Spectroscopy
533:Ptychography
467:Applications
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428:Auger effect
331:Water window
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382:Synchrotron
746:Categories
641:Scattering
506:Helical CT
372:X-ray tube
137:References
169:Wiley-VCH
377:Betatron
238:25343791
720:History
474:Imaging
229:4211131
206:Bibcode
132:(XAFS).
708:Others
669:GISAXS
341:L-edge
336:K-edge
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152:
699:EDXRD
621:XANES
616:EXAFS
606:ARPES
553:3DXRD
311:X-ray
122:(SAD)
116:(MAD)
67:+ i.Δ
684:RIXS
674:WAXS
664:SAXS
575:DFXM
543:XDCT
528:STXM
523:XPCI
511:XACT
234:PMID
150:ISBN
25:XRAS
21:AXRS
689:XRS
631:XFH
626:EDS
611:AES
601:XPS
596:XAS
580:DXA
548:DCT
496:CDI
224:PMC
214:doi
63:+ Δ
59:= f
23:or
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694:XS
501:CT
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69:f"
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61:o
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19:(
Text is available under the Creative Commons Attribution-ShareAlike License. Additional terms may apply.