Knowledge (XXG)

Charge sharing

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If a certain part of the charge cloud is diffusing to the read-out electronics of a neighbouring pixel, this results in the detection of two events with lower energy than the primary photon. Furthermore, if the resulting charge in one of the affected pixels is smaller than the threshold, the event is discarded as noise. In general, this leads to the underestimation of the energy of incident photons. The registration of one incident photon in several pixels degrades spatial resolution, as the information about the primary interaction is smeared out. Furthermore, this effect leads to degradation of energy resolution due to the general underestimation. Especially in medical applications, charge sharing reduces the dose efficiency, meaning that the useful proportion of the incident dose for imaging applications is reduced.
55:. The resulting charge cloud is being accelerated towards the readout electronics via an applied voltage bias. Because of thermic energy and repulsion due to the electric fields inside such a device, the charge cloud diffuses, effectively getting larger in lateral size. In pixelated detectors, this effect can lead to a detection of parts of the initial charge cloud in neighbouring pixels. As the probability for this cross talk increases towards pixel edges, it is more prominent in detectors with smaller pixel size. Furthermore, fluorescence of the detector material above its K-edge can lead to additional charge carriers that add to the effect of charge-sharing. Especially in photon counting detectors, charge sharing can lead to errors in the signal count. 63:
Especially in photon counting detectors, the energy of an incident photon is correlated with the net sum of the charge in the primary charge cloud. This kind of detectors often use thresholds to be able to act over a certain noise level but also to discriminate incident photons of different energies.
93:. The charge sharing problem occurs when the charge which is stored at the output node in the precharge phase is shared among the output or junction capacitances of transistors which are in the evaluation phase. Charge sharing may degrade the output voltage level or even cause erroneous output value 72:
There are several approaches on the correction of charge sharing. One approach is to neglect all events, where in the same time window there is a detector response in more than one corresponding pixel - which severely reduces detector efficiency and limits the possible maximum countrate. Another
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Myronakis, Marios E.; Darambara, Dimitra G. (2010-12-28). "Monte Carlo investigation of charge-transport effects on energy resolution and detection efficiency of pixelated CZT detectors for SPECT/PET applications: Investigation of charge-transport effects on pixelated CZT detectors".
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approach is addition of the low levels of signal of correlated events in neighbouring pixels and attribution to the pixel with the largest signal. Other correction approaches basically rely on a deconvolution in the signal domain, taking calibrated detector response into account.
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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
256: 183:"Energy-loss correction in charge sharing events for improved performance of pixellated compound semiconductors" 39:, charge sharing refers to the diffusion of electrical charges with a negative impact on image quality. 36: 19:
is an effect of signal degradation through transfer of charges from one electronic domain to another.
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Chmeissani, M.; Mikulec, B. (2001). "Performance limits of a single photon counting pixel system".
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In the active detector layer of photon detectors, incident photons are converted to
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Bugby, S.L.; Koch-Mehrin, K.A.; Veale, M.C.; Wilson, M.D.; Lees, J.E. (2019).
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EDA for IC implementation, circuit design, and process technology
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In digital electronics, charge sharing is an undesirable
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Charge sharing in semiconductor radiation detectors
8: 209: 85:phenomenon observed most commonly in the 102: 77:Charge sharing in digital electronics 7: 14: 1: 132:10.1016/S0168-9002(00)01100-1 68:Correction of charge sharing 43:Formation of charge sharing 27:In pixelated semiconductor 273: 225:Mohit Kumar Gupta (2006). 211:10.1016/j.nima.2019.06.017 59:Problems of charge sharing 37:hybrid-pixel-detectors 53:photoelectric effect 257:Digital electronics 202:2019NIMPA.940..142B 124:2001NIMPA.460...81C 49:electron-hole pairs 29:radiation detectors 160:10.1118/1.3532825 264: 241: 240: 222: 216: 215: 213: 187: 178: 172: 171: 142: 136: 135: 107: 91:digital circuits 83:signal integrity 272: 271: 267: 266: 265: 263: 262: 261: 247: 246: 245: 244: 237: 224: 223: 219: 185: 180: 179: 175: 148:Medical Physics 144: 143: 139: 109: 108: 104: 99: 79: 70: 61: 45: 33:photon-counting 25: 12: 11: 5: 270: 268: 260: 259: 249: 248: 243: 242: 235: 217: 173: 154:(1): 455–467. 137: 101: 100: 98: 95: 78: 75: 69: 66: 60: 57: 44: 41: 24: 21: 17:Charge sharing 13: 10: 9: 6: 4: 3: 2: 269: 258: 255: 254: 252: 238: 236:0-8493-7924-5 232: 229:. CRC Press. 228: 221: 218: 212: 207: 203: 199: 195: 191: 184: 177: 174: 169: 165: 161: 157: 153: 149: 141: 138: 133: 129: 125: 121: 117: 113: 106: 103: 96: 94: 92: 88: 84: 76: 74: 67: 65: 58: 56: 54: 50: 42: 40: 38: 34: 30: 22: 20: 18: 226: 220: 193: 189: 176: 151: 147: 140: 118:(1): 81–90. 115: 111: 105: 87:Domino logic 80: 71: 62: 46: 26: 16: 15: 196:: 142–151. 97:References 89:family of 31:- such as 251:Category 168:21361214 51:via the 198:Bibcode 120:Bibcode 233:  166:  186:(PDF) 231:ISBN 164:PMID 206:doi 194:940 156:doi 128:doi 116:460 35:or 253:: 204:. 192:. 188:. 162:. 152:38 150:. 126:. 114:. 239:. 214:. 208:: 200:: 170:. 158:: 134:. 130:: 122::

Index

radiation detectors
photon-counting
hybrid-pixel-detectors
electron-hole pairs
photoelectric effect
signal integrity
Domino logic
digital circuits
Bibcode
2001NIMPA.460...81C
doi
10.1016/S0168-9002(00)01100-1
doi
10.1118/1.3532825
PMID
21361214
"Energy-loss correction in charge sharing events for improved performance of pixellated compound semiconductors"
Bibcode
2019NIMPA.940..142B
doi
10.1016/j.nima.2019.06.017
ISBN
0-8493-7924-5
Category
Digital electronics

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