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in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features and the feature neighborhood topographies are measured. This approach allows to
123:, precise probe positioning, automatic surface characterization, automatic surface modification/stimulation, automatic manipulation of nanoobjects, nanotechnological processes of “bottom-up” assembly, coordinated control of analytical and technological probes in multiprobe instruments, control of
106:
FOS is designed for high-precision measurement of surface topography (see Fig.) as well as other surface properties and characteristics. Moreover, in comparison with the conventional scanning, FOS allows obtaining a higher spatial resolution. Thanks to a number of techniques embedded in FOS, the
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scan an intended area of a surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method – object-oriented scanning (OOS).
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Image of carbon film surface obtained by FOS method (AFM, tapping mode). Carbon clusters (hills) and intercluster spaces (pits) are used as surface features.
275:
508:"Availability of feature-oriented scanning probe microscopy for remote-controlled measurements on board a space laboratory or planet exploration rover"
51:
Any topography element that looks like a hill or a pit in wide sense may be taken as a surface feature. Examples of surface features (objects) are:
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218:"Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition"
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S. B. Andersson, D. Y. Abramovitch (2007). "A survey of non-raster scan methods with application to atomic force microscopy".
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561:"Observation of a hexagonal superstructure on pyrolytic graphite by method of feature-oriented scanning tunneling microscopy"
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R. V. Lapshin (2019). "Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode".
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309:(Special issue “50 years of the Institute of Physical Problems”). Russian Federation: Technosphera Publishers: 94–106.
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326:"Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description"
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303:"Feature-oriented scanning probe microscopy: precision measurements, nanometrology, bottom-up nanotechnologies"
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570:(in Russian). Vol. 1. June 2–6, Chernogolovka, Russia: Russian Academy of Sciences. pp. 316–317.
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Proceedings of the 25th
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38:(FOS) is a method of precision measurement of surface topography with a
737:, Research section, Lapshin's Personal Page on SPM & Nanotechnology
285:. Vol. 14. USA: American Scientific Publishers. pp. 105–115.
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D. W. Pohl, R. Möller (1988). ""Tracking" tunneling microscopy".
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Proceedings of the
American Control Conference (ACC '07)
692:. July 9–13, New York, USA: IEEE. pp. 3516–3521.
119:
FOS has the following fields of application: surface
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650:(3). USA: American Physical Society: 459–462.
283:Encyclopedia of Nanoscience and Nanotechnology
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276:"Feature-oriented scanning probe microscopy"
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458:. Netherlands: Elsevier B. V.: 1122–1129.
307:Electronics: Science, Technology, Business
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107:distortions caused by thermal drifts and
402:. Netherlands: Elsevier B. V.: 530–539.
339:. Netherlands: Elsevier B. V.: 629–636.
26:
838:Typical atomic force microscopy set-up
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521:(5). USA: Mary Ann Liebert: 437–442.
7:
79:, nanoislets, pillars, pores, short
608:(6). USA: AIP Publishing: 840–842.
225:Measurement Science and Technology
25:
602:Review of Scientific Instruments
945:Scanning quantum dot microscopy
900:Photothermal microspectroscopy
1:
638:B. S. Swartzentruber (1996).
482:10.1016/j.apsusc.2018.10.149
426:10.1016/j.apsusc.2016.03.201
363:10.1016/j.apsusc.2015.10.108
146:Feature-oriented positioning
111:are practically eliminated.
883:Near-field scanning optical
853:Ballistic electron emission
125:atomic/molecular assemblers
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981:Scanning probe lithography
664:10.1103/PhysRevLett.76.459
245:10.1088/0957-0233/18/3/046
187:10.1088/0957-4484/15/9/006
991:Feature-oriented scanning
955:Scanning SQUID microscopy
950:Scanning SQUID microscope
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772:Scanning probe microscopy
735:Feature-oriented scanning
173:(9). UK: IOP: 1135–1151.
40:scanning probe microscope
36:Feature-oriented scanning
935:Scanning joule expansion
930:Scanning ion-conductance
915:Scanning electrochemical
878:Magnetic resonance force
720:: CS1 maint: location (
698:10.1109/ACC.2007.4282301
590:: CS1 maint: location (
281:. In H. S. Nalwa (ed.).
83:, short nanorods, short
18:Object-oriented scanning
986:Dip-pen nanolithography
644:Physical Review Letters
452:Applied Surface Science
396:Applied Surface Science
333:Applied Surface Science
231:(3). UK: IOP: 907–927.
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559:R. V. Lapshin (2014).
506:R. V. Lapshin (2009).
387:R. V. Lapshin (2016).
324:R. V. Lapshin (2015).
274:R. V. Lapshin (2011).
216:R. V. Lapshin (2007).
158:R. V. Lapshin (2004).
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940:Scanning Kelvin probe
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535:10.1089/ast.2007.0173
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1027:Vibrational analysis
910:Scanning capacitance
925:Scanning Hall probe
905:Piezoresponse force
863:Electrostatic force
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614:1988RScI...59..840P
527:2009AsBio...9..437L
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418:2016ApSS..378..530L
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301:R. Lapshin (2014).
267:Russian translation
237:2007MeScT..18..907L
209:Russian translation
179:2004Nanot..15.1135L
127:, control of probe
868:Kelvin probe force
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813:Scanning tunneling
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622:10.1063/1.1139790
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16:(Redirected from
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801:Non-contact
57:interstices
1042:Categories
1022:Microscopy
1017:Microscope
791:Conductive
465:1501.06679
409:1501.05726
346:1501.05545
152:References
97:organelles
47:Topography
888:Nano-FTIR
672:0031-9007
630:0034-6748
543:1531-1074
498:119275633
490:0169-4332
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379:118434225
371:0169-4332
315:1992-4178
261:121988564
253:0957-0233
203:250913438
195:0957-4484
121:metrology
85:nanotubes
81:nanowires
61:molecules
1005:See also
796:Infrared
680:10061462
551:19566423
135:See also
93:bacteria
652:Bibcode
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404:arXiv
392:(PDF)
375:S2CID
341:arXiv
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101:cells
53:atoms
722:link
702:ISBN
686:12.
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668:ISSN
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598:10.
592:link
572:ISBN
547:PMID
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311:ISSN
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