Knowledge (XXG)

Accelerated life testing

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lower stresses. This issue can be approached by more tests at a greater range of stresses however the cause of failure must remain unchanged. A possible pre-experiment approach to minimize this is to estimate what data you expect from testing, fit a model to the data, and determine if one would be able to make reliable conclusions if everything went as expected.
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stress and how many test subjects have failed so far. Step stress ALT can increment low to high, high to low, or through a mix of levels. A step stress ALT test that is interested in extrapolating a life distribution to constant operating conditions must be able to relate the life distribution observed under changing stresses to one of constant stresses.
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As a simplified example, consider a test object with a life distribution that roughly matches a normal distribution. Tests at various stress levels would yield different values for the mean and standard deviation of the distribution. (its parameters) One would then use a known model or attempt to fit
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When the model is known in advance the test only needs to identify the parameters for the model, however it is necessary to ensure that the model being used has been well verified. Established models must show agreement between extrapolations from accelerated data and observed data across a range of
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A model is an equation that accurately relates a test object's performance to the levels of stress on it. This can be referred to as an acceleration model, with any constants called acceleration factors. The acceleration model is usually related to the types of materials or components tested. A few
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type relationship with respect to time and temperature (for example, creep, stress relaxation, and tensile properties). If one conducts short tests at elevated temperatures, that data can be used to extrapolate the behavior of the polymer at room temperature, avoiding the need to do lengthy, and
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When the appropriate model is not known in advance, or there exist multiple accepted models, the test must estimate what model fits best based on the context of the test and results from testing. Even if two models fit data at high stresses equally well, they may differ by orders of magnitude at
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A step stress ALT is a variant of ALT that tests a component at multiple stress levels, one after the other. Components that survive one test are immediately subjected to the next. These are widely modeled under the assumption that survival life of a product depends only on the current level of
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All factors thought to influence the test object should be involved and tests should be conducted at various levels of each factor. Higher stress levels will speed up the test more however the cause of failure or other response measured must not be changed. For instance, melting components in a
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For instance, a reliability test on circuits that must last years at use conditions (high longevity) would need to yield results in a much shorter time. If the test wanted to estimate how frequently the circuits needed to be replaced, then the category of low failure would also be applicable.
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circuit would alter why the circuit failed. Increasing the number of tests or the number of test objects in each test generally increases how precisely one can infer the test object's behavior at operating conditions.
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How one factors in the effect of time depends largely on what one is measuring. For instance, a test that is measuring lifespan may look only at the mean time to failure of the test objects, or it may try to
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Furthermore, if the circuits wore out from gradual use rather than extreme use (such as a large sudden shock), the wear out category would be involved. If a sudden shock was the primary cause of failure, a
