171:
collected. To use these interactions to determine sample composition a technique must be selected along with irradiation conditions and the detection system that will best isolate the radiation of interest providing the desired sensitivity and detection limits. The basic layout of an ion beam apparatus is an accelerator which produces an ion beam that is feed through an evacuated beam-transport tube to a beam handling device. This device isolates the ion species and charge of interest which then are transported through an evacuated beam-transport tube into the target chamber. This chamber is where the refined ion beam will come into contact with the sample and thus the resulting interactions can be observed. The configuration of the ion beam apparatus can be changed and made more complex with the incorporation of additional components. The techniques for ion beam analysis are designed for specific purposes. Some techniques and ion sources are shown in table 1. Detector types and arrangements for ion beam techniques are shown in table 2.
639:
available by using ion beam analysis in conjunction with elastic backscattering spectrometry (EBS). The researchers of a gold nanoparticle study were able to find much greater success using ion beam analysis in comparison to other analytical techniques, such as PIXE or XRF. This success is due to the fact that the EBS signal can directly measure depth information using ion beam analysis, whereas this cannot be done with the other two methods. The unique properties of ion beam analysis make great use in a new line of cancer therapy.
657:
as ion beam analysis are believed to alleviate this issue. Researchers are currently studying the use of ion beam analysis in conjunction with a scanning electron microscope and an Energy
Dispersive X-ray spectrometer (SEM-EDS). The hope is that this setup will detect the composition of new and old chemicals that older analyses could not efficiently detect in the past. The greater amount of analytical signal used and more sensitive lighting found in ion beam analysis gives great promise to the field of forensic science.
648:
is its offering of excellent analytical performance and non-invasive character. More specifically, this technique offers unparalleled performance in terms of sensitivity and accuracy. Recently however, there have been competing sources for archaeometry purposes using X-ray based methods such as XRF. Nonetheless, the most preferred and accurate source is ion beam analysis, which is still unmatched in its analysis of light elements and chemical 3D imaging applications (i.e. artwork and archaeological artifacts).
630:
success found in using ion beam analysis has been virtually unchallenged over the past thirty years until very recently with new developing technologies. Even then, the use of ion beam analysis has not faded, and more applications are being found that take advantage of its superior detection capabilities. In an era where older technologies can become obsolete at an instant, ion beam analysis has remained a mainstay and only appears to be growing as researchers are finding greater use for the technique.
675:
or by acquiring different products originating from ion-solid interaction, complementary information can be extracted. However, analysis is often challenged either in terms of mass resolution—when several comparably heavy elements are present in the sample—or in terms of sensitivity—when light species are present in heavy matrices. Hence, a combination of two or more ion beam-based techniques can overcome the limitations of each individual method and provide complementary information about the sample.
54:. All IBA methods are highly sensitive and allow the detection of elements in the sub-monolayer range. The depth resolution is typically in the range of a few nanometers to a few ten nanometers. Atomic depth resolution can be achieved, but requires special equipment. The analyzed depth ranges from a few ten nanometers to a few ten micrometers. IBA methods are always quantitative with an accuracy of a few percent. Channeling allows to determine the depth profile of damage in single crystals.
696:
process they are observing. Applications of these software programs range from data analysis to theoretical simulations and modeling based on assumptions about the atomic data, mathematics and physics properties that detail the process in question. As the purpose and implementation of ion beam analysis has changed over the years, so has the software and codes used to model it. Such changes are detailed through the five classes by which the updated software are categorized.
679:
705:
the time, the computational models only tackled the analysis associated with the back-scattering techniques of ion beam analysis and performed calculation based on a slab analysis. A variety of other programs arose during this time, such as RBSFIT, though due to the lack of in-depth knowledge on ion beam analysis, it became increasingly hard to develop programs that accurate.
