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technique, where an image recorded using electrons at the energy of the maximum of the absorption peak caused by a particular inner shell ionisation is divided by an image recorded just before the ionisation energy. It is often necessary to cross-correlate the images to compensate for relative drift
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Adjusting the slit to only allow electrons which have lost a specific amount of energy can be used to obtain elementally sensitive images. As the ionisation signal is often significantly smaller than the background signal, it is normally necessary to obtain more than one image at varying energies to
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Improved elemental maps can be obtained by taking a series of images, allowing quantitative analysis and improved accuracy of mapping where more than one element is involved. By taking a series of images, it is also possible to extract the EELS profile from particular features.
97:, in which only electrons of particular kinetic energies are used to form the image or diffraction pattern. The technique can be used to aid chemical analysis of the sample in conjunction with complementary techniques such as electron crystallography.
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The energy slit can be adjusted so as to only allow electrons which have not lost energy to pass through to form the image. This prevents inelastic scattering from contributing to the image, and hence produces an enhanced contrast image.
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If a very thin sample is illuminated with a beam of high-energy electrons, then a majority of the electrons will pass unhindered through the sample but some will interact with the sample, being scattered elastically or inelastically
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If the electron beam emerging from the sample is passed through a magnetic prism, then the flight path of the electrons will vary depending on their energy. This technique is used to form spectra in
125:(EELS), but it is also possible to place an adjustable slit to allow only electrons with a certain range of energies through, and reform an image using these electrons on a detector.
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118:). Inelastic scattering results in both a loss of energy and a change in momentum, which in the case of inner shell ionisation is characteristic of the element in the sample.
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Transmission
Electron Energy Loss Spectrometry in Materials Science and the EELS ATLAS
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Imaging of nanometer-sized precipitates in solids by electron spectroscopic imaging
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Transmission
Electron Microscopy: A Textbook for Materials Science
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remove the background effect. The simplest method is known as the
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Ultramicroscopy, Volume 59, Issues 1-4, July 1995, Pages 15-31.
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A Database of EELS fine structure fingerprints at
Cornell
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43:but its sources remain unclear because it lacks
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370:Detectors for transmission electron microscopy
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74:Learn how and when to remove this message
210:F. Hofer, P. Warbichler and W. Grogger,
177:. Kluwer Academic / Plenum Publishers.
138:of the sample between the two images.
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169:Williams D.B., Carter C.B (1996).
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303:Timeline of microscope technology
123:electron energy loss spectroscopy
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152:Transmission electron microscopy
95:transmission electron microscopy
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662:Precession electron diffraction
934:Electron microscopy techniques
228:EFTEM imaging modes Carl Zeiss
192:Channing. C. Ahn, ed. (2004).
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647:Immune electron microscopy
565:Annular dark-field imaging
380:Everhart–Thornley detector
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801:Hitachi High-Technologies
93:) is a technique used in
826:Thermo Fisher Scientific
652:Geometric phase analysis
540:Aberration-Corrected TEM
29:This article includes a
575:Charge contrast imaging
385:Field electron emission
58:more precise citations.
765:Thomas Eugene Everhart
116:inner shell ionisation
770:Vernon Ellis Cosslett
590:Dark-field microscopy
775:Vladimir K. Zworykin
425:Correlative light EM
334:Electron diffraction
740:Manfred von Ardenne
725:Gerasimos Danilatos
632:Electron tomography
627:Electron holography
570:Cathodoluminescence
349:Secondary electrons
339:Electron scattering
283:Electron microscopy
269:Electron microscopy
862:Digital Micrograph
468:Environmental SEM
390:Field emission gun
354:X-ray fluorescence
31:list of references
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852:EM Data Bank
816:Nion Company
710:Dennis Gabor
700:Albert Crewe
517:
478:Confocal SEM
375:Electron gun
324:Auger effect
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110:scattering,
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50:Please help
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796:FEI Company
730:Harald Rose
720:Ernst Ruska
409:Microscopes
317:with matter
315:interaction
56:introducing
939:Microscopy
928:Categories
877:Multislice
693:Developers
553:Techniques
298:Microscope
293:Micrograph
158:References
135:jump ratio
745:Max Knoll
400:Stigmator
101:Principle
64:July 2024
900:Category
847:CrysTBox
835:Software
506:Cryo-TEM
313:Electron
146:See also
912:Commons
560:4D STEM
533:4D STEM
511:Cryo-ET
483:SEM-XRF
473:CryoSEM
430:Cryo-EM
288:History
112:plasmon
52:improve
857:EMsoft
842:CASINO
821:TESCAN
686:Others
585:cryoEM
276:Basics
200:
181:
108:phonon
811:Leica
657:PINEM
523:HRTEM
518:EFTEM
91:EFTEM
37:, or
872:IUCr
806:JEOL
677:WBDF
672:WDXS
622:EBIC
617:EELS
612:ECCI
600:EBSD
580:CBED
528:STEM
198:ISBN
179:ISBN
642:FEM
637:FIB
605:TKD
595:EDS
498:TEM
460:SEM
435:EMP
930::
417:EM
214:,
41:,
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