Knowledge (XXG)

Scherzer's theorem

Source 📝

98:"Chromatic and spherical aberration are unavoidable errors of the space charge-free electron lens. In principle, distortion (strain and twist) and (all types of) coma can be eliminated. Due to the inevitability of spherical aberration, there is a practical, but not a fundamental, limit to the resolving power of the electron microscope." 102:
The resolution limit provided by Scherzer's theorem can be overcome by breaking one of the above mentioned three conditions. Giving up rotational symmetry in electronic lenses helps in correcting spherical aberrations. A correction of the chromatic aberration can be achieved with time-dependent, ie
92:
He showed that under these conditions the aberrations that emerge degrade the resolution of an electron microscope up to one hundred times the wavelength of the electron. He concluded that the aberrations cannot be fixed with a combination of rotationally symmetrical lenses.
110:
Scherzer himself experimented with space charges (eg with charged foils), dynamic lenses, and combinations of lenses and mirrors to minimize aberrations in electron microscopes.
236: 196: 376: 49:, entail unavoidable imaging errors. These aberrations are of spherical and chromatic nature, that is, the 104: 75: 141: 61: 50: 42: 23: 242: 213: 157: 27: 327:"Correction of Chromatic Aberration in Charged Particle Accelerators with Time-varying Fields" 232: 192: 26:. It states that there is a limit of resolution for electronic lenses because of unavoidable 224: 184: 149: 267: 145: 188: 370: 351:
Scherzer, Otto (1947). "Sphärische und chromatische Korrektur von Elektronenlinsen".
246: 161: 46: 38: 34: 326: 228: 132:
Scherzer, Otto (September 1936). "Über einige Fehler von Elektronenlinsen".
175:
Schönhense, G. (2006). "Time-Resolved Photoemission Electron Microscopy".
153: 78:
for electromagnetic potentials assuming the following conditions:
221:
Proceedings of the 2005 Particle Accelerator Conference
314:. Springer Science & Business Media. p. 237. 312:
High-Resolution Imaging and Spectrometry of Materials
268:"Otto Scherzer. The father of aberration correction" 103:non-static, electromagnetic fields (for example in 82:electromagnetic fields are rotationally symmetric, 214:"Aberration Correction in Electron Microscopy" 8: 96:In his original paper, Scherzer summarized: 16:Theory of aberrations for electronic lenses 331:Practical Electron Microscopy and Database 177:Advances in Imaging and Electron Physics 119: 7: 127: 125: 123: 297:Handbook of Charged Particle Optics 85:electromagnetic fields are static, 14: 74:Scherzer solved the system of 1: 310:Ernst, Frank (January 2003). 275:Microscopy Society of America 189:10.1016/S1076-5670(05)42003-0 22:is a theorem in the field of 88:there are no space charges. 393: 299:. CRC Press. p. 234. 295:Orloff, Jon (June 1997). 229:10.1109/PAC.2005.1590354 37:found in 1936 that the 134:Zeitschrift für Physik 39:electromagnetic lenses 105:particle accelerators 71:are always positive. 62:chromatic aberration 51:spherical aberration 43:electron microscopes 41:, which are used in 377:Electron microscopy 146:1936ZPhy..101..593S 24:electron microscopy 223:. pp. 44–48. 154:10.1007/BF01349606 20:Scherzer's theorem 212:Rose, H. (2005). 140:(9–10): 593–603. 76:Laplace equations 33:German physicist 384: 361: 360: 348: 342: 341: 339: 337: 322: 316: 315: 307: 301: 300: 292: 286: 285: 283: 281: 272: 264: 258: 257: 255: 253: 218: 209: 203: 202: 172: 166: 165: 129: 392: 391: 387: 386: 385: 383: 382: 381: 367: 366: 365: 364: 350: 349: 345: 335: 333: 324: 323: 319: 309: 308: 304: 294: 293: 289: 279: 277: 270: 266: 265: 261: 251: 249: 239: 216: 211: 210: 206: 199: 174: 173: 169: 131: 130: 121: 116: 69: 58: 17: 12: 11: 5: 390: 388: 380: 379: 369: 368: 363: 362: 343: 325:Liao, Yougui. 317: 302: 287: 259: 237: 204: 197: 167: 118: 117: 115: 112: 90: 89: 86: 83: 67: 56: 15: 13: 10: 9: 6: 4: 3: 2: 389: 378: 375: 374: 372: 358: 354: 347: 344: 332: 328: 321: 318: 313: 306: 303: 298: 291: 288: 276: 269: 263: 260: 248: 244: 240: 238:0-7803-8859-3 234: 230: 226: 222: 215: 208: 205: 200: 198:9780120147847 194: 190: 186: 182: 178: 171: 168: 163: 159: 155: 151: 147: 143: 139: 135: 128: 126: 124: 120: 113: 111: 108: 106: 100: 99: 94: 87: 84: 81: 80: 79: 77: 72: 70: 63: 59: 52: 48: 47:electron beam 45:to focus the 44: 40: 36: 35:Otto Scherzer 31: 29: 25: 21: 356: 352: 346: 334:. Retrieved 330: 320: 311: 305: 296: 290: 278:. Retrieved 274: 262: 250:. Retrieved 220: 207: 180: 176: 170: 137: 133: 109: 101: 97: 95: 91: 73: 65: 64:coefficient 54: 53:coefficient 32: 19: 18: 183:: 159–323. 28:aberrations 359:: 114–132. 114:References 247:122693745 162:120073021 371:Category 60:and the 336:5 April 280:5 April 252:5 April 142:Bibcode 245:  235:  195:  160:  353:Optik 271:(PDF) 243:S2CID 217:(PDF) 158:S2CID 338:2020 282:2020 254:2020 233:ISBN 193:ISBN 225:doi 185:doi 181:142 150:doi 138:101 107:). 373:: 355:. 329:. 273:. 241:. 231:. 219:. 191:. 179:. 156:. 148:. 136:. 122:^ 30:. 357:2 340:. 284:. 256:. 227:: 201:. 187:: 164:. 152:: 144:: 68:c 66:C 57:s 55:C

Index

electron microscopy
aberrations
Otto Scherzer
electromagnetic lenses
electron microscopes
electron beam
spherical aberration
chromatic aberration
Laplace equations
particle accelerators



Bibcode
1936ZPhy..101..593S
doi
10.1007/BF01349606
S2CID
120073021
doi
10.1016/S1076-5670(05)42003-0
ISBN
9780120147847
"Aberration Correction in Electron Microscopy"
doi
10.1109/PAC.2005.1590354
ISBN
0-7803-8859-3
S2CID
122693745

Text is available under the Creative Commons Attribution-ShareAlike License. Additional terms may apply.