695:
Dating back to the 1960s the data collected via ion beam analysis has been analyzed through a multitude of computer simulation programs. Researchers who frequently use ion beam analysis in conjunction with their work require that this software be accurate and appropriate for describing the analytical
674:
Ion beam-based analytical techniques represent a powerful set of tools for non-destructive, standard-less, depth-resolved and highly accurate elemental composition analysis in the depth regime from several nm up to few μm. By changing type of incident ion, the geometry of experiment, particle energy,
629:
Ion beam analysis has found use in a number of variable applications, ranging from biomedical uses to studying ancient artifacts. The popularity of this technique stems from the sensitive data that can be collected without significant distortion to the system on which it is studying. The unparalleled
731:
Exiting the Class C era and into the early 2000s, software and simulation programs for ion beam analysis were tackling a variety of data collecting techniques and data analysis problems. Following along with the world's technological advancements, adjustments were made to enhance the programs into a
647:
Ion beam analysis also has a very unique application in the use of studying archaeological artifacts, also known as archaeometry. For the past three decades, this has been the much preferred method to study artifacts while preserving their content. What many have found useful in using this technique
704:
Includes all programs developed in the late 1960s and early 1970s. This class of software solved specific problems in the data; niy did not provide the full potential to analyze a spectrum of a full general case. The prominent pioneering program was IBA, developed by
Ziegler and Baglin in 1971. At
656:
A third application of ion beam analysis is in forensic studies, particularly with gunshot residue characterization. Current characterization is done based on heavy metals found in bullets, however, manufacturing changes are slowly making these analyses obsolete. The introduction of techniques such
150:
The quantitative evaluation of IBA methods requires the use of specialized simulation and data analysis software. SIMNRA and DataFurnace are popular programs for the analysis of RBS, ERD and NRA, while GUPIX is popular for PIXE. A review of IBA software was followed by an intercomparison of several
740:
This most recently developed class, having similar characteristics to the previous, makes use of primary principles in the Monte Carlo computational techniques. This class applies molecular dynamic calculations that are able to analyze both low and high energy physical interactions taking place in
713:
A new wave of programs sought to solve this accuracy problem in this next class of software. Developed during the 1980s, programs like SQEAKIE and BEAM EXPERT, afforded an opportunity to solve the complete general case by employing codes to perform direct analysis. This direct approach unfolds the
722:
In a trip back to square one, this third class of programs, created in the 1990s, take a few principles from Class A in accounting for the general case, however, now through the use of indirect methods. RUMP and SENRAS, for example, use an assumed model of the sample and simulate a comparative
170:
Ion beam analysis works on the basis that ion-atom interactions are produced by the introduction of ions to the sample being tested. Major interactions result in the emission of products that enable information regarding the number, type, distribution and structural arrangement of atoms to be
638:
Gold nanoparticles have been recently used as a basis for a count of atomic species, especially with studying the content of cancer cells. Ion beam analysis is a great way to count the amount of atomic species per cell. Scientists have found an effective way to make accurate quantitative data
665:
The spatially resolved detection of light elements, for example lithium, remains challenging for most techniques based on the electronic shell of the target atoms such as XRF or SEM-EDS. For lithium and lithium-ion batteries, the quantification of the lithium stoichiometry and its spatial
714:
produced spectrum with no assumptions made about the sample. Instead it calculates through separated spectrum signals and solves a set of linear equations for each layer. Problems still arise, though, and adjustments made to reduce noise in the measurements and room for uncertainty.
723:
theoretical spectra, which afforded such properties as fine structure retention and uncertainty calculations. In addition to the improvement in software analysis tools came the ability to analyze other techniques aside from back-scattering; i.e. ERDA and NRA.
666:
distribution are important to understand the mechanisms behind dis-/charging and aging. Through ion beam focussing and a combination of methods, ion beam analysis offers the unique possibility for measuring the local state of charge (SoC) on the μm-scale.
682:
Overview of various ion-surface interactions. (1)-incoming ion; (2)-scattering; (3)-neutralization and scattering; (4)-sputtering or recoiling; (5)-electron emission; (6)-photon emission; (7)-adsorption; (8)-displacement, e.g. from sputtering
1070:
Moro, M.V.; Holeňák, R.; Zendejas Medina, L.; Jansson, U.; Primetzhofer, D. (September 2019). "Accurate high-resolution depth profiling of magnetron sputtered transition metal alloy films containing light species: A multi-method approach".
732:
state more generalized codes, spectrum evaluation, and structural determination. Programs produced like SIMNRA now account for the more complex interactions with the beam and sample; also providing a known database of scattering data.
41:
to probe the composition and obtain elemental depth profiles in the near-surface layer of solids. IBA is not restricted to MeV energy ranges. It can be operated at low energy (<Kev) using techniques such as
991:
Möller, Sören; Satoh, Takahiro; Ishii, Yasuyuki; Teßmer, Britta; Guerdelli, Rayan; Kamiya, Tomihiro; Fujita, Kazuhisa; Suzuki, Kota; Kato, Yoshiaki; Wiemhöfer, Hans-Dieter; Mima, Kunioki (June 2021).
741:
the ion beam analysis. A key and popular feature that accompanies such techniques is the possibility for the computations to be incorporated in real time with the ion beam analysis experiment itself.