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a model to relate how each stress factor influenced the distributions parameters. This relation would then be used to estimate the life distribution at operating conditions.
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Designing a test involves considering what factors affect the test object, what you already know about the test object's behavior, and what you want to learn from the test.
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Herrmann, W.; Bogdanski, N. (2011-06-01). "Outdoor weathering of PV modules — Effects of various climates and comparison with accelerated laboratory testing".
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Wang, Ronghua; Sha, Naijun; Gu, Beiqing; Xu, Xiaoling (2012-06-01). "Comparison Analysis of Efficiency for Step-Down and Step-Up Stress Accelerated Life Testing".
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https://www.dfrsolutions.com/hubfs/Resources/services/Temperature-and-Humidity-Acceleration-Factors-on-MLV-Lifetime.pdf?t=1514473946162
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distributions. In any case, the parameters would be related to the test subjects and the levels of the stress factors being tested.
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Inference from the results of an accelerated life test requires being able to relate the test object's response (lifespan,
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High longevity - The product must be reliable for a much longer time than can be reasonably tested at normal conditions.
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Low failure - Testing even a very large sample at normal conditions would yield few or no failures in a reasonable time.
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of which represents the proportion of products failing at a given time. Several distributions for this purpose are the
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Nelson, Wayne (1980-06-01). "Accelerated Life Testing - Step-Stress Models and Data Analyses".
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ALT is primarily used to speed up tests. This is particularly useful in several cases:
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Nelson, W. (1980). "Accelerated Life Testing - Step-Stress Models and Data Analyses".
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High wear-out - The primary cause of failure occurs over an extended amount of time.
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can make predictions about the service life and maintenance intervals of a product.
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Donahoe, D.; Zhao, K.; Murray, S.; Ray, R. M. (2008). "Accelerated Life Testing".
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Srivastava, P.W.; Shukla, R. (2008-09-01). "A Log-Logistic Step-Stress Model".
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Temperature and Humidity Acceleration Factors on MLV Lifetime, G. Caswell,
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Spencer, F. W. (1991). "Statistical Methods in Accelerated Life Testing".
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https://www.dfrsolutions.com/resources/test-plan-development-how-to-do-it
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to the data. This is usually referred to as a life distribution, the
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is the process of testing a product by subjecting it to conditions (
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Test Plan Development: How To Do It, G. Sharon, November 19, 2015,
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Encyclopedia of Quantitative Risk Analysis and Assessment
347:Elsayed, E. A. (2003). "Accelerated Life Testing". 406:2011 37th IEEE Photovoltaic Specialists Conference 96:equations used for acceleration models are the 8: 238: 104:for temperature and humidity, and the 7: 349:Handbook of Reliability Engineering 14: 475:"8.3.1.4. Accelerated life tests" 167:Step-Stress Accelerated Life Test 610:IEEE Transactions on Reliability 567:IEEE Transactions on Reliability 500:IEEE Transactions on Reliability 248:IEEE Transactions on Reliability 445:Sorensen, Rob (May 28, 2010). 316:10.1002/9780470061596.risk0452 293:10.1080/00401706.1991.10484846 100:for high temperature fatigue, 1: 454:Sandia National Laboratories 202:Highly Accelerated Life Test 142:probability density function 68:Highly Accelerated Life Test 674: 447:"Accelerated Life Testing" 408:. pp. 002305–002311. 414:10.1109/PVSC.2011.6186415 197:Reliability (engineering) 108:for temperature cycling. 70:may be more appropriate. 357:10.1007/1-85233-841-5_22 182:Research and development 138:statistical distribution 17:Accelerated life testing 622:10.1109/TR.1980.5220742 579:10.1109/TR.2012.2182816 256:10.1109/TR.1980.5220742 43:hence expensive tests. 512:10.1109/TR.2008.928182 658:Environmental testing 351:. pp. 415–428. 120:Acceleration Factors 187:Product management 423:978-1-4244-9965-6 366:978-1-85233-453-6 207:Accelerated aging 74:Setting up a test 665: 642: 641: 605: 599: 598: 562: 556: 555: 553: 552: 546:www.itl.nist.gov 538: 532: 531: 495: 489: 488: 486: 485: 479:www.itl.nist.gov 471: 465: 464: 462: 460: 451: 442: 436: 435: 401: 395: 389: 383: 377: 371: 370: 344: 338: 337: 303: 297: 296: 274: 268: 267: 243: 112:stress factors. 673: 672: 668: 667: 666: 664: 663: 662: 648: 647: 646: 645: 607: 606: 602: 564: 563: 559: 550: 548: 540: 539: 535: 497: 496: 492: 483: 481: 473: 472: 468: 458: 456: 449: 444: 443: 439: 424: 403: 402: 398: 390: 386: 378: 374: 367: 346: 345: 341: 326: 305: 304: 300: 276: 275: 271: 245: 244: 240: 235: 227:Fault injection 222:Fatigue testing 178: 169: 122: 93: 91:Picking a Model 84: 82:Test Conditions 76: 49: 12: 11: 5: 671: 669: 661: 660: 650: 649: 644: 643: 616:(2): 103–108. 600: 573:(2): 590–603. 557: 533: 506:(3): 431–434. 490: 466: 437: 422: 396: 384: 372: 365: 339: 324: 298: 287:(3): 360–362. 269: 237: 236: 234: 231: 230: 229: 224: 219: 214: 209: 204: 199: 194: 189: 184: 177: 174: 168: 165: 121: 118: 92: 89: 83: 80: 75: 72: 63: 62: 59: 56: 48: 45: 13: 10: 9: 6: 4: 3: 2: 670: 659: 656: 655: 653: 639: 635: 631: 627: 623: 619: 615: 611: 604: 601: 596: 592: 588: 584: 580: 576: 572: 568: 561: 558: 547: 543: 537: 534: 529: 525: 521: 517: 513: 509: 505: 501: 494: 491: 480: 476: 470: 467: 455: 448: 441: 438: 433: 429: 425: 419: 415: 411: 407: 400: 397: 394: 388: 385: 382: 376: 373: 368: 362: 358: 354: 350: 343: 340: 335: 331: 327: 325:9780470035498 321: 317: 313: 309: 302: 299: 294: 290: 286: 282: 281: 280:Technometrics 273: 270: 265: 261: 257: 253: 249: 242: 239: 232: 228: 225: 223: 220: 218: 215: 213: 210: 208: 205: 203: 200: 198: 195: 193: 190: 188: 185: 183: 180: 179: 175: 173: 166: 164: 160: 158: 154: 151: 147: 143: 139: 135: 129: 127: 119: 117: 113: 109: 107: 106:Blattau model 103: 99: 90: 88: 81: 79: 73: 71: 69: 60: 57: 54: 53: 52: 46: 44: 41: 37: 32: 30: 26: 22: 18: 613: 609: 603: 570: 566: 560: 549:. Retrieved 545: 536: 503: 499: 493: 482:. Retrieved 478: 469: 457:. Retrieved 453: 440: 405: 399: 387: 375: 348: 342: 307: 301: 284: 278: 272: 247: 241: 192:Service life 170: 161: 153:, log-normal 130: 123: 114: 110: 94: 85: 77: 64: 50: 33: 16: 15: 459:October 20, 146:exponential 551:2015-10-20 484:2015-10-20 250:(2): 103. 233:References 630:0018-9529 587:0018-9529 520:0018-9529 217:Cox model 212:AFT model 126:corrosion 98:Arrhenius 40:Arrhenius 29:engineers 652:Category 638:35734439 528:20244594 432:20511202 334:86534403 264:35734439 176:See also 36:polymers 595:5903153 150:Weibull 47:Purpose 636:  628:  593:  585:  526:  518:  430:  420:  363:  332:  322:  262:  155:, and 102:Eyring 25:strain 21:stress 634:S2CID 591:S2CID 524:S2CID 450:(PDF) 428:S2CID 330:S2CID 260:S2CID 157:gamma 626:ISSN 614:R-29 583:ISSN 516:ISSN 461:2015 418:ISBN 361:ISBN 320:ISBN 618:doi 575:doi 508:doi 410:doi 353:doi 312:doi 289:doi 252:doi 134:fit 34:In 654:: 632:. 624:. 612:. 589:. 581:. 571:61 569:. 544:. 522:. 514:. 504:57 502:. 477:. 452:. 426:. 416:. 359:. 328:. 318:. 310:. 285:33 283:. 258:. 148:, 136:a 23:, 640:. 620:: 597:. 577:: 554:. 530:. 510:: 487:. 463:. 434:. 412:: 369:. 355:: 336:. 314:: 295:. 291:: 266:. 254::

Index

stress
strain
engineers
polymers
Arrhenius
Highly Accelerated Life Test
Arrhenius
Eyring
Blattau model
corrosion
fit
statistical distribution
probability density function
exponential
Weibull
, log-normal
gamma
Research and development
Product management
Service life
Reliability (engineering)
Highly Accelerated Life Test
Accelerated aging
AFT model
Cox model
Fatigue testing
Fault injection
doi
10.1109/TR.1980.5220742
S2CID

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