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23:), originally called Variable Coherence Microscopy before decoherence effects in the sample rendered that naming moot, is a technique in
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that probes nanometer-scale or "medium-range" order in disordered materials. The first studies were performed on
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81:"Absence of an abrupt phase change from polycrystalline to amorphous in silicon with deposition temperature"
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P. M. Voyles; J. E. Gerbi; M. M. J. Treacy; J. M. Gibson & J. R. Abelson (2001).
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Si (Treacy and Gibson 1997) and later on hydrogenated amorphous silicon.
50:"Diminished medium-range order observed in annealed amorphous germanium"
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172:Timeline of microscope technology
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531:Precession electron diffraction
17:Fluctuation electron microscopy
863:Electron microscopy techniques
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97:10.1103/PhysRevLett.86.5514
66:10.1103/PhysRevLett.78.1074
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516:Immune electron microscopy
434:Annular dark-field imaging
249:Everhart–Thornley detector
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670:Hitachi High-Technologies
810:condensed matter physics
695:Thermo Fisher Scientific
521:Geometric phase analysis
409:Aberration-Corrected TEM
444:Charge contrast imaging
254:Field electron emission
85:Physical Review Letters
54:Physical Review Letters
48:Treacy, Gibson (1997).
868:Condensed matter stubs
812:-related article is a
634:Thomas Eugene Everhart
639:Vernon Ellis Cosslett
459:Dark-field microscopy
644:Vladimir K. Zworykin
294:Correlative light EM
203:Electron diffraction
609:Manfred von Ardenne
594:Gerasimos Danilatos
501:Electron tomography
496:Electron holography
439:Cathodoluminescence
218:Secondary electrons
208:Electron scattering
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25:electron microscopy
731:Digital Micrograph
337:Environmental SEM
259:Field emission gun
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721:EM Data Bank
685:Nion Company
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347:Confocal SEM
244:Electron gun
193:Auger effect
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599:Harald Rose
589:Ernst Ruska
278:Microscopes
186:with matter
184:interaction
857:Categories
746:Multislice
562:Developers
422:Techniques
167:Microscope
162:Micrograph
35:References
614:Max Knoll
269:Stigmator
29:amorphous
769:Category
716:CrysTBox
704:Software
375:Cryo-TEM
182:Electron
91:: 5514.
60:: 1074.
781:Commons
429:4D STEM
402:4D STEM
380:Cryo-ET
352:SEM-XRF
342:CryoSEM
299:Cryo-EM
157:History
726:EMsoft
711:CASINO
690:TESCAN
555:Others
454:cryoEM
145:Basics
808:This
680:Leica
526:PINEM
392:HRTEM
387:EFTEM
814:stub
741:IUCr
675:JEOL
546:WBDF
541:WDXS
491:EBIC
486:EELS
481:ECCI
469:EBSD
449:CBED
397:STEM
511:FEM
506:FIB
474:TKD
464:EDS
367:TEM
329:SEM
304:EMP
93:doi
62:doi
21:FEM
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