146:
IBIL: Ion beam induced luminescence occurs when an energetic beam of ions strike a target, excite the native atoms, and visible light is emitted as a result of outer-shell transitions.
1309:
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1413:
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Barradas, N.P.; Arstila, K.; Battistig, G.; Bianconi M.; Dytlewski N.; Jeynes C.; Kótai E.; Lulli G.; Mayer M.; Rauhala E.; Szilágyi E.; Thompson M. (2007).
687:
An iterative and self-consistent analysis also enhances the accuracy of the information that can be obtained from each independent measurement.
62:
is sensitive to heavy elements in a light matrix. This technique is used for determining elemental composition and depth profiling of materials.
1514:
1032:
1317:
152:
818:
932:
993:"Absolute Local Quantification of Li as Function of State-of-Charge in All-Solid-State Li Batteries via 2D MeV Ion-Beam Analysis"
1378:
Huddle, James R.; Grant, Patrick G.; Ludington, Alexander R.; Foster, Robert L. (August 2007). "Ion beam-induced luminescence".
1169:
Jeynes, C.; Bailey, M.J.; Bright, N.J.; Christopher, M.E.; Grime, G.W.; Jones, B.N.; Palitsin, V.V.; Webb, R.P. (January 2012).
897:. Multidisciplinary Applications of Nuclear Physics with Ion Beams. AIP Conference Proceedings. Vol. 1530. pp. 11–24.
111:
47:
1623:
program for the simulation and analysis (self-consistent fitting) of multiple PIXE, RBS, EBS, ERD, NRA, PIGE, NRP, NDP spectra
1564:
European
Conference on Accelerators in Applied Research and Technology ECAART (Triennial European scientific conference):
1617:
program for the simulation and analysis (self-consistent fitting) of multiple RBS, EBS, ERD, and NRA spectra using SIMNRA
1027:. Wang, Yongqiang., Nastasi, Michael Anthony, 1950- (2nd ed.). Warrendale, Pa.: Materials Research Society. 2009.
131:; then the strings of atoms "shadow" each other and the backscattering yield falls dramatically. Any atoms off their
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1056:
118:
59:
1583:
International
Conference on Particle Induced X-ray Emission (Trienniel scientific conference devoted to PIXE):
93:
104:
956:
Romolo, F.S. (May 2, 2013). "Integrated Ion Beam
Analysis (IBA) in Gunshot Residue (GSR) Characterisation".
86:
1605:: The international peer-reviewed scientific journal largely devoted to IBA developments and applications
1380:
Nuclear
Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1178:
Nuclear
Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
124:
1375:
159:
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sites will give visible extra scattering. Thus damage to the crystal is visible, and point defects (
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free version of NDF (the calculation engine underlying DataFurnace) for the simulation of IBA spectra
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International
Conference on Ion Beam Analysis (Biennial scientific conference devoted to IBA):
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1038:
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Comparotto, C.; Petter, S.; Donzel-Gargand, O.; Kubart, T.; Scragg, J.J.S. (April 2022).
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Rauhala E.; Barradas, N.P.; Fazinic S.; Mayer M.; Szilágyi E.; Thompson M. (2006).
158:
IBA is an area of active research. The last major
Nuclear Microbeam conference in
140:
82:
1454:"International Atomic Energy Agency intercomparison of Ion Beam Analysis software"
1213:"International Atomic Energy Agency Intercomparison of Ion Beam Analysis Software"
1479:
1434:
1399:
1359:
1338:
Schiettekatte, F (2008). "Fast Monte Carlo for ion beam analysis simulations".
1285:
1236:
1197:
843:"Measuring and Modeling Cell-to-Cell Variation in Uptake of Gold Nanoparticles"
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program for the simulation and analysis of RBS, EBS, ERD, NRA and MEIS spectra
1506:
1102:
1042:
1009:
992:
1146:
977:
895:
Ion Beam
Analysis in Cultural Heritage Studies: Milestones and Perspectives
876:
1632:
1614:
1130:
Perovskite Thin Films at a Moderate Temperature on Conductive Substrates"
128:
127:: The fast ion beam can be aligned accurately with major axes of single
73:
is used when the incident particle is going so fast that it exceeds the "
38:
1499:
Accelerator technology - Applications in Science, Medicine, and Industry
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910:
1588:
1538:
90:
69:
can be sensitive even to light elements in a heavy matrix. The term
50:, as well as at higher energies (>GeV) using instruments like the
1596:
1647:
Hardware and software for ion-beam analysis and μ-beam applications
1565:
1085:
1644:
677:
1592:
1577:
472:
External to chamber, Fixed geometry, High wavelength resolution.
396:
Table 2: Detector Types and Arrangements for Ion Beam Techniques
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77:" of the target nucleus, which therefore cannot be treated by
51:
35:
89:
should be solved to obtain the scattering cross-section (see
1453:
1408:
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1573:
1608:
1546:
1262:"Status of ion beam data analysis and simulation software"
492:
Vacuum or external. Filters Thin Window. Liquid N cooling
1554:
1501:, Particle Acceleration and Detection, Springer Nature,
1635:
program for the simulation and analysis of PIXE spectra
1641:
Intercomparison of PIXE spectrometry software packages
1558:
544:
Glancing angle geometry for improved depth resolution
151:
codes dedicated to RBS, ERD and NRA, organized by the
1459:
Nuclear Instruments and Methods in Physics Research B
1414:
Nuclear Instruments and Methods in Physics Research B
1409:"Status of IBA data analysis and simulation software"
1340:
Nuclear Instruments and Methods in Physics Research B
1266:
Nuclear Instruments and Methods in Physics Research B
1217:
Nuclear Instruments and Methods in Physics Research B
67:
Elastic (non-Rutherford) backscattering spectrometry
803:1 - Concepts and Principles of Ion Beam Analysis
454:High mass resolution with Sector Field Analyser
107:is sensitive to light elements in a heavy matrix
114:gives the trace and minor elemental composition
1025:Handbook of modern ion beam materials analysis
805:. San Diego: Academic Press. pp. 3–102.
8:
801:WILLIAMS, J. S.; BIRD, J. R. (1989-01-01).
173:
1487:
1442:
1293:
1244:
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1084:
1008:
866:
841:Jeynes, J. Charles (September 26, 2013).
394:
181:
893:Dran, Jean-Claude (November 24, 2013).
749:
30:(IBA) is an important family of modern
1048:
7:
1310:"Fullerene Simulations Introduction"
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949:
888:
886:
836:
834:
832:
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796:
794:
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183:Table 1: Techniques and Ion Sources
925:"Applications of Ion Beam Analysis"
121:is sensitive to particular isotopes
18:Elastic backscattering spectrometry
811:10.1016/b978-0-08-091689-7.50006-9
451:Low mass resolution with ESA, QMA
162:was published in NIMB 267(12–13).
153:International Atomic Energy Agency
91:http://www-nds.iaea.org/sigmacalc/
25:
1603:"Nuclear Instruments and Methods"
583:Poor Resolution, high efficiency
139:) can even be distinguished from
580:High Resolution, Low efficiency
431:Electrostatic/magnetic analyser
970:10.1016/j.forsciint.2013.05.006
578:External with window, cryostat
112:Particle-induced X-ray emission
48:Secondary ion mass spectroscopy
1489:11858/00-001M-0000-0027-0732-B
1444:11858/00-001M-0000-0027-0B1E-C
1295:11858/00-001M-0000-0027-0B1E-C
1246:11858/00-001M-0000-0027-0732-B
958:Forensic Science International
615:Broad resolution by unfolding
1:
1171:""Total IBA" – Where are we?"
634:Biomedical elemental analysis
511:Small and simple arrangement
426:Vacuum, movable advantageous
428:Energy measurement requires
661:Lithium battery development
1677:
1639:Software for PIXE analysis
1480:10.1016/j.nimb.2007.05.018
1435:10.1016/j.nimb.2005.10.024
1400:10.1016/j.nimb.2007.04.025
1360:10.1016/j.nimb.2007.11.075
1286:10.1016/j.nimb.2005.10.024
1237:10.1016/j.nimb.2007.05.018
1198:10.1016/j.nimb.2011.09.020
1507:10.1007/978-3-030-62308-1
1103:10.1016/j.tsf.2019.137416
643:Cultural heritage studies
610:External, low efficiency
509:Vacuum, movable geometry
356:
339:
323:
309:
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203:
119:Nuclear reaction analysis
60:Rutherford backscattering
1010:10.3390/batteries7020041
383:RF with charge exchange
105:Elastic recoil detection
1211:Barradas, N.P. (2007).
691:Software and simulation
449:Vacuum, fixed geometry
1497:Möller, Sören (2020),
1147:10.1021/acsaem.2c00704
1134:ACS Appl. Energy Mater
1055:: CS1 maint: others (
684:
347:(off-axis extraction)
87:Schrödinger's equation
681:
34:involving the use of
32:analytical techniques
1260:Rauhala, E. (2006).
1472:2007NIMPB.262..281B
1427:2006NIMPB.244..436R
1392:2007NIMPB.261..475H
1352:2008NIMPB.266.1880S
1278:2006NIMPB.244..436R
1229:2007NIMPB.262..281B
1190:2012NIMPB.271..107J
1126:"Synthesis of BaZrS
1095:2019TSF...686m7416M
903:2013AIPC.1530...11D
859:2013Ana...138.7070J
397:
184:
81:approximation of a
868:10.1039/c3an01406a
685:
469:Spectrophotometer
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182:
160:Debrecen (Hungary)
96:2013-07-28 at the
1661:Materials science
1516:978-3-030-62307-4
1034:978-1-60511-217-6
911:10.1063/1.4812900
652:Forensic analysis
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258:CaeDsium sputter
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28:Ion beam analysis
16:(Redirected from
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1386:(1–2): 475–476.
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964:(1–3): 219–228.
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85:. In this case
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443:Secondary Ions
420:Scattered Ions
373:Sputter-source
357:RBS, PIXE, NRA
324:RBS, PIXE, NRA
300:Ga, In, Au, Bi
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98:Wayback Machine
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579:
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510:
487:
453:
450:
446:Channeltron
430:
427:
423:Channeltron
389:H, He, N, O
346:
335:H, He, N, O
321:H, He, N, O
307:High Energy
227:H, He, N, O
213:H, He, N, O
169:
157:
149:
141:dislocations
83:point charge
79:Rutherford's
70:
66:
27:
26:
1621:DataFurnace
1615:MultiSIMNRA
1346:(8): 1880.
1184:: 107–118.
569:Gamma-rays
277:Most Solid
263:Most Solid
204:Low Energy
190:Ion Source
125:Channelling
1370:References
1324:2016-04-29
1272:(2): 436.
1223:(2): 281.
1086:1812.10340
1079:: 137416.
939:2016-04-29
495:< 1mPa
475:< 1mPa
458:< 1mPa
199:Technique
196:Ion Beams
1525:229610872
1156:248359886
1111:119415711
1051:cite book
1043:672203193
1003:(2): 41.
997:Batteries
782:Barradas
745:Footnotes
603:Li glass
595:Neutrons
406:Detector
234:Colutron
39:ion beams
1655:Category
978:23890641
877:24102065
786:. (2007)
773:. (2006)
769:Rauhala
760:. (2007)
572:Ge (Li)
486:Si (Li)
403:Product
362:Penning
271:Freeman
245:Penning
193:Current
166:Overview
129:crystals
94:Archived
1468:Bibcode
1423:Bibcode
1388:Bibcode
1348:Bibcode
1274:Bibcode
1225:Bibcode
1186:Bibcode
1091:Bibcode
899:Bibcode
855:Bibcode
847:Analyst
756:Huddle
736:Class-E
727:Class-D
718:Class-C
709:Class-B
700:Class-A
483:X-Rays
435:10 nPa
412:Vacuum
386:100 mA
351:100 mA
133:lattice
1609:SIMNRA
1523:
1513:
1154:
1109:
1041:
1031:
976:
875:
817:
566:PIGME
519:RBS-C
332:10 mA
274:10 mA
224:10 mA
110:PIXE:
65:EBS:
46:, and
1633:GUPIX
1521:S2CID
1174:(PDF)
1152:S2CID
1107:S2CID
1081:arXiv
784:et al
771:et al
758:et al
683:event
554:Ions
538:Ions
522:Ions
503:Ions
480:PIXE
463:SIPS
440:SIMS
417:LEIS
378:Most
368:H, H
365:2 mA
354:H, O
318:1 mA
295:LMIS
266:SIMS
248:5 mA
216:LEIS
210:1 mA
117:NRA:
103:ERD:
58:RBS:
1597:2015
1593:2013
1589:2010
1585:2007
1578:2016
1574:2013
1570:2010
1566:2007
1559:2017
1555:2015
1551:2013
1547:2011
1543:2009
1539:2007
1511:ISBN
1057:link
1039:OCLC
1029:ISBN
974:PMID
873:PMID
815:ISBN
592:NRA
574:NaI
551:NRA
535:ERA
500:RBS
1627:NDF
1587:,
1503:doi
1484:hdl
1476:doi
1464:262
1439:hdl
1431:doi
1419:244
1396:doi
1384:261
1356:doi
1344:266
1290:hdl
1282:doi
1270:244
1241:hdl
1233:doi
1221:262
1194:doi
1182:271
1142:doi
1099:doi
1077:686
1005:doi
966:doi
962:231
907:doi
863:doi
851:138
807:doi
488:IG
71:EBS
52:LHC
44:FIB
36:MeV